NeXus NXDL vocabulary
Anchors for all NeXus fields, groups, attributes, and links
NXDL Vocabulary
This content is also available in these formats: json txt yml
- @auxiliary_signals
- /NXdata@auxiliary_signals-attribute
- @axes
- /NXcxi_ptycho/DATA@axes-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute
- /NXdata/DATA@axes-attribute
- /NXdata@axes-attribute
- /NXdetector/efficiency@axes-attribute
- /NXellipsometry/ENTRY/plot@axes-attribute
- /NXguide/reflectivity@axes-attribute
- /NXtransmission/ENTRY/data@axes-attribute
- @axis
- /NXdata/VARIABLE@axis-attribute
- /NXdetector/time_of_flight@axis-attribute
- /NXdetector/x_pixel_offset@axis-attribute
- /NXdetector/y_pixel_offset@axis-attribute
- /NXdetector/z_pixel_offset@axis-attribute
- @axisname_indices
- /NXdata@AXISNAME_indices-attribute
- @baseline_reference
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute
- /NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
- @cansas_class
- /NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute
- /NXcanSAS/ENTRY/DATA@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute
- /NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute
- /NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute
- /NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute
- /NXcanSAS/ENTRY@canSAS_class-attribute
- @check_sum
- /NXdetector/data@check_sum-attribute
- @comment
- /NXentry/revision@comment-attribute
- /NXsubentry/revision@comment-attribute
- @configuration
- /NXentry/program_name@configuration-attribute
- /NXsubentry/program_name@configuration-attribute
- @creator
- /NXroot@creator-attribute
- @creator_version
- /NXroot@creator_version-attribute
- @default
- /NXaperture@default-attribute
- /NXattenuator@default-attribute
- /NXbeam@default-attribute
- /NXbeam_stop@default-attribute
- /NXbending_magnet@default-attribute
- /NXcanSAS/ENTRY@default-attribute
- /NXcapillary@default-attribute
- /NXcite@default-attribute
- /NXcollimator@default-attribute
- /NXcrystal@default-attribute
- /NXcylindrical_geometry@default-attribute
- /NXdetector@default-attribute
- /NXdetector_group@default-attribute
- /NXdetector_module@default-attribute
- /NXdisk_chopper@default-attribute
- /NXentry@default-attribute
- /NXevent_data@default-attribute
- /NXfermi_chopper@default-attribute
- /NXfilter@default-attribute
- /NXflipper@default-attribute
- /NXfresnel_zone_plate@default-attribute
- /NXgeometry@default-attribute
- /NXgrating@default-attribute
- /NXguide@default-attribute
- /NXinsertion_device@default-attribute
- /NXinstrument@default-attribute
- /NXlog@default-attribute
- /NXmirror@default-attribute
- /NXmoderator@default-attribute
- /NXmonitor@default-attribute
- /NXmonochromator@default-attribute
- /NXnote@default-attribute
- /NXoff_geometry@default-attribute
- /NXorientation@default-attribute
- /NXparameters@default-attribute
- /NXpinhole@default-attribute
- /NXpolarizer@default-attribute
- /NXpositioner@default-attribute
- /NXprocess@default-attribute
- /NXreflections@default-attribute
- /NXroot@default-attribute
- /NXsample@default-attribute
- /NXsample_component@default-attribute
- /NXsensor@default-attribute
- /NXshape@default-attribute
- /NXslit@default-attribute
- /NXsource@default-attribute
- /NXsubentry@default-attribute
- /NXtransformations@default-attribute
- /NXtranslation@default-attribute
- /NXuser@default-attribute
- /NXvelocity_selector@default-attribute
- /NXxraylens@default-attribute
- @depends_on
- /NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute
- /NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute
- /NXdetector_module/fast_pixel_direction@depends_on-attribute
- /NXdetector_module/module_offset@depends_on-attribute
- /NXdetector_module/slow_pixel_direction@depends_on-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute
- /NXtransformations/AXISNAME@depends_on-attribute
- @description
- /NXelectrostatic_kicker/timing@description-attribute
- /NXmagnetic_kicker/timing@description-attribute
- /NXreflections/background_mean@description-attribute
- /NXreflections/bounding_box@description-attribute
- /NXreflections/d@description-attribute
- /NXreflections/det_module@description-attribute
- /NXreflections/entering@description-attribute
- /NXreflections/flags@description-attribute
- /NXreflections/h@description-attribute
- /NXreflections/id@description-attribute
- /NXreflections/int_prf@description-attribute
- /NXreflections/int_prf_errors@description-attribute
- /NXreflections/int_prf_var@description-attribute
- /NXreflections/int_sum@description-attribute
- /NXreflections/int_sum_errors@description-attribute
- /NXreflections/int_sum_var@description-attribute
- /NXreflections/k@description-attribute
- /NXreflections/l@description-attribute
- /NXreflections/lp@description-attribute
- /NXreflections/observed_frame@description-attribute
- /NXreflections/observed_frame_errors@description-attribute
- /NXreflections/observed_frame_var@description-attribute
- /NXreflections/observed_phi@description-attribute
- /NXreflections/observed_phi_errors@description-attribute
- /NXreflections/observed_phi_var@description-attribute
- /NXreflections/observed_px_x@description-attribute
- /NXreflections/observed_px_x_errors@description-attribute
- /NXreflections/observed_px_x_var@description-attribute
- /NXreflections/observed_px_y@description-attribute
- /NXreflections/observed_px_y_errors@description-attribute
- /NXreflections/observed_px_y_var@description-attribute
- /NXreflections/observed_x@description-attribute
- /NXreflections/observed_x_errors@description-attribute
- /NXreflections/observed_x_var@description-attribute
- /NXreflections/observed_y@description-attribute
- /NXreflections/observed_y_errors@description-attribute
- /NXreflections/observed_y_var@description-attribute
- /NXreflections/overlaps@description-attribute
- /NXreflections/partiality@description-attribute
- /NXreflections/polar_angle@description-attribute
- /NXreflections/predicted_frame@description-attribute
- /NXreflections/predicted_phi@description-attribute
- /NXreflections/predicted_px_x@description-attribute
- /NXreflections/predicted_px_y@description-attribute
- /NXreflections/predicted_x@description-attribute
- /NXreflections/predicted_y@description-attribute
- /NXreflections/prf_cc@description-attribute
- /NXreflections/reflection_id@description-attribute
- /NXreflections@description-attribute
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control@description-attribute
- @direction
- /NXsample/electric_field@direction-attribute
- /NXsample/magnetic_field@direction-attribute
- /NXsample/stress_field@direction-attribute
- @distribution
- /NXdata/VARIABLE@distribution-attribute
- @entry
- /NXarpes/ENTRY@entry-attribute
- /NXiqproc/ENTRY@entry-attribute
- /NXsas/ENTRY@entry-attribute
- /NXsastof/ENTRY@entry-attribute
- /NXsqom/ENTRY@entry-attribute
- /NXxas/ENTRY@entry-attribute
- /NXxasproc/ENTRY@entry-attribute
- @file_name
- /NXroot@file_name-attribute
- @file_time
- /NXroot@file_time-attribute
- @file_update_time
- /NXroot@file_update_time-attribute
- @first_good
- /NXdata/VARIABLE@first_good-attribute
- @first_point_for_fit
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
- @frequency
- /NXdetector/raw_time_of_flight@frequency-attribute
- @h5py_version
- /NXroot@h5py_version-attribute
- @hdf5_version
- /NXroot@HDF5_Version-attribute
- @hdf_version
- /NXroot@HDF_version-attribute
- @i_axes
- /NXcanSAS/ENTRY/DATA@I_axes-attribute
- @idf_version
- /NXentry@IDF_Version-attribute
- /NXsubentry@IDF_Version-attribute
- @index
- /NXarchive/entry@index-attribute
- @interpretation
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
- @last_good
- /NXdata/VARIABLE@last_good-attribute
- @local_name
- /NXdetector/crate@local_name-attribute
- /NXdetector/input@local_name-attribute
- /NXdetector/slot@local_name-attribute
- @long_name
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@long_name-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA@long_name-attribute
- /NXdata/DATA@long_name-attribute
- /NXdata/VARIABLE@long_name-attribute
- /NXdetector/data@long_name-attribute
- /NXdetector/time_of_flight@long_name-attribute
- /NXdetector/x_pixel_offset@long_name-attribute
- /NXdetector/y_pixel_offset@long_name-attribute
- /NXdetector/z_pixel_offset@long_name-attribute
- /NXimage_set_em_adf/stack/image_id@long_name-attribute
- /NXimage_set_em_adf/stack/xpos@long_name-attribute
- /NXimage_set_em_adf/stack/ypos@long_name-attribute
- /NXimage_set_em_adf/stack@long_name-attribute
- /NXimage_set_em_kikuchi/DATA/image_id@long_name-attribute
- /NXimage_set_em_kikuchi/DATA/intensity@long_name-attribute
- /NXimage_set_em_kikuchi/DATA/xpos@long_name-attribute
- /NXimage_set_em_kikuchi/DATA/ypos@long_name-attribute
- /NXimage_set_em_se/DATA/image_id@long_name-attribute
- /NXimage_set_em_se/DATA/intensity@long_name-attribute
- /NXimage_set_em_se/DATA/xpos@long_name-attribute
- /NXimage_set_em_se/DATA/ypos@long_name-attribute
- /NXspectrum_set_em_eels/stack/energy_loss@long_name-attribute
- /NXspectrum_set_em_eels/stack/xpos@long_name-attribute
- /NXspectrum_set_em_eels/stack/ypos@long_name-attribute
- /NXspectrum_set_em_eels/stack@long_name-attribute
- /NXspectrum_set_em_eels/summary/energy_loss@long_name-attribute
- /NXspectrum_set_em_eels/summary@long_name-attribute
- /NXspectrum_set_em_xray/indexing/composition_map/DATA/xpos@long_name-attribute
- /NXspectrum_set_em_xray/indexing/composition_map/DATA/ypos@long_name-attribute
- /NXspectrum_set_em_xray/indexing/composition_map/DATA@long_name-attribute
- /NXspectrum_set_em_xray/stack/photon_energy@long_name-attribute
- /NXspectrum_set_em_xray/stack/xpos@long_name-attribute
- /NXspectrum_set_em_xray/stack/ypos@long_name-attribute
- /NXspectrum_set_em_xray/stack@long_name-attribute
- /NXspectrum_set_em_xray/summary/photon_energy@long_name-attribute
- /NXspectrum_set_em_xray/summary@long_name-attribute
- @mask
- /NXcanSAS/ENTRY/DATA@mask-attribute
- @mask_indices
- /NXcanSAS/ENTRY/DATA@Mask_indices-attribute
- @mime_type
- /NXsubentry/thumbnail@mime_type-attribute
- @name
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@name-attribute
- /NXcanSAS/ENTRY/run@name-attribute
- @nexus_version
- /NXroot@NeXus_version-attribute
- @nx_class
- /NXroot@NX_class-attribute
- @offset
- /NXbeam/TRANSFORMATIONS/DIRECTION@offset-attribute
- /NXbeam/TRANSFORMATIONS/reference_plane@offset-attribute
- /NXdetector_module/fast_pixel_direction@offset-attribute
- /NXdetector_module/module_offset@offset-attribute
- /NXdetector_module/slow_pixel_direction@offset-attribute
- /NXevent_data/event_time_zero@offset-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@offset-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@offset-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@offset-attribute
- /NXtomoproc/entry/data/data@offset-attribute
- /NXtransformations/AXISNAME@offset-attribute
- @offset_units
- /NXdetector_module/fast_pixel_direction@offset_units-attribute
- /NXdetector_module/module_offset@offset_units-attribute
- /NXdetector_module/slow_pixel_direction@offset_units-attribute
- /NXtransformations/AXISNAME@offset_units-attribute
- @populated_elements
- /NXxpcs/entry/twotime/two_time_corr_func@populated_elements-attribute
- @primary
- /NXdetector/time_of_flight@primary-attribute
- /NXdetector/x_pixel_offset@primary-attribute
- /NXdetector/y_pixel_offset@primary-attribute
- /NXdetector/z_pixel_offset@primary-attribute
- @program_url
- /NXsensor_scan/ENTRY/PROCESS/program@program_url-attribute
- @q_indices
- /NXcanSAS/ENTRY/DATA@Q_indices-attribute
- @region_type
- /NXregion@region_type-attribute
- @resolutions
- /NXcanSAS/ENTRY/DATA/Q@resolutions-attribute
- @resolutions_description
- /NXcanSAS/ENTRY/DATA/Q@resolutions_description-attribute
- @scaling
- /NXtomoproc/entry/data/data@scaling-attribute
- @scaling_factor
- /NXcanSAS/ENTRY/DATA/I@scaling_factor-attribute
- /NXlog/cue_timestamp_zero@scaling_factor-attribute
- /NXlog/time@scaling_factor-attribute
- @short_name
- /NXelectronanalyser/name@short_name-attribute
- /NXinstrument/name@short_name-attribute
- /NXmx/ENTRY/INSTRUMENT/name@short_name-attribute
- /NXmx/ENTRY/SOURCE/name@short_name-attribute
- /NXsource/name@short_name-attribute
- @signal
- /NXcanSAS/ENTRY/DATA@signal-attribute
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@signal-attribute
- /NXcxi_ptycho/DATA@signal-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1@signal-attribute
- /NXdata/DATA@signal-attribute
- /NXdata@signal-attribute
- /NXdetector/efficiency@signal-attribute
- /NXguide/reflectivity@signal-attribute
- /NXlauetof/entry/instrument/detector/data@signal-attribute
- /NXmpes/ENTRY/DATA@signal-attribute
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA@signal-attribute
- /NXxbase/entry/instrument/detector/data@signal-attribute
- @start
- /NXdetector/start_time@start-attribute
- /NXdetector/stop_time@start-attribute
- /NXdisk_chopper/top_dead_center@start-attribute
- /NXevent_data/cue_timestamp_zero@start-attribute
- /NXlog/cue_timestamp_zero@start-attribute
- /NXlog/time@start-attribute
- @storage_mode
- /NXxpcs/entry/data/G2_unnormalized@storage_mode-attribute
- /NXxpcs/entry/data/delay_difference@storage_mode-attribute
- /NXxpcs/entry/data/g2@storage_mode-attribute
- /NXxpcs/entry/data/g2_derr@storage_mode-attribute
- /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func@storage_mode-attribute
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func@storage_mode-attribute
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@storage_mode-attribute
- /NXxpcs/entry/twotime/two_time_corr_func@storage_mode-attribute
- @surface_indices
- /NXguide/reflectivity@surface_indices-attribute
- @t_axes
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@T_axes-attribute
- @time
- /NXattenuator/status@time-attribute
- /NXsource/last_fill@time-attribute
- @time_origin_location
- /NXxpcs/entry/twotime/two_time_corr_func@time_origin_location-attribute
- @timestamp
- /NXcanSAS/ENTRY/DATA@timestamp-attribute
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@timestamp-attribute
- @transform
- /NXtomoproc/entry/data/data@transform-attribute
- @transformation_type
- /NXbeam/TRANSFORMATIONS/DIRECTION@transformation_type-attribute
- /NXbeam/TRANSFORMATIONS/reference_plane@transformation_type-attribute
- /NXdetector_module/fast_pixel_direction@transformation_type-attribute
- /NXdetector_module/module_offset@transformation_type-attribute
- /NXdetector_module/slow_pixel_direction@transformation_type-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@transformation_type-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@transformation_type-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@transformation_type-attribute
- /NXtransformations/AXISNAME@transformation_type-attribute
- @type
- /NXapm/ENTRY/thumbnail@type-attribute
- /NXem/ENTRY/thumbnail@type-attribute
- /NXentry/thumbnail@type-attribute
- @uncertainties
- /NXcanSAS/ENTRY/DATA/I@uncertainties-attribute
- /NXcanSAS/ENTRY/DATA/Q@uncertainties-attribute
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T@uncertainties-attribute
- @units
- /NXbeam/final_polarization@units-attribute
- /NXbeam/fluence@units-attribute
- /NXbeam/incident_polarization@units-attribute
- /NXcanSAS/ENTRY/DATA/I@units-attribute
- /NXcanSAS/ENTRY/DATA/Idev@units-attribute
- /NXcanSAS/ENTRY/DATA/Q@units-attribute
- /NXcanSAS/ENTRY/DATA/Qdev@units-attribute
- /NXcanSAS/ENTRY/DATA/Qmean@units-attribute
- /NXcanSAS/ENTRY/DATA/dQl@units-attribute
- /NXcanSAS/ENTRY/DATA/dQw@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size@units-attribute
- /NXparameters/term@units-attribute
- @url
- /NXellipsometry/ENTRY/INSTRUMENT/firmware@url-attribute
- /NXellipsometry/ENTRY/acquisition_program@url-attribute
- /NXellipsometry/ENTRY/definition@url-attribute
- /NXentry/definition@URL-attribute
- /NXentry/definition_local@URL-attribute
- /NXsubentry/definition@URL-attribute
- /NXsubentry/definition_local@URL-attribute
- /NXtransmission/ENTRY/acquisition_program@url-attribute
- /NXtransmission/ENTRY/definition@url-attribute
- @varied_variable
- /NXiqproc/ENTRY/DATA/variable@varied_variable-attribute
- @vector
- /NXbeam/TRANSFORMATIONS/DIRECTION@vector-attribute
- /NXbeam/TRANSFORMATIONS/reference_plane@vector-attribute
- /NXcxi_ptycho/sample_1/transformations@vector-attribute
- /NXdetector_module/fast_pixel_direction@vector-attribute
- /NXdetector_module/module_offset@vector-attribute
- /NXdetector_module/slow_pixel_direction@vector-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@vector-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@vector-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@vector-attribute
- /NXtransformations/AXISNAME@vector-attribute
- @version
- /NXapm/ENTRY/atom_probe/control_software/program@version-attribute
- /NXapm/ENTRY/atom_probe/hit_multiplicity/program@version-attribute
- /NXapm/ENTRY/atom_probe/ion_filtering/program@version-attribute
- /NXapm/ENTRY/atom_probe/ion_impact_positions/program@version-attribute
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/program@version-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/program@version-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/program@version-attribute
- /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/program@version-attribute
- /NXapm/ENTRY/program@version-attribute
- /NXapm/ENTRY@version-attribute
- /NXapm_input_ranging/filename@version-attribute
- /NXapm_input_reconstruction/filename@version-attribute
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/filename@version-attribute
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/filename@version-attribute
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_clusterer/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_clusterer/ENTRY@version-attribute
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/filename@version-attribute
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/filename@version-attribute
- /NXapm_paraprobe_config_distancer/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_distancer/ENTRY@version-attribute
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/filename@version-attribute
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/filename@version-attribute
- /NXapm_paraprobe_config_intersector/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_intersector/ENTRY@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/filename@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/filename@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/filename@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/file_name@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/filename@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/filename@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/filename@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_nanochem/ENTRY@version-attribute
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/dataset/filename@version-attribute
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_ranger/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_ranger/ENTRY@version-attribute
- /NXapm_paraprobe_config_spatstat/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/dataset/filename@version-attribute
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_spatstat/ENTRY@version-attribute
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/filename@version-attribute
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_surfacer/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_surfacer/ENTRY@version-attribute
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/filename@version-attribute
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances/filename@version-attribute
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_tessellator/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_tessellator/ENTRY@version-attribute
- /NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/dataset/filename@version-attribute
- /NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/iontypes/filename@version-attribute
- /NXapm_paraprobe_config_transcoder/ENTRY/program@version-attribute
- /NXapm_paraprobe_config_transcoder/ENTRY@version-attribute
- /NXapm_paraprobe_results_ranger/ENTRY/config_filename@version-attribute
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/operating_system@version-attribute
- /NXapm_paraprobe_results_ranger/ENTRY/program@version-attribute
- /NXapm_paraprobe_results_ranger/ENTRY@version-attribute
- /NXapm_paraprobe_results_transcoder/ENTRY/config_filename@version-attribute
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/operating_system@version-attribute
- /NXapm_paraprobe_results_transcoder/ENTRY/program@version-attribute
- /NXapm_paraprobe_results_transcoder/ENTRY@version-attribute
- /NXarchive/entry/program@version-attribute
- /NXcanSAS/ENTRY@version-attribute
- /NXcg_marching_cubes/program@version-attribute
- /NXcs_computer/operating_system@version-attribute
- /NXcs_prng/program@version-attribute
- /NXellipsometry/ENTRY/INSTRUMENT/firmware@version-attribute
- /NXellipsometry/ENTRY/INSTRUMENT/model@version-attribute
- /NXellipsometry/ENTRY/definition@version-attribute
- /NXem/ENTRY/program@version-attribute
- /NXem/ENTRY@version-attribute
- /NXentry/definition@version-attribute
- /NXentry/definition_local@version-attribute
- /NXentry/entry_identifier_uuid@version-attribute
- /NXentry/program_name@version-attribute
- /NXimage_set_em_adf/PROCESS/program@version-attribute
- /NXimage_set_em_adf/PROCESS/source@version-attribute
- /NXmpes/ENTRY/definition@version-attribute
- /NXmx/ENTRY@version-attribute
- /NXsensor_scan/ENTRY/PROCESS/program@version-attribute
- /NXsensor_scan/ENTRY/definition@version-attribute
- /NXspe/ENTRY/definition@version-attribute
- /NXspectrum_set_em_eels/PROCESS/program@version-attribute
- /NXspectrum_set_em_eels/PROCESS/source@version-attribute
- /NXspectrum_set_em_xray/PROCESS/program@version-attribute
- /NXspectrum_set_em_xray/PROCESS/source@version-attribute
- /NXspectrum_set_em_xray/indexing/composition_map/program@version-attribute
- /NXspectrum_set_em_xray/indexing/program@version-attribute
- /NXsubentry/definition@version-attribute
- /NXsubentry/definition_local@version-attribute
- /NXsubentry/program_name@version-attribute
- /NXtransmission/ENTRY/definition@version-attribute
- @wavelength_indices
- /NXdetector/efficiency@wavelength_indices-attribute
- /NXguide/reflectivity@wavelength_indices-attribute
- @xml_version
- /NXroot@XML_version-attribute
- a
- /NXcsg/a-group
- aberration
- /NXcorrector_cs/ABERRATION-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION-group
- aberration_correction
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction-group
- absorbed_beam
- /NXxas/ENTRY/DATA/absorbed_beam-link
- /NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
- absorbing_material
- /NXcollimator/absorbing_material-field
- /NXfermi_chopper/absorbing_material-field
- absorption_cross_section
- /NXattenuator/absorption_cross_section-field
- ac_line_sync
- /NXscanbox_em/ac_line_sync-field
- acceleration_time
- /NXpositioner/acceleration_time-field
- accepted_photon_beam_divergence
- /NXbending_magnet/accepted_photon_beam_divergence-field
- accepting_aperture
- /NXcapillary/accepting_aperture-field
- acquisition_mode
- /NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field
- /NXdetector/acquisition_mode-field
- acquisition_program
- /NXellipsometry/ENTRY/acquisition_program-group
- /NXtransmission/ENTRY/acquisition_program-group
- acquisition_speed
- /NXimage_set_em_kikuchi/profiling/acquisition_speed-field
- acquisition_time
- /NXimage_set_em_kikuchi/profiling/acquisition_time-field
- active
- /NXimage_set_em_se/dynamic_focus/active-field
- /NXimage_set_em_se/tilt_correction/active-field
- add_proxies_to_objects
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/add_proxies_to_objects-field
- address
- /NXapm/ENTRY/USER/address-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/address-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/address-field
- /NXellipsometry/ENTRY/USER/address-field
- /NXem/ENTRY/USER/address-field
- /NXmpes/ENTRY/USER/address-field
- /NXsensor_scan/ENTRY/USER/address-field
- /NXtransmission/ENTRY/operator/address-field
- /NXuser/address-field
- adf_inner_half_angle
- /NXimage_set_em_adf/PROCESS/adf_inner_half_angle-field
- adf_outer_half_angle
- /NXimage_set_em_adf/PROCESS/adf_outer_half_angle-field
- aequatorial_angle
- /NXsas/ENTRY/instrument/detector/aequatorial_angle-field
- /NXsas/ENTRY/sample/aequatorial_angle-field
- /NXsastof/ENTRY/instrument/detector/aequatorial_angle-field
- /NXsastof/ENTRY/sample/aequatorial_angle-field
- affiliation
- /NXapm/ENTRY/USER/affiliation-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/affiliation-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/affiliation-field
- /NXellipsometry/ENTRY/USER/affiliation-field
- /NXem/ENTRY/USER/affiliation-field
- /NXmpes/ENTRY/USER/affiliation-field
- /NXsensor_scan/ENTRY/USER/affiliation-field
- /NXtransmission/ENTRY/operator/affiliation-field
- /NXuser/affiliation-field
- alpha
- /NXcg_alpha_shape/alpha-field
- /NXxkappa/entry/sample/alpha-field
- alpha_value_choice
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/alpha_value_choice-field
- alpha_values
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/alpha_values-field
- alternative
- /NXellipsometry/ENTRY/INSTRUMENT/stage/TRANSFORMATIONS/alternative-field
- amplifier_bias
- /NXdetector/amplifier_bias-field
- amplifier_type
- /NXdetector/amplifier_type-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
- amplifier_voltage
- /NXdetector/amplifier_voltage-field
- analyser
- /NXarpes/ENTRY/INSTRUMENT/analyser-group
- /NXindirecttof/entry/INSTRUMENT/analyser-group
- /NXtas/entry/INSTRUMENT/analyser-group
- analysis_chamber
- /NXapm/ENTRY/atom_probe/analysis_chamber-group
- /NXapm/ENTRY/atom_probe/control_software/analysis_chamber-group
- analysis_description
- /NXapm_paraprobe_config_clusterer/ENTRY/analysis_description-field
- /NXapm_paraprobe_config_distancer/ENTRY/analysis_description-field
- /NXapm_paraprobe_config_intersector/ENTRY/analysis_description-field
- /NXapm_paraprobe_config_nanochem/ENTRY/analysis_description-field
- /NXapm_paraprobe_config_ranger/ENTRY/analysis_description-field
- /NXapm_paraprobe_config_spatstat/ENTRY/analysis_description-field
- /NXapm_paraprobe_config_surfacer/ENTRY/analysis_description-field
- /NXapm_paraprobe_config_tessellator/ENTRY/analysis_description-field
- /NXapm_paraprobe_config_transcoder/ENTRY/analysis_description-field
- /NXapm_paraprobe_results_ranger/ENTRY/analysis_description-field
- /NXapm_paraprobe_results_transcoder/ENTRY/analysis_description-field
- analysis_identifier
- /NXapm_paraprobe_config_clusterer/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_config_distancer/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_config_intersector/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_config_nanochem/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_config_ranger/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_config_spatstat/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_config_surfacer/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_config_tessellator/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_config_transcoder/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_results_ranger/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_results_transcoder/ENTRY/analysis_identifier-field
- analyze_coprecipitation
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/analyze_coprecipitation-field
- analyze_intersection
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/analyze_intersection-field
- analyze_proximity
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/analyze_proximity-field
- angle_of_incidence
- /NXellipsometry/ENTRY/INSTRUMENT/angle_of_incidence-field
- angles
- /NXarpes/ENTRY/INSTRUMENT/analyser/angles-field
- /NXgrating/angles-field
- angular_calibration
- /NXdetector/angular_calibration-field
- /NXmpes/ENTRY/PROCESS/angular_calibration-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration-field
- angular_calibration_applied
- /NXdetector/angular_calibration_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
- angular_dispersion
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/angular_dispersion-field
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING/angular_dispersion-field
- angular_resolution
- /NXelectronanalyser/angular_resolution-field
- /NXinstrument/angular_resolution-field
- angular_spread
- /NXellipsometry/ENTRY/INSTRUMENT/angular_spread-field
- aperture
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group
- /NXcollectioncolumn/APERTURE-group
- /NXenergydispersion/APERTURE-group
- /NXinstrument/APERTURE-group
- /NXsnsevent/ENTRY/instrument/APERTURE-group
- /NXsnshisto/ENTRY/instrument/APERTURE-group
- /NXxraylens/aperture-field
- aperture_em
- /NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM-group
- /NXebeam_column/APERTURE_EM-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM-group
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/APERTURE_EM-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/APERTURE_EM-group
- /NXibeam_column/APERTURE_EM-group
- applied
- /NXapm/ENTRY/atom_probe/REFLECTRON/applied-field
- /NXcalibration/applied-field
- /NXcorrector_cs/applied-field
- /NXdistortion/applied-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/applied-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/applied-field
- /NXmpes/ENTRY/PROCESS/angular_calibration/applied-field
- /NXmpes/ENTRY/PROCESS/energy_calibration/applied-field
- /NXmpes/ENTRY/PROCESS/momentum_calibration/applied-field
- /NXmpes/ENTRY/PROCESS/spatial_calibration/applied-field
- /NXregistration/applied-field
- area
- /NXcg_polygon_set/area-field
- /NXcg_triangle_set/area-field
- arrival_time_pairs
- /NXapm/ENTRY/atom_probe/ion_impact_positions/arrival_time_pairs-field
- assumed_composition_isotopes
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/assumed_composition_isotopes-field
- atom_probe
- /NXapm/ENTRY/atom_probe-group
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe-group
- atom_types
- /NXapm/ENTRY/specimen/atom_types-field
- /NXellipsometry/ENTRY/SAMPLE/atom_types-field
- /NXem/ENTRY/sample/atom_types-field
- attached_to
- /NXsensor/attached_to-field
- attenuator
- /NXinstrument/ATTENUATOR-group
- /NXmx/ENTRY/INSTRUMENT/ATTENUATOR-group
- /NXsnsevent/ENTRY/instrument/ATTENUATOR-group
- /NXsnshisto/ENTRY/instrument/ATTENUATOR-group
- /NXxrot/entry/instrument/attenuator-group
- attenuator_transmission
- /NXattenuator/attenuator_transmission-field
- /NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field
- /NXtransmission/ENTRY/instrument/ref_attenuator/attenuator_transmission-field
- /NXtransmission/ENTRY/instrument/sample_attenuator/attenuator_transmission-field
- /NXxrot/entry/instrument/attenuator/attenuator_transmission-field
- author
- /NXnote/author-field
- /NXsnsevent/ENTRY/SNSHistoTool/author-field
- /NXsnshisto/ENTRY/SNSHistoTool/author-field
- average_power
- /NXbeam/average_power-field
- average_value
- /NXlog/average_value-field
- /NXsnsevent/ENTRY/DASlogs/LOG/average_value-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field
- /NXsnshisto/ENTRY/DASlogs/LOG/average_value-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
- average_value_error
- /NXlog/average_value_error-field
- /NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field
- /NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
- average_value_errors
- /NXlog/average_value_errors-field
- /NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field
- /NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
- axisname
- /NXtransformations/AXISNAME-field
- axisname_end
- /NXtransformations/AXISNAME_end-field
- axisname_increment_set
- /NXtransformations/AXISNAME_increment_set-field
- azimuthal
- /NXspe/ENTRY/data/azimuthal-field
- azimuthal_angle
- /NXcrystal/azimuthal_angle-field
- /NXdetector/azimuthal_angle-field
- /NXlauetof/entry/instrument/detector/azimuthal_angle-field
- /NXreflections/azimuthal_angle-field
- /NXsas/ENTRY/instrument/detector/azimuthal_angle-field
- /NXsastof/ENTRY/instrument/detector/azimuthal_angle-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/azimuthal_angle-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/azimuthal_angle-field
- /NXtofnpd/entry/INSTRUMENT/detector/azimuthal_angle-field
- /NXtofraw/entry/instrument/detector/azimuthal_angle-field
- /NXtofsingle/entry/INSTRUMENT/detector/azimuthal_angle-field
- azimuthal_width
- /NXspe/ENTRY/data/azimuthal_width-field
- b
- /NXcsg/b-group
- background_correction
- /NXimage_set_em_kikuchi/oim/background_correction-group
- background_mean
- /NXreflections/background_mean-field
- background_quantification
- /NXapm/ENTRY/atom_probe/ranging/background_quantification-group
- band_contrast
- /NXimage_set_em_kikuchi/oim/band_detection/band_contrast-field
- band_detection
- /NXimage_set_em_kikuchi/oim/band_detection-group
- band_slope
- /NXimage_set_em_kikuchi/oim/band_detection/band_slope-field
- bands
- /NXimage_set_em_kikuchi/oim/band_detection/bands-field
- bandwidth
- /NXinsertion_device/bandwidth-field
- base_temperature
- /NXapm/ENTRY/atom_probe/stage_lab/base_temperature-field
- beam
- /NXcontainer/beam-group
- /NXebeam_column/BEAM-group
- /NXibeam_column/BEAM-group
- /NXinstrument/BEAM-group
- /NXmpes/ENTRY/INSTRUMENT/BEAM-group
- /NXmx/ENTRY/INSTRUMENT/BEAM-group
- /NXsample/BEAM-group
- beam_1
- /NXcxi_ptycho/entry_1/instrument_1/beam_1-group
- beam_center_derived
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_derived-field
- beam_center_x
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x-field
- /NXdetector/beam_center_x-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
- /NXsas/ENTRY/instrument/detector/beam_center_x-field
- /NXsastof/ENTRY/instrument/detector/beam_center_x-field
- /NXxpcs/entry/instrument/DETECTOR/beam_center_x-field
- /NXxrot/entry/instrument/detector/beam_center_x-field
- beam_center_y
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y-field
- /NXdetector/beam_center_y-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
- /NXsas/ENTRY/instrument/detector/beam_center_y-field
- /NXsastof/ENTRY/instrument/detector/beam_center_y-field
- /NXxpcs/entry/instrument/DETECTOR/beam_center_y-field
- /NXxrot/entry/instrument/detector/beam_center_y-field
- beam_current
- /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/beam_current-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/beam_current-field
- /NXoptical_system_em/beam_current-field
- beam_current_description
- /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/beam_current_description-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/beam_current_description-field
- /NXoptical_system_em/beam_current_description-field
- beam_position
- /NXdisk_chopper/beam_position-field
- beam_shape
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_shape-field
- beam_size_x
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_x-field
- beam_size_y
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_y-field
- beam_stop
- /NXinstrument/BEAM_STOP-group
- beamline
- /NXsnsevent/ENTRY/instrument/beamline-field
- /NXsnshisto/ENTRY/instrument/beamline-field
- beamline_distance
- /NXelectrostatic_kicker/beamline_distance-field
- /NXmagnetic_kicker/beamline_distance-field
- /NXquadrupole_magnet/beamline_distance-field
- /NXseparator/beamline_distance-field
- /NXsolenoid_magnet/beamline_distance-field
- /NXspin_rotator/beamline_distance-field
- bend_angle_x
- /NXguide/bend_angle_x-field
- /NXmirror/bend_angle_x-field
- bend_angle_y
- /NXguide/bend_angle_y-field
- /NXmirror/bend_angle_y-field
- bending_magnet
- /NXinstrument/BENDING_MAGNET-group
- bending_radius
- /NXbending_magnet/bending_radius-field
- bias
- /NXsample/bias-field
- bias_voltage
- /NXimage_set_em_se/bias_voltage-field
- /NXsample/bias_voltage-field
- /NXstage_lab/bias_voltage-field
- bibtex
- /NXcite/bibtex-field
- bin_ends
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/bin_ends-field
- binning
- /NXimage_set_em_kikuchi/binning-group
- /NXimage_set_em_kikuchi/binning/binning-field
- bit_depth_readout
- /NXdetector/bit_depth_readout-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/bit_depth_readout-field
- bitdepth
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
- /NXcs_filter_boolean_mask/bitdepth-field
- blade_geometry
- /NXaperture/BLADE_GEOMETRY-group
- blade_spacing
- /NXcollimator/blade_spacing-field
- blade_thickness
- /NXcollimator/blade_thickness-field
- blaze_wavelength
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING/blaze_wavelength-field
- block
- /NXregion/block-field
- boundaries
- /NXcg_grid/boundaries-field
- boundary_conditions
- /NXcg_grid/boundary_conditions-field
- bounding_box
- /NXcg_grid/bounding_box-group
- /NXcg_polygon_set/bounding_box-group
- /NXcg_triangle_set/bounding_box-group
- /NXreflections/bounding_box-field
- bragg_angle
- /NXcrystal/bragg_angle-field
- bright_field
- /NXtomophase/entry/instrument/bright_field-group
- brightness
- /NXibeam_column/ion_gun/brightness-field
- broadening
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/broadening-field
- buffer_chamber
- /NXapm/ENTRY/atom_probe/buffer_chamber-group
- /NXapm/ENTRY/atom_probe/control_software/buffer_chamber-group
- bunch_distance
- /NXsource/bunch_distance-field
- bunch_length
- /NXsource/bunch_length-field
- bunch_number_end
- /NXsource/bunch_number_end-field
- bunch_number_start
- /NXsource/bunch_number_start-field
- bunch_pattern
- /NXsource/bunch_pattern-group
- c_1_0
- /NXaberration/c_1_0-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_1_0-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_1_0-field
- c_1_2_a
- /NXaberration/c_1_2_a-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_1_2_a-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_1_2_a-field
- c_1_2_b
- /NXaberration/c_1_2_b-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_1_2_b-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_1_2_b-field
- c_2_1_a
- /NXaberration/c_2_1_a-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_2_1_a-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_2_1_a-field
- c_2_1_b
- /NXaberration/c_2_1_b-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_2_1_b-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_2_1_b-field
- c_2_3_a
- /NXaberration/c_2_3_a-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_2_3_a-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_2_3_a-field
- c_2_3_b
- /NXaberration/c_2_3_b-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_2_3_b-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_2_3_b-field
- c_3_0
- /NXaberration/c_3_0-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_3_0-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_3_0-field
- c_3_2_a
- /NXaberration/c_3_2_a-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_3_2_a-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_3_2_a-field
- c_3_2_b
- /NXaberration/c_3_2_b-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_3_2_b-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_3_2_b-field
- c_3_4_a
- /NXaberration/c_3_4_a-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_3_4_a-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_3_4_a-field
- c_3_4_b
- /NXaberration/c_3_4_b-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_3_4_b-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_3_4_b-field
- c_5_0
- /NXaberration/c_5_0-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ABERRATION/c_5_0-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS/ABERRATION/c_5_0-field
- calibrated_axis
- /NXcalibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS/angular_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS/energy_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS/momentum_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS/spatial_calibration/calibrated_axis-field
- calibrated_tof
- /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/calibrated_tof-field
- calibration
- /NXellipsometry/ENTRY/INSTRUMENT/calibration-group
- /NXimage_set_em_kikuchi/calibration-group
- /NXprocess/CALIBRATION-group
- calibration_angle_of_incidence
- /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_angle_of_incidence-field
- calibration_data
- /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data-group
- /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_data-field
- calibration_data_type
- /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_data_type-field
- calibration_date
- /NXdetector/calibration_date-field
- calibration_method
- /NXdetector/calibration_method-group
- calibration_sample
- /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_sample-field
- calibration_status
- /NXellipsometry/ENTRY/INSTRUMENT/calibration_status-field
- calibration_style
- /NXscanbox_em/calibration_style-field
- calibration_time
- /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_time-field
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/calibration_time-field
- calibration_wavelength
- /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_wavelength-field
- cameca_to_nexus
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus-group
- camera_length
- /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/camera_length-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/camera_length-field
- /NXoptical_system_em/camera_length-field
- candidates
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/decorating_iontypes_filter/candidates-field
- cap_surface_area
- /NXcg_cylinder_set/cap_surface_area-field
- capabilities
- /NXapm/ENTRY/atom_probe/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/getter_pump/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/pulser/laser_gun/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION/capabilities-field
- /NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION/capabilities-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
- /NXem/ENTRY/em_lab/FABRICATION/capabilities-field
- /NXem/ENTRY/em_lab/stage_lab/FABRICATION/capabilities-field
- capability
- /NXfabrication/capability-field
- capillary
- /NXinstrument/CAPILLARY-group
- cardinality
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_CYLINDER_SET/cardinality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/cardinality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_CYLINDER_SET/cardinality-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_CYLINDER_SET/cardinality-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
- /NXcg_cylinder_set/cardinality-field
- /NXcg_ellipsoid_set/cardinality-field
- /NXcg_grid/cardinality-field
- /NXcg_hexahedron_set/cardinality-field
- /NXcg_parallelogram_set/cardinality-field
- /NXcg_point_set/cardinality-field
- /NXcg_polygon_set/cardinality-field
- /NXcg_polyhedron_set/cardinality-field
- /NXcg_polyline_set/cardinality-field
- /NXcg_sphere_set/cardinality-field
- /NXcg_tetrahedron_set/cardinality-field
- /NXcg_triangle_set/cardinality-field
- /NXcg_unit_normal_set/cardinality-field
- /NXgraph_node_set/cardinality-field
- categorical_label
- /NXclustering/categorical_label-field
- cdeform_field
- /NXdistortion/cdeform_field-field
- cell_dimensions
- /NXcg_grid/cell_dimensions-field
- center
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_CYLINDER_SET/center-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_ELLIPSOID_SET/center-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/center-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/center-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_CYLINDER_SET/center-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_ELLIPSOID_SET/center-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_CYLINDER_SET/center-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/center-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
- /NXcg_cylinder_set/center-field
- /NXcg_ellipsoid_set/center-field
- /NXcg_hexahedron_set/center-field
- /NXcg_parallelogram_set/center-field
- /NXcg_polygon_set/center-field
- /NXcg_polyhedron_set/center-field
- /NXcg_sphere_set/center-field
- /NXcg_tetrahedron_set/center-field
- /NXcg_triangle_set/center-field
- /NXscanbox_em/center-field
- center_energy
- /NXenergydispersion/center_energy-field
- center_wavelength
- /NXsource/center_wavelength-field
- central_stop_diameter
- /NXfresnel_zone_plate/central_stop_diameter-field
- central_stop_material
- /NXfresnel_zone_plate/central_stop_material-field
- central_stop_thickness
- /NXfresnel_zone_plate/central_stop_thickness-field
- cg_cylinder_set
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_CYLINDER_SET-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_CYLINDER_SET-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_CYLINDER_SET-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
- /NXcg_roi_set/CG_CYLINDER_SET-group
- /NXspatial_filter/CG_CYLINDER_SET-group
- cg_ellipsoid_set
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_ELLIPSOID_SET-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_ELLIPSOID_SET-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
- /NXcg_roi_set/CG_ELLIPSOID_SET-group
- /NXspatial_filter/CG_ELLIPSOID_SET-group
- cg_half_edge_data_structure
- /NXcg_triangulated_surface_mesh/CG_HALF_EDGE_DATA_STRUCTURE-group
- cg_hexahedron_set
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_HEXAHEDRON_SET-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_HEXAHEDRON_SET-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET-group
- /NXspatial_filter/CG_HEXAHEDRON_SET-group
- cg_point_set
- /NXatom_set/CG_POINT_SET-group
- cg_polyhedron_set
- /NXcg_roi_set/CG_POLYHEDRON_SET-group
- cg_sphere_set
- /NXcg_roi_set/CG_SPHERE_SET-group
- cg_triangle_set
- /NXcg_triangulated_surface_mesh/CG_TRIANGLE_SET-group
- cg_triangulated_surface_mesh
- /NXcg_geodesic_mesh/CG_TRIANGULATED_SURFACE_MESH-group
- changer_position
- /NXsample/changer_position-field
- /NXsnsevent/ENTRY/sample/changer_position-field
- /NXsnshisto/ENTRY/sample/changer_position-field
- charge_state
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state-field
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/charge_state-field
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/use_existent_ranging/ION/charge_state-field
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/probe/charge_state-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_gun/probe/charge_state-field
- /NXion/charge_state-field
- chem_id_cas
- /NXsample/chem_id_cas-field
- chemical_formula
- /NXarchive/entry/sample/chemical_formula-field
- /NXcontainer/chemical_formula-field
- /NXcrystal/chemical_formula-field
- /NXfilter/chemical_formula-field
- /NXmpes/ENTRY/SAMPLE/chemical_formula-field
- /NXsample/chemical_formula-field
- /NXsample_component/chemical_formula-field
- chemical_name
- /NXsample/chemical_name-field
- chi
- /NXxeuler/entry/name/chi-link
- /NXxeuler/entry/sample/chi-field
- chirp_gdd
- /NXbeam/chirp_GDD-field
- chirp_type
- /NXbeam/chirp_type-field
- chopper
- /NXreftof/entry/instrument/chopper-group
- cluster_analysis
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis-group
- cluster_indices_filename
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/cluster_indices_filename-field
- clustering_algorithm
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/clustering_algorithm-field
- clustering_parameter
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/clustering_parameter-field
- coating_material
- /NXfilter/coating_material-field
- /NXgrating/coating_material-field
- /NXguide/coating_material-field
- /NXmirror/coating_material-field
- coating_roughness
- /NXfilter/coating_roughness-field
- /NXgrating/coating_roughness-field
- /NXguide/coating_roughness-field
- /NXmirror/coating_roughness-field
- coefficients
- /NXcalibration/coefficients-field
- collection
- /NXcanSAS/ENTRY/COLLECTION-group
- /NXcanSAS/ENTRY/PROCESS/COLLECTION-group
- /NXdetector/COLLECTION-group
- /NXentry/COLLECTION-group
- /NXinstrument/COLLECTION-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/COLLECTION-group
- /NXpeak/COLLECTION-group
- /NXsubentry/COLLECTION-group
- collection_description
- /NXarchive/entry/collection_description-field
- /NXentry/collection_description-field
- /NXsubentry/collection_description-field
- collection_identifier
- /NXarchive/entry/collection_identifier-field
- /NXentry/collection_identifier-field
- /NXsnsevent/ENTRY/collection_identifier-field
- /NXsnshisto/ENTRY/collection_identifier-field
- /NXsubentry/collection_identifier-field
- collection_time
- /NXarchive/entry/collection_time-field
- /NXentry/collection_time-field
- /NXsubentry/collection_time-field
- collection_title
- /NXsnsevent/ENTRY/collection_title-field
- /NXsnshisto/ENTRY/collection_title-field
- collectioncolumn
- /NXelectronanalyser/COLLECTIONCOLUMN-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group
- collimator
- /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR-group
- /NXinstrument/COLLIMATOR-group
- /NXsas/ENTRY/instrument/collimator-group
- /NXsastof/ENTRY/instrument/collimator-group
- column_names
- /NXellipsometry/ENTRY/SAMPLE/column_names-field
- command1
- /NXsnsevent/ENTRY/SNSHistoTool/command1-field
- /NXsnshisto/ENTRY/SNSHistoTool/command1-field
- command_line_call
- /NXapm_paraprobe_results_ranger/ENTRY/performance/command_line_call-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/command_line_call-field
- /NXcs_profiling/command_line_call-field
- comment
- /NXms_snapshot/comment-field
- /NXms_snapshot_set/comment-field
- common_beam_depolarizer
- /NXtransmission/ENTRY/instrument/common_beam_depolarizer-field
- common_beam_mask
- /NXtransmission/ENTRY/instrument/common_beam_mask-group
- comp_current
- /NXflipper/comp_current-field
- comp_turns
- /NXflipper/comp_turns-field
- company
- /NXellipsometry/ENTRY/INSTRUMENT/company-field
- component
- /NXsample/component-field
- component_index
- /NXgeometry/component_index-field
- composition
- /NXpolarizer/composition-field
- composition_map
- /NXspectrum_set_em_xray/indexing/composition_map-group
- composition_product
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/composition_product-field
- composition_profiling
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling-group
- concentration
- /NXsample/concentration-field
- confidence_index
- /NXimage_set_em_kikuchi/oim/indexing/confidence_index-field
- config_filename
- /NXapm_paraprobe_results_ranger/ENTRY/config_filename-field
- /NXapm_paraprobe_results_transcoder/ENTRY/config_filename-field
- construction_year
- /NXellipsometry/ENTRY/INSTRUMENT/construction_year-field
- contrast_aperture
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/contrast_aperture-group
- control
- /NXlauetof/entry/control-group
- /NXrefscan/entry/control-group
- /NXreftof/entry/control-group
- /NXsas/ENTRY/control-group
- /NXsastof/ENTRY/control-group
- /NXstxm/ENTRY/control-group
- /NXtomo/entry/control-group
- /NXtomophase/entry/control-group
- /NXxbase/entry/control-group
- control_points
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/control_points-field
- control_software
- /NXapm/ENTRY/atom_probe/control_software-group
- controller_record
- /NXpositioner/controller_record-field
- coordinate
- /NXcg_grid/coordinate-field
- coordinate_system_set
- /NXapm/ENTRY/COORDINATE_SYSTEM_SET-group
- /NXapm_paraprobe_results_ranger/ENTRY/COORDINATE_SYSTEM_SET-group
- /NXapm_paraprobe_results_transcoder/ENTRY/COORDINATE_SYSTEM_SET-group
- /NXem/ENTRY/COORDINATE_SYSTEM_SET-group
- corrector_cs
- /NXebeam_column/CORRECTOR_CS-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/CORRECTOR_CS-group
- count
- /NXregion/count-field
- count_time
- /NXdetector/count_time-field
- /NXmonitor/count_time-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/count_time-field
- /NXxpcs/entry/instrument/DETECTOR/count_time-field
- countrate_correction_applied
- /NXdetector/countrate_correction_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_applied-field
- countrate_correction_lookup_table
- /NXdetector/countrate_correction_lookup_table-field
- counts
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/counts-field
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/counts-field
- /NXspectrum_set_em_eels/stack/counts-field
- /NXspectrum_set_em_eels/summary/counts-field
- /NXspectrum_set_em_xray/indexing/composition_map/DATA/counts-field
- /NXspectrum_set_em_xray/stack/counts-field
- /NXspectrum_set_em_xray/summary/counts-field
- coupled
- /NXmoderator/coupled-field
- coupling_material
- /NXmoderator/coupling_material-field
- /NXsnsevent/ENTRY/instrument/moderator/coupling_material-field
- /NXsnshisto/ENTRY/instrument/moderator/coupling_material-field
- crate
- /NXdetector/crate-field
- critical_energy
- /NXbending_magnet/critical_energy-field
- cryocoolant
- /NXmanipulator/cryocoolant-field
- cryostat_temperature
- /NXmanipulator/cryostat_temperature-field
- crystal
- /NXinstrument/CRYSTAL-group
- /NXmonochromator/CRYSTAL-group
- /NXmonopd/entry/INSTRUMENT/CRYSTAL-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL-group
- crystallographic_calibration
- /NXapm/ENTRY/atom_probe/reconstruction/crystallographic_calibration-field
- cs_computer
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER-group
- /NXcs_profiling/CS_COMPUTER-group
- cs_cpu
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU-group
- /NXcs_computer/CS_CPU-group
- cs_filter_boolean_mask
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK-group
- /NXspatial_filter/CS_FILTER_BOOLEAN_MASK-group
- cs_gpu
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU-group
- /NXcs_computer/CS_GPU-group
- cs_io_obj
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ-group
- /NXcs_io_sys/CS_IO_OBJ-group
- cs_io_sys
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS-group
- /NXcs_computer/CS_IO_SYS-group
- cs_mm_sys
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_MM_SYS-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_MM_SYS-group
- /NXcs_computer/CS_MM_SYS-group
- cs_profiling_event
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT-group
- /NXcs_profiling/CS_PROFILING_EVENT-group
- csg
- /NXsolid_geometry/CSG-group
- cue_index
- /NXevent_data/cue_index-field
- /NXlog/cue_index-field
- cue_timestamp_zero
- /NXevent_data/cue_timestamp_zero-field
- /NXlog/cue_timestamp_zero-field
- current
- /NXdeflector/current-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/current-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/current-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/current-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/LENS_EM/current-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/LENS_EM/current-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_gun/current-field
- /NXibeam_column/ion_gun/current-field
- /NXiv_temp/ENTRY/DATA/current-field
- /NXlens_em/current-field
- /NXsource/current-field
- current_sensor
- /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor-group
- current_set
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set-group
- curvature
- /NXxraylens/curvature-field
- curvature_horizontal
- /NXcrystal/curvature_horizontal-field
- curvature_vertical
- /NXcrystal/curvature_vertical-field
- cut_angle
- /NXcrystal/cut_angle-field
- cylinder_orientation
- /NXxraylens/cylinder_orientation-group
- cylinders
- /NXcylindrical_geometry/cylinders-field
- cylindrical
- /NXxraylens/cylindrical-field
- cylindrical_geometry
- /NXbeam_stop/CYLINDRICAL_GEOMETRY-group
- /NXdetector/DETECTOR_MODULE/CYLINDRICAL_GEOMETRY-group
- cylindrical_orientation_angle
- /NXcrystal/cylindrical_orientation_angle-field
- d
- /NXreflections/d-field
- d_spacing
- /NXcrystal/d_spacing-field
- dark_field
- /NXtomophase/entry/instrument/dark_field-group
- daslogs
- /NXsnsevent/ENTRY/DASlogs-group
- /NXsnshisto/ENTRY/DASlogs-group
- data
- /NXapm/ENTRY/DATA-group
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA-group
- /NXarpes/ENTRY/DATA-group
- /NXarpes/ENTRY/INSTRUMENT/analyser/data-field
- /NXbeam/DATA-group
- /NXcanSAS/ENTRY/DATA-group
- /NXcxi_ptycho/DATA-group
- /NXcxi_ptycho/DATA/data-link
- /NXcxi_ptycho/data_1/data-link
- /NXcxi_ptycho/entry_1/instrument_1/MONITOR/data-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/data-field
- /NXdata/DATA-field
- /NXdetector/DATA-group
- /NXdetector/data-field
- /NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/data-field
- /NXem/ENTRY/DATA-group
- /NXentry/DATA-group
- /NXfluo/entry/INSTRUMENT/fluorescence/data-field
- /NXfluo/entry/MONITOR/data-field
- /NXfluo/entry/data-group
- /NXfluo/entry/data/data-link
- /NXguide/reflectivity/data-field
- /NXimage_set_em_bf/DATA-group
- /NXimage_set_em_bse/DATA-group
- /NXimage_set_em_chamber/DATA-group
- /NXimage_set_em_df/DATA-group
- /NXimage_set_em_diffrac/DATA-group
- /NXimage_set_em_ecci/DATA-group
- /NXimage_set_em_kikuchi/DATA-group
- /NXimage_set_em_ronchigram/DATA-group
- /NXimage_set_em_se/DATA-group
- /NXinteraction_vol_em/DATA-group
- /NXiqproc/ENTRY/DATA-group
- /NXiqproc/ENTRY/DATA/data-field
- /NXiv_temp/ENTRY/DATA-group
- /NXlauetof/entry/control/data-field
- /NXlauetof/entry/instrument/detector/data-field
- /NXlauetof/entry/name/data-link
- /NXmonitor/data-field
- /NXmonopd/entry/DATA-group
- /NXmonopd/entry/DATA/data-link
- /NXmonopd/entry/INSTRUMENT/DETECTOR/data-field
- /NXmpes/ENTRY/DATA-group
- /NXmpes/ENTRY/DATA/data-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA-group
- /NXmx/ENTRY/DATA-group
- /NXmx/ENTRY/DATA/data-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/data-field
- /NXnote/data-field
- /NXrefscan/entry/control/data-field
- /NXrefscan/entry/data-group
- /NXrefscan/entry/data/data-link
- /NXrefscan/entry/instrument/DETECTOR/data-field
- /NXreftof/entry/control/data-field
- /NXreftof/entry/data-group
- /NXreftof/entry/data/data-link
- /NXreftof/entry/instrument/detector/data-field
- /NXsas/ENTRY/data-group
- /NXsas/ENTRY/data/data-link
- /NXsas/ENTRY/instrument/detector/data-field
- /NXsastof/ENTRY/control/data-field
- /NXsastof/ENTRY/data-group
- /NXsastof/ENTRY/data/data-link
- /NXsastof/ENTRY/instrument/detector/data-field
- /NXscan/ENTRY/DATA-group
- /NXscan/ENTRY/DATA/data-link
- /NXscan/ENTRY/INSTRUMENT/DETECTOR/data-field
- /NXscan/ENTRY/MONITOR/data-field
- /NXsensor_scan/ENTRY/DATA-group
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/DATA-group
- /NXsnsevent/ENTRY/DATA-group
- /NXsnsevent/ENTRY/MONITOR/data-field
- /NXsnshisto/ENTRY/DATA-group
- /NXsnshisto/ENTRY/DATA/data-link
- /NXsnshisto/ENTRY/MONITOR/data-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/data-field
- /NXspe/ENTRY/data-group
- /NXspe/ENTRY/data/data-field
- /NXspectrum_set_em_auger/DATA-group
- /NXspectrum_set_em_cathodolum/DATA-group
- /NXspectrum_set_em_xray/indexing/composition_map/DATA-group
- /NXsqom/ENTRY/DATA-group
- /NXsqom/ENTRY/DATA/data-field
- /NXstxm/ENTRY/DATA-group
- /NXstxm/ENTRY/DATA/data-field
- /NXstxm/ENTRY/INSTRUMENT/DETECTOR/data-field
- /NXstxm/ENTRY/INSTRUMENT/sample_x/data-field
- /NXstxm/ENTRY/INSTRUMENT/sample_y/data-field
- /NXstxm/ENTRY/INSTRUMENT/sample_z/data-field
- /NXstxm/ENTRY/control/data-field
- /NXsubentry/DATA-group
- /NXtas/entry/DATA-group
- /NXtas/entry/DATA/data-link
- /NXtas/entry/INSTRUMENT/DETECTOR/data-field
- /NXtas/entry/MONITOR/data-field
- /NXtofnpd/entry/INSTRUMENT/detector/data-field
- /NXtofnpd/entry/MONITOR/data-field
- /NXtofnpd/entry/data-group
- /NXtofnpd/entry/data/data-link
- /NXtofraw/entry/MONITOR/data-field
- /NXtofraw/entry/data-group
- /NXtofraw/entry/data/data-link
- /NXtofraw/entry/instrument/detector/data-field
- /NXtofsingle/entry/INSTRUMENT/detector/data-field
- /NXtofsingle/entry/MONITOR/data-field
- /NXtofsingle/entry/data-group
- /NXtofsingle/entry/data/data-link
- /NXtomo/entry/control/data-field
- /NXtomo/entry/data-group
- /NXtomo/entry/data/data-link
- /NXtomo/entry/instrument/detector/data-field
- /NXtomophase/entry/data-group
- /NXtomophase/entry/data/data-link
- /NXtomophase/entry/instrument/bright_field/data-field
- /NXtomophase/entry/instrument/dark_field/data-field
- /NXtomophase/entry/instrument/sample/data-field
- /NXtomoproc/entry/data-group
- /NXtomoproc/entry/data/data-field
- /NXtransmission/ENTRY/data-group
- /NXxas/ENTRY/DATA-group
- /NXxas/ENTRY/INSTRUMENT/absorbed_beam/data-field
- /NXxas/ENTRY/INSTRUMENT/incoming_beam/data-field
- /NXxas/ENTRY/MONITOR/data-field
- /NXxasproc/ENTRY/DATA-group
- /NXxasproc/ENTRY/DATA/data-field
- /NXxbase/entry/DATA-group
- /NXxbase/entry/DATA/data-link
- /NXxbase/entry/instrument/detector/data-field
- /NXxlaue/entry/instrument/source/distribution/data-field
- /NXxpcs/entry/data-group
- data_1
- /NXcxi_ptycho/data_1-group
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/data_1-link
- data_correction
- /NXellipsometry/ENTRY/INSTRUMENT/data_correction-field
- data_error
- /NXellipsometry/ENTRY/SAMPLE/data_error-field
- data_errors
- /NXdetector/data_errors-field
- data_file
- /NXdetector/data_file-group
- data_identifier
- /NXellipsometry/ENTRY/SAMPLE/data_identifier-field
- data_origin
- /NXdetector_module/data_origin-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_origin-field
- data_size
- /NXdetector_module/data_size-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_size-field
- data_stride
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_stride-field
- data_type
- /NXellipsometry/ENTRY/SAMPLE/data_type-field
- data_x_time_of_flight
- /NXsnshisto/ENTRY/DATA/data_x_time_of_flight-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_time_of_flight-field
- data_x_y
- /NXsnsevent/ENTRY/DATA/data_x_y-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/data_x_y-field
- /NXsnshisto/ENTRY/DATA/data_x_y-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_y-field
- data_y_time_of_flight
- /NXsnshisto/ENTRY/DATA/data_y_time_of_flight-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/data_y_time_of_flight-field
- dataset
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/dataset-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/dataset-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset-group
- /NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/dataset-group
- dataset_name
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/dataset_name-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/dataset_name-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances/dataset_name-field
- dataset_name_cluster_indices
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset_name_cluster_indices-field
- dataset_name_distances
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_edge_distances/dataset_name_distances-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/dataset_name_distances-field
- dataset_name_facet_indices
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_facet_indices-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_facet_indices-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_indices-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/dataset_name_facet_indices-field
- dataset_name_facet_normals
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_facet_normals-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_facet_normals-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_normals-field
- dataset_name_facet_vertices
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_vertices-field
- dataset_name_mass_to_charge
- /NXapm_input_reconstruction/dataset_name_mass_to_charge-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/dataset_name_mass_to_charge-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/dataset_name_mass_to_charge-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/dataset/dataset_name_mass_to_charge-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/dataset/dataset_name_mass_to_charge-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
- dataset_name_positions
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset_name_positions-field
- dataset_name_reconstruction
- /NXapm_input_reconstruction/dataset_name_reconstruction-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/dataset_name_reconstruction-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/dataset_name_reconstruction-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/dataset/dataset_name_reconstruction-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/dataset/dataset_name_reconstruction-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
- dataset_name_vertices
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_vertices-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_vertices-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_vertices-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/dataset_name_vertices-field
- dataset_object_identifier
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/dataset_object_identifier-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/dataset_object_identifier-field
- date
- /NXcanSAS/ENTRY/PROCESS/date-field
- /NXnote/date-field
- /NXprocess/date-field
- /NXsnsevent/ENTRY/SNSHistoTool/date-field
- /NXsnshisto/ENTRY/SNSHistoTool/date-field
- /NXtomoproc/entry/reconstruction/date-field
- /NXxasproc/ENTRY/XAS_data_reduction/date-field
- dead_time
- /NXdetector/dead_time-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
- decorating_iontypes_filter
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/decorating_iontypes_filter-group
- definition
- /NXapm/ENTRY/definition-field
- /NXapm_paraprobe_config_clusterer/ENTRY/definition-field
- /NXapm_paraprobe_config_distancer/ENTRY/definition-field
- /NXapm_paraprobe_config_intersector/ENTRY/definition-field
- /NXapm_paraprobe_config_nanochem/ENTRY/definition-field
- /NXapm_paraprobe_config_ranger/ENTRY/definition-field
- /NXapm_paraprobe_config_spatstat/ENTRY/definition-field
- /NXapm_paraprobe_config_surfacer/ENTRY/definition-field
- /NXapm_paraprobe_config_tessellator/ENTRY/definition-field
- /NXapm_paraprobe_config_transcoder/ENTRY/definition-field
- /NXapm_paraprobe_results_ranger/ENTRY/definition-field
- /NXapm_paraprobe_results_transcoder/ENTRY/definition-field
- /NXarchive/entry/definition-field
- /NXarpes/ENTRY/definition-field
- /NXcanSAS/ENTRY/definition-field
- /NXcxi_ptycho/entry_1/definition-field
- /NXdirecttof/entry/definition-field
- /NXellipsometry/ENTRY/definition-field
- /NXem/ENTRY/definition-field
- /NXentry/definition-field
- /NXfluo/entry/definition-field
- /NXindirecttof/entry/definition-field
- /NXiqproc/ENTRY/definition-field
- /NXiv_temp/ENTRY/definition-field
- /NXlauetof/entry/definition-field
- /NXmonopd/entry/definition-field
- /NXmpes/ENTRY/definition-field
- /NXmx/ENTRY/definition-field
- /NXrefscan/entry/definition-field
- /NXreftof/entry/definition-field
- /NXsas/ENTRY/definition-field
- /NXsastof/ENTRY/definition-field
- /NXscan/ENTRY/definition-field
- /NXsensor_scan/ENTRY/definition-field
- /NXsnsevent/ENTRY/definition-field
- /NXsnshisto/ENTRY/definition-field
- /NXspe/ENTRY/definition-field
- /NXsqom/ENTRY/definition-field
- /NXstxm/ENTRY/definition-field
- /NXsubentry/definition-field
- /NXtas/entry/definition-field
- /NXtofnpd/entry/definition-field
- /NXtofraw/entry/definition-field
- /NXtofsingle/entry/definition-field
- /NXtomo/entry/definition-field
- /NXtomophase/entry/definition-field
- /NXtomoproc/entry/definition-field
- /NXtransmission/ENTRY/definition-field
- /NXxas/ENTRY/definition-field
- /NXxasproc/ENTRY/definition-field
- /NXxbase/entry/definition-field
- /NXxeuler/entry/definition-field
- /NXxkappa/entry/definition-field
- /NXxlaue/entry/definition-field
- /NXxlaueplate/entry/definition-field
- /NXxnb/entry/definition-field
- /NXxpcs/entry/definition-field
- /NXxrot/entry/definition-field
- definition_local
- /NXentry/definition_local-field
- /NXsubentry/definition_local-field
- deflection_angle
- /NXgrating/deflection_angle-field
- deflector
- /NXcollectioncolumn/DEFLECTOR-group
- /NXelectronanalyser/DEFLECTOR-group
- /NXenergydispersion/DEFLECTOR-group
- /NXspindispersion/DEFLECTOR-group
- defocus
- /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/defocus-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/defocus-field
- /NXoptical_system_em/defocus-field
- delay
- /NXdisk_chopper/delay-field
- delay_difference
- /NXxpcs/entry/data/delay_difference-field
- delocalization
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization-group
- density
- /NXcontainer/density-field
- /NXcrystal/density-field
- /NXem/ENTRY/sample/density-field
- /NXfilter/density-field
- /NXsample/density-field
- /NXsample_component/density-field
- depends_on
- /NXaperture/depends_on-field
- /NXattenuator/depends_on-field
- /NXbeam/depends_on-field
- /NXbeam_stop/depends_on-field
- /NXbending_magnet/depends_on-field
- /NXcapillary/depends_on-field
- /NXcollectioncolumn/depends_on-field
- /NXcollimator/depends_on-field
- /NXcrystal/depends_on-field
- /NXdeflector/depends_on-field
- /NXdetector/depends_on-field
- /NXdetector_module/depends_on-field
- /NXdisk_chopper/depends_on-field
- /NXelectronanalyser/depends_on-field
- /NXenvironment/depends_on-field
- /NXfermi_chopper/depends_on-field
- /NXfilter/depends_on-field
- /NXflipper/depends_on-field
- /NXfresnel_zone_plate/depends_on-field
- /NXgrating/depends_on-field
- /NXguide/depends_on-field
- /NXinsertion_device/depends_on-field
- /NXlens_em/depends_on-field
- /NXmanipulator/depends_on-field
- /NXmirror/depends_on-field
- /NXmoderator/depends_on-field
- /NXmonitor/depends_on-field
- /NXmonochromator/depends_on-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field
- /NXmx/ENTRY/SAMPLE/depends_on-field
- /NXpinhole/depends_on-field
- /NXpolarizer/depends_on-field
- /NXpositioner/depends_on-field
- /NXquadric/depends_on-field
- /NXregistration/depends_on-field
- /NXsample/depends_on-field
- /NXsensor/depends_on-field
- /NXslit/depends_on-field
- /NXsource/depends_on-field
- /NXspindispersion/depends_on-field
- /NXvelocity_selector/depends_on-field
- /NXxraylens/depends_on-field
- depolarization
- /NXellipsometry/ENTRY/derived_parameters/depolarization-field
- depth
- /NXgrating/depth-field
- derived_parameters
- /NXellipsometry/ENTRY/derived_parameters-group
- description
- /NXaperture/description-field
- /NXaperture_em/description-field
- /NXapm/ENTRY/atom_probe/REFLECTRON/description-field
- /NXapm/ENTRY/atom_probe/analysis_chamber/description-field
- /NXapm/ENTRY/atom_probe/buffer_chamber/description-field
- /NXapm/ENTRY/atom_probe/load_lock_chamber/description-field
- /NXapm/ENTRY/specimen/description-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
- /NXarchive/entry/instrument/description-field
- /NXarchive/entry/sample/description-field
- /NXbeam_stop/description-field
- /NXcalibration/description-field
- /NXcanSAS/ENTRY/PROCESS/description-field
- /NXchamber/description-field
- /NXcite/description-field
- /NXcontainer/description-field
- /NXcorrector_cs/description-field
- /NXcs_profiling_event/description-field
- /NXdeflector/description-field
- /NXdetector/description-field
- /NXdistortion/description-field
- /NXebeam_column/electron_gun/description-field
- /NXelectronanalyser/description-field
- /NXelectrostatic_kicker/description-field
- /NXellipsometry/ENTRY/INSTRUMENT/stage/description-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/description-field
- /NXem/ENTRY/em_lab/stage_lab/description-field
- /NXem/ENTRY/sample/description-field
- /NXenvironment/description-field
- /NXfilter/description-field
- /NXgeometry/description-field
- /NXguide/description-field
- /NXibeam_column/ion_gun/description-field
- /NXlens_em/description-field
- /NXlog/description-field
- /NXmagnetic_kicker/description-field
- /NXmanipulator/description-field
- /NXmirror/description-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field
- /NXnote/description-field
- /NXpid/description-field
- /NXpositioner/description-field
- /NXquadrupole_magnet/description-field
- /NXreflectron/description-field
- /NXregistration/description-field
- /NXsample/description-field
- /NXsample_component/description-field
- /NXseparator/description-field
- /NXsnsevent/ENTRY/DASlogs/LOG/description-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field
- /NXsnsevent/ENTRY/SNSHistoTool/description-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field
- /NXsnshisto/ENTRY/DASlogs/LOG/description-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field
- /NXsnshisto/ENTRY/SNSHistoTool/description-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field
- /NXsolenoid_magnet/description-field
- /NXspin_rotator/description-field
- /NXstage_lab/description-field
- /NXxpcs/entry/instrument/DETECTOR/description-field
- design
- /NXapm/ENTRY/atom_probe/getter_pump/design-field
- /NXapm/ENTRY/atom_probe/roughening_pump/design-field
- /NXapm/ENTRY/atom_probe/turbomolecular_pump/design-field
- /NXem/ENTRY/em_lab/stage_lab/design-field
- /NXpump/design-field
- /NXstage_lab/design-field
- det_module
- /NXreflections/det_module-field
- details
- /NXcanSAS/ENTRY/SAMPLE/details-field
- detection_gas_path
- /NXdetector/detection_gas_path-field
- detection_rate
- /NXapm/ENTRY/atom_probe/specimen_monitoring/detection_rate-field
- detector
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group
- /NXelectronanalyser/DETECTOR-group
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR-group
- /NXem/ENTRY/em_lab/DETECTOR-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/DETECTOR-group
- /NXinstrument/DETECTOR-group
- /NXlauetof/entry/instrument/detector-group
- /NXmonopd/entry/INSTRUMENT/DETECTOR-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR-group
- /NXrefscan/entry/instrument/DETECTOR-group
- /NXreftof/entry/instrument/detector-group
- /NXsas/ENTRY/instrument/detector-group
- /NXsastof/ENTRY/instrument/detector-group
- /NXscan/ENTRY/INSTRUMENT/DETECTOR-group
- /NXsnsevent/ENTRY/instrument/DETECTOR-group
- /NXsnshisto/ENTRY/instrument/DETECTOR-group
- /NXstxm/ENTRY/INSTRUMENT/DETECTOR-group
- /NXtas/entry/INSTRUMENT/DETECTOR-group
- /NXtofnpd/entry/INSTRUMENT/detector-group
- /NXtofraw/entry/instrument/detector-group
- /NXtofsingle/entry/INSTRUMENT/detector-group
- /NXtomo/entry/instrument/detector-group
- /NXtransmission/ENTRY/instrument/DETECTOR-group
- /NXxbase/entry/instrument/detector-group
- /NXxeuler/entry/instrument/detector-group
- /NXxkappa/entry/instrument/detector-group
- /NXxlaueplate/entry/instrument/detector-group
- /NXxnb/entry/instrument/detector-group
- /NXxpcs/entry/instrument/DETECTOR-group
- /NXxrot/entry/instrument/detector-group
- detector_1
- /NXcxi_ptycho/entry_1/instrument_1/detector_1-group
- detector_distance
- /NXimage_set_em_kikuchi/oim/detector_distance-field
- detector_faces
- /NXoff_geometry/detector_faces-field
- detector_group
- /NXinstrument/DETECTOR_GROUP-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
- detector_identifier
- /NXem/ENTRY/measurement/EVENT_DATA_EM/detector_identifier-field
- /NXevent_data_em/detector_identifier-field
- detector_module
- /NXdetector/DETECTOR_MODULE-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
- detector_number
- /NXcylindrical_geometry/detector_number-field
- /NXdetector/detector_number-field
- /NXtofnpd/entry/INSTRUMENT/detector/detector_number-field
- /NXtofnpd/entry/data/detector_number-link
- /NXtofraw/entry/data/detector_number-link
- /NXtofraw/entry/instrument/detector/detector_number-field
- detector_readout_time
- /NXdetector/detector_readout_time-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
- detector_type
- /NXdetector/detector_type-field
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/detector_type-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field
- detector_voltage
- /NXdetector/detector_voltage-field
- diameter
- /NXdetector/diameter-field
- /NXenergydispersion/diameter-field
- /NXpinhole/diameter-field
- /NXxlaueplate/entry/instrument/detector/diameter-field
- diffraction_order
- /NXgrating/diffraction_order-field
- diffractometer
- /NXinstrument/DIFFRACTOMETER-group
- dimensionality
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_CYLINDER_SET/dimensionality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/dimensionality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_CYLINDER_SET/dimensionality-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_CYLINDER_SET/dimensionality-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
- /NXcg_alpha_shape/dimensionality-field
- /NXcg_cylinder_set/dimensionality-field
- /NXcg_ellipsoid_set/dimensionality-field
- /NXcg_face_list_data_structure/dimensionality-field
- /NXcg_grid/dimensionality-field
- /NXcg_half_edge_data_structure/dimensionality-field
- /NXcg_hexahedron_set/dimensionality-field
- /NXcg_isocontour/dimensionality-field
- /NXcg_parallelogram_set/dimensionality-field
- /NXcg_point_set/dimensionality-field
- /NXcg_polygon_set/dimensionality-field
- /NXcg_polyhedron_set/dimensionality-field
- /NXcg_polyline_set/dimensionality-field
- /NXcg_sphere_set/dimensionality-field
- /NXcg_tetrahedron_set/dimensionality-field
- /NXcg_triangle_set/dimensionality-field
- /NXcg_unit_normal_set/dimensionality-field
- /NXgraph_node_set/dimensionality-field
- /NXms_crystal_set/dimensionality-field
- direction
- /NXbeam/TRANSFORMATIONS/DIRECTION-field
- /NXshape/direction-field
- direction_model
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/direction_model-field
- directionality
- /NXgraph_edge_set/directionality-field
- disk_chopper
- /NXdirecttof/entry/INSTRUMENT/disk_chopper-group
- /NXinstrument/DISK_CHOPPER-group
- /NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group
- /NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
- distance
- /NXattenuator/distance-field
- /NXbeam/distance-field
- /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field
- /NXdetector/distance-field
- /NXdisk_chopper/distance-field
- /NXfermi_chopper/distance-field
- /NXindirecttof/entry/INSTRUMENT/analyser/distance-field
- /NXlauetof/entry/instrument/detector/distance-field
- /NXmoderator/distance-field
- /NXmonitor/distance-field
- /NXmpes/ENTRY/INSTRUMENT/BEAM/distance-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field
- /NXreftof/entry/instrument/chopper/distance-field
- /NXreftof/entry/instrument/detector/distance-field
- /NXsample/distance-field
- /NXsas/ENTRY/instrument/detector/distance-field
- /NXsastof/ENTRY/instrument/detector/distance-field
- /NXsnsevent/ENTRY/MONITOR/distance-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field
- /NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/distance-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation/distance-field
- /NXsnsevent/ENTRY/instrument/DISK_CHOPPER/distance-field
- /NXsnsevent/ENTRY/instrument/moderator/distance-field
- /NXsnshisto/ENTRY/MONITOR/distance-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation/distance-field
- /NXsnshisto/ENTRY/instrument/ATTENUATOR/distance-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/distance-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation/distance-field
- /NXsnshisto/ENTRY/instrument/DISK_CHOPPER/distance-field
- /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER/distance-field
- /NXsnshisto/ENTRY/instrument/moderator/distance-field
- /NXsource/distance-field
- /NXspe/ENTRY/data/distance-field
- /NXtofnpd/entry/INSTRUMENT/detector/distance-field
- /NXtofnpd/entry/MONITOR/distance-field
- /NXtofraw/entry/MONITOR/distance-field
- /NXtofraw/entry/instrument/detector/distance-field
- /NXtofsingle/entry/INSTRUMENT/detector/distance-field
- /NXtofsingle/entry/MONITOR/distance-field
- /NXtomo/entry/instrument/detector/distance-field
- /NXtomophase/entry/instrument/sample/distance-field
- /NXxbase/entry/instrument/detector/distance-field
- /NXxbase/entry/sample/distance-field
- /NXxpcs/entry/instrument/DETECTOR/distance-field
- distance_derived
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance_derived-field
- distance_to_detector
- /NXbeam_stop/distance_to_detector-field
- distances
- /NXtranslation/distances-field
- distancing_model
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/distancing_model-field
- distortion
- /NXprocess/DISTORTION-group
- distribution
- /NXmonochromator/distribution-group
- /NXsource/distribution-group
- /NXxlaue/entry/instrument/source/distribution-group
- divergence_x
- /NXcollimator/divergence_x-field
- divergence_x_minus
- /NXbending_magnet/divergence_x_minus-field
- divergence_x_plus
- /NXbending_magnet/divergence_x_plus-field
- divergence_y
- /NXcollimator/divergence_y-field
- divergence_y_minus
- /NXbending_magnet/divergence_y_minus-field
- divergence_y_plus
- /NXbending_magnet/divergence_y_plus-field
- doi
- /NXcite/doi-field
- downsampled
- /NXregion/downsampled-group
- dql
- /NXcanSAS/ENTRY/DATA/dQl-field
- dqw
- /NXcanSAS/ENTRY/DATA/dQw-field
- drain_current
- /NXmanipulator/drain_current-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current-field
- /NXsample/drain_current-field
- duration
- /NXarchive/entry/duration-field
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/duration-field
- /NXentry/duration-field
- /NXlog/duration-field
- /NXsnsevent/ENTRY/DASlogs/LOG/duration-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/duration-field
- /NXsnsevent/ENTRY/duration-field
- /NXsnshisto/ENTRY/DASlogs/LOG/duration-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/duration-field
- /NXsnshisto/ENTRY/duration-field
- /NXsubentry/duration-field
- /NXtofraw/entry/duration-field
- /NXtofsingle/entry/duration-field
- duty_cycle
- /NXgrating/duty_cycle-field
- dwell_time
- /NXimage_set_em_se/dwell_time-field
- dynamic_focus
- /NXimage_set_em_se/dynamic_focus-group
- dynamic_phi_list
- /NXxpcs/entry/instrument/masks/dynamic_phi_list-field
- dynamic_q_list
- /NXxpcs/entry/instrument/masks/dynamic_q_list-field
- dynamic_roi_map
- /NXxpcs/entry/instrument/masks/dynamic_roi_map-field
- ebeam_column
- /NXem/ENTRY/em_lab/EBEAM_COLUMN-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN-group
- /NXevent_data_em/em_lab/EBEAM_COLUMN-group
- ebeam_deflector
- /NXem/ENTRY/em_lab/ebeam_deflector-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/ebeam_deflector-group
- /NXevent_data_em/em_lab/ebeam_deflector-group
- edge_handling_method
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/edge_handling_method-field
- edge_identifier
- /NXcg_face_list_data_structure/edge_identifier-field
- edge_identifier_offset
- /NXcg_face_list_data_structure/edge_identifier_offset-field
- edge_length
- /NXcg_polygon_set/edge_length-field
- /NXcg_polyhedron_set/edge_length-field
- /NXcg_tetrahedron_set/edge_length-field
- /NXcg_triangle_set/edge_length-field
- edge_normal
- /NXcg_hexahedron_set/edge_normal-group
- /NXcg_parallelogram_set/edge_normal-group
- /NXcg_polygon_set/edge_normal-group
- /NXcg_polyhedron_set/edge_normal-group
- /NXcg_polyline_set/edge_normal-group
- /NXcg_tetrahedron_set/edge_normal-group
- /NXcg_triangle_set/edge_normal-group
- edge_of_the_dataset
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset-group
- edge_threshold
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/edge_threshold-field
- edges
- /NXcg_face_list_data_structure/edges-field
- edges_are_unique
- /NXcg_face_list_data_structure/edges_are_unique-field
- ef
- /NXtas/entry/DATA/ef-link
- /NXtas/entry/INSTRUMENT/analyser/ef-field
- efficiency
- /NXdetector/efficiency-group
- /NXdetector/efficiency/efficiency-field
- /NXmonitor/efficiency-field
- /NXpolarizer/efficiency-field
- ei
- /NXtas/entry/DATA/ei-link
- /NXtas/entry/INSTRUMENT/monochromator/ei-field
- elapsed_time
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/elapsed_time-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/elapsed_time-field
- /NXcs_profiling_event/elapsed_time-field
- electric_field
- /NXarchive/entry/sample/electric_field-field
- /NXsample/electric_field-field
- electron_gun
- /NXebeam_column/electron_gun-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_gun-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/electron_gun-group
- electronanalyser
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER-group
- element_names
- /NXspectrum_set_em_xray/indexing/element_names-field
- element_whitelist
- /NXapm_paraprobe_config_intersector/ENTRY/element_whitelist-field
- /NXdelocalization/element_whitelist-field
- ellipsometry_type
- /NXellipsometry/ENTRY/INSTRUMENT/ellipsometry_type-field
- em_lab
- /NXem/ENTRY/em_lab-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab-group
- /NXevent_data_em/em_lab-group
- email
- /NXapm/ENTRY/USER/email-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/email-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/email-field
- /NXellipsometry/ENTRY/USER/email-field
- /NXem/ENTRY/USER/email-field
- /NXmpes/ENTRY/USER/email-field
- /NXsensor_scan/ENTRY/USER/email-field
- /NXtransmission/ENTRY/operator/email-field
- /NXuser/email-field
- emittance_x
- /NXsource/emittance_x-field
- emittance_y
- /NXsource/emittance_y-field
- emitter_material
- /NXebeam_column/electron_gun/emitter_material-field
- emitter_type
- /NXebeam_column/electron_gun/emitter_type-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_gun/emitter_type-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/emitter_type-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_gun/emitter_type-field
- /NXibeam_column/ion_gun/emitter_type-field
- en
- /NXsqom/ENTRY/DATA/en-field
- /NXtas/entry/DATA/en-link
- /NXtas/entry/SAMPLE/en-field
- end_time
- /NXapm/ENTRY/end_time-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/end_time-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/end_time-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/end_time-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/end_time-field
- /NXarchive/entry/end_time-field
- /NXcs_profiling/end_time-field
- /NXcs_profiling_event/end_time-field
- /NXcxi_ptycho/entry_1/end_time-field
- /NXem/ENTRY/end_time-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/end_time-field
- /NXentry/end_time-field
- /NXevent_data_em/end_time-field
- /NXmonitor/end_time-field
- /NXmx/ENTRY/end_time-field
- /NXrefscan/entry/end_time-field
- /NXreftof/entry/end_time-field
- /NXsas/ENTRY/end_time-field
- /NXscan/ENTRY/end_time-field
- /NXsensor_scan/ENTRY/end_time-field
- /NXsnsevent/ENTRY/end_time-field
- /NXsnshisto/ENTRY/end_time-field
- /NXstxm/ENTRY/end_time-field
- /NXsubentry/end_time-field
- /NXtomo/entry/end_time-field
- /NXtomophase/entry/end_time-field
- /NXxpcs/entry/end_time-field
- end_time_estimated
- /NXmx/ENTRY/end_time_estimated-field
- endnote
- /NXcite/endnote-field
- energies
- /NXarpes/ENTRY/INSTRUMENT/analyser/energies-field
- energy
- /NXarpes/ENTRY/INSTRUMENT/monochromator/energy-field
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy-field
- /NXcxi_ptycho/entry_1/instrument_1/source_1/energy-field
- /NXdirecttof/entry/INSTRUMENT/disk_chopper/energy-field
- /NXdirecttof/entry/INSTRUMENT/fermi_chopper/energy-field
- /NXfermi_chopper/energy-field
- /NXfluo/entry/INSTRUMENT/fluorescence/energy-field
- /NXfluo/entry/data/energy-link
- /NXindirecttof/entry/INSTRUMENT/analyser/energy-field
- /NXinsertion_device/energy-field
- /NXmonochromator/energy-field
- /NXsource/energy-field
- /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER/energy-field
- /NXspe/ENTRY/data/energy-field
- /NXstxm/ENTRY/DATA/energy-field
- /NXstxm/ENTRY/INSTRUMENT/monochromator/energy-field
- /NXxas/ENTRY/DATA/energy-link
- /NXxas/ENTRY/INSTRUMENT/monochromator/energy-field
- /NXxasproc/ENTRY/DATA/energy-field
- energy_calibration
- /NXmpes/ENTRY/PROCESS/energy_calibration-group
- energy_error
- /NXmonochromator/energy_error-field
- energy_errors
- /NXmonochromator/energy_errors-field
- energy_interval
- /NXenergydispersion/energy_interval-field
- energy_loss
- /NXspectrum_set_em_eels/stack/energy_loss-field
- /NXspectrum_set_em_eels/summary/energy_loss-field
- energy_resolution
- /NXelectronanalyser/energy_resolution-field
- /NXinstrument/energy_resolution-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-field
- /NXmpes/ENTRY/INSTRUMENT/energy_resolution-field
- energy_scan_mode
- /NXenergydispersion/energy_scan_mode-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field
- energy_transfer
- /NXbeam/energy_transfer-field
- energydispersion
- /NXelectronanalyser/ENERGYDISPERSION-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
- entering
- /NXreflections/entering-field
- entrance_slit
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit-group
- entrance_slit_setting
- /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_setting-field
- entrance_slit_shape
- /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_shape-field
- entrance_slit_size
- /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_size-field
- entry
- /NXapm/ENTRY-group
- /NXapm_paraprobe_config_clusterer/ENTRY-group
- /NXapm_paraprobe_config_distancer/ENTRY-group
- /NXapm_paraprobe_config_intersector/ENTRY-group
- /NXapm_paraprobe_config_nanochem/ENTRY-group
- /NXapm_paraprobe_config_ranger/ENTRY-group
- /NXapm_paraprobe_config_spatstat/ENTRY-group
- /NXapm_paraprobe_config_surfacer/ENTRY-group
- /NXapm_paraprobe_config_tessellator/ENTRY-group
- /NXapm_paraprobe_config_transcoder/ENTRY-group
- /NXapm_paraprobe_results_ranger/ENTRY-group
- /NXapm_paraprobe_results_transcoder/ENTRY-group
- /NXarchive/entry-group
- /NXarpes/ENTRY-group
- /NXcanSAS/ENTRY-group
- /NXdirecttof/entry-group
- /NXellipsometry/ENTRY-group
- /NXem/ENTRY-group
- /NXfluo/entry-group
- /NXindirecttof/entry-group
- /NXiqproc/ENTRY-group
- /NXiv_temp/ENTRY-group
- /NXlauetof/entry-group
- /NXmonopd/entry-group
- /NXmpes/ENTRY-group
- /NXmx/ENTRY-group
- /NXrefscan/entry-group
- /NXreftof/entry-group
- /NXroot/ENTRY-group
- /NXsas/ENTRY-group
- /NXsastof/ENTRY-group
- /NXscan/ENTRY-group
- /NXsensor_scan/ENTRY-group
- /NXsnsevent/ENTRY-group
- /NXsnshisto/ENTRY-group
- /NXspe/ENTRY-group
- /NXsqom/ENTRY-group
- /NXstxm/ENTRY-group
- /NXtas/entry-group
- /NXtofnpd/entry-group
- /NXtofraw/entry-group
- /NXtofsingle/entry-group
- /NXtomo/entry-group
- /NXtomophase/entry-group
- /NXtomoproc/entry-group
- /NXtransmission/ENTRY-group
- /NXxas/ENTRY-group
- /NXxasproc/ENTRY-group
- /NXxbase/entry-group
- /NXxeuler/entry-group
- /NXxkappa/entry-group
- /NXxlaue/entry-group
- /NXxlaueplate/entry-group
- /NXxnb/entry-group
- /NXxpcs/entry-group
- /NXxrot/entry-group
- entry_1
- /NXcxi_ptycho/entry_1-group
- entry_identifier
- /NXarchive/entry/entry_identifier-field
- /NXentry/entry_identifier-field
- /NXsnsevent/ENTRY/entry_identifier-field
- /NXsnshisto/ENTRY/entry_identifier-field
- /NXsubentry/entry_identifier-field
- /NXxpcs/entry/entry_identifier-field
- entry_identifier_uuid
- /NXentry/entry_identifier_uuid-field
- /NXxpcs/entry/entry_identifier_uuid-field
- environment
- /NXinstrument/ENVIRONMENT-group
- /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT-group
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT-group
- environment_conditions
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions-group
- erosion_distance
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/erosion_distance-field
- error
- /NXspe/ENTRY/data/error-field
- errors
- /NXdata/errors-field
- evaporation_id_filter
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/evaporation_id_filter-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/evaporation_id_filter-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/evaporation_id_filter-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/evaporation_id_filter-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/evaporation_id_filter-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/evaporation_id_filter-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/evaporation_id_filter-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/evaporation_id_filter-group
- evaporation_id_included
- /NXapm/ENTRY/atom_probe/ion_filtering/evaporation_id_included-field
- even_layer_density
- /NXmirror/even_layer_density-field
- even_layer_material
- /NXmirror/even_layer_material-field
- event_data
- /NXinstrument/EVENT_DATA-group
- /NXsnsevent/ENTRY/EVENT_DATA-group
- event_data_em
- /NXem/ENTRY/measurement/EVENT_DATA_EM-group
- /NXevent_data_em_set/EVENT_DATA_EM-group
- event_id
- /NXevent_data/event_id-field
- event_identifier
- /NXem/ENTRY/measurement/EVENT_DATA_EM/event_identifier-field
- /NXevent_data_em/event_identifier-field
- event_index
- /NXevent_data/event_index-field
- /NXsnsevent/ENTRY/EVENT_DATA/event_index-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
- event_pixel_id
- /NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
- event_time_of_flight
- /NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
- event_time_offset
- /NXevent_data/event_time_offset-field
- event_time_zero
- /NXevent_data/event_time_zero-field
- event_type
- /NXem/ENTRY/measurement/EVENT_DATA_EM/event_type-field
- /NXevent_data_em/event_type-field
- exit_slit
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
- experiment_description
- /NXapm/ENTRY/experiment_description-field
- /NXarchive/entry/experiment_description-field
- /NXellipsometry/ENTRY/experiment_description-field
- /NXem/ENTRY/experiment_description-field
- /NXentry/experiment_description-field
- /NXsensor_scan/ENTRY/experiment_description-field
- /NXsubentry/experiment_description-field
- /NXtransmission/ENTRY/experiment_description-field
- experiment_documentation
- /NXapm/ENTRY/experiment_documentation-group
- /NXem/ENTRY/experiment_documentation-group
- /NXentry/experiment_documentation-group
- /NXsubentry/experiment_documentation-group
- experiment_end_date
- /NXentry/experiment_end_date-field
- experiment_facility
- /NXentry/experiment_facility-field
- experiment_identifier
- /NXapm/ENTRY/experiment_identifier-field
- /NXarchive/entry/experiment_identifier-field
- /NXellipsometry/ENTRY/experiment_identifier-field
- /NXem/ENTRY/experiment_identifier-field
- /NXentry/experiment_identifier-field
- /NXsensor_scan/ENTRY/experiment_identifier-field
- /NXsnsevent/ENTRY/experiment_identifier-field
- /NXsnshisto/ENTRY/experiment_identifier-field
- /NXsubentry/experiment_identifier-field
- /NXtransmission/ENTRY/experiment_identifier-field
- experiment_institution
- /NXentry/experiment_institution-field
- experiment_laboratory
- /NXentry/experiment_laboratory-field
- experiment_location
- /NXentry/experiment_location-field
- experiment_start_date
- /NXentry/experiment_start_date-field
- experiments
- /NXreflections/experiments-field
- extent
- /NXbeam/extent-field
- /NXcg_grid/extent-field
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field
- /NXxpcs/entry/instrument/incident_beam/extent-field
- external
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external-group
- external_adc
- /NXsample/external_ADC-group
- external_dac
- /NXsample/external_DAC-field
- external_field_brief
- /NXsensor/external_field_brief-field
- external_field_full
- /NXsensor/external_field_full-group
- external_material
- /NXguide/external_material-field
- /NXmirror/external_material-field
- extractor_current
- /NXcollectioncolumn/extractor_current-field
- extractor_voltage
- /NXcollectioncolumn/extractor_voltage-field
- fabrication
- /NXaperture_em/FABRICATION-group
- /NXapm/ENTRY/atom_probe/FABRICATION-group
- /NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION-group
- /NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION-group
- /NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION-group
- /NXapm/ENTRY/atom_probe/getter_pump/FABRICATION-group
- /NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION-group
- /NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION-group
- /NXapm/ENTRY/atom_probe/pulser/laser_gun/FABRICATION-group
- /NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION-group
- /NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION-group
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
- /NXchamber/FABRICATION-group
- /NXcorrector_cs/FABRICATION-group
- /NXcs_cpu/FABRICATION-group
- /NXcs_gpu/FABRICATION-group
- /NXcs_io_obj/FABRICATION-group
- /NXebeam_column/FABRICATION-group
- /NXebeam_column/electron_gun/FABRICATION-group
- /NXem/ENTRY/em_lab/DETECTOR/FABRICATION-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/FABRICATION-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/FABRICATION-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/FABRICATION-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_gun/FABRICATION-group
- /NXem/ENTRY/em_lab/FABRICATION-group
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM/FABRICATION-group
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/FABRICATION-group
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/FABRICATION-group
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/FABRICATION-group
- /NXem/ENTRY/em_lab/ebeam_deflector/FABRICATION-group
- /NXem/ENTRY/em_lab/ibeam_deflector/FABRICATION-group
- /NXem/ENTRY/em_lab/stage_lab/FABRICATION-group
- /NXfresnel_zone_plate/fabrication-field
- /NXibeam_column/FABRICATION-group
- /NXlens_em/FABRICATION-group
- /NXpulser_apm/FABRICATION-group
- /NXpulser_apm/laser_gun/FABRICATION-group
- /NXpump/FABRICATION-group
- /NXreflectron/FABRICATION-group
- /NXscanbox_em/FABRICATION-group
- /NXstage_lab/FABRICATION-group
- face_area
- /NXcg_hexahedron_set/face_area-field
- /NXcg_polyhedron_set/face_area-field
- /NXcg_tetrahedron_set/face_area-field
- face_half_edge
- /NXcg_half_edge_data_structure/face_half_edge-field
- face_identifier
- /NXcg_face_list_data_structure/face_identifier-field
- face_identifier_offset
- /NXcg_face_list_data_structure/face_identifier_offset-field
- /NXcg_half_edge_data_structure/face_identifier_offset-field
- face_normal
- /NXcg_hexahedron_set/face_normal-group
- /NXcg_parallelogram_set/face_normal-group
- /NXcg_polygon_set/face_normal-group
- /NXcg_polyhedron_set/face_normal-group
- /NXcg_tetrahedron_set/face_normal-group
- /NXcg_triangle_set/face_normal-group
- faces
- /NXcg_face_list_data_structure/faces-field
- /NXoff_geometry/faces-field
- faces_are_unique
- /NXcg_face_list_data_structure/faces_are_unique-field
- facility_user_id
- /NXarchive/entry/user/facility_user_id-field
- /NXsnsevent/ENTRY/USER/facility_user_id-field
- /NXsnshisto/ENTRY/USER/facility_user_id-field
- /NXuser/facility_user_id-field
- fast_axes
- /NXelectronanalyser/fast_axes-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field
- fast_pixel_direction
- /NXdetector_module/fast_pixel_direction-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
- fax_number
- /NXuser/fax_number-field
- feature_mesh
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh-group
- features
- /NXentry/features-field
- fermi_chopper
- /NXdirecttof/entry/INSTRUMENT/fermi_chopper-group
- /NXinstrument/FERMI_CHOPPER-group
- /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group
- /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
- field_aperture
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
- field_of_view
- /NXapm/ENTRY/atom_probe/field_of_view-field
- /NXoptical_system_em/field_of_view-field
- figure_data
- /NXgrating/figure_data-group
- /NXmirror/figure_data-group
- figure_of_merit
- /NXspindispersion/figure_of_merit-field
- file_name
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/file_name-field
- /NXnote/file_name-field
- filename
- /NXapm_input_ranging/filename-field
- /NXapm_input_reconstruction/filename-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/filename-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/iontypes/filename-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/filename-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes/filename-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/filename-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes/filename-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/filename-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/filename-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/filename-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/filename-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/filename-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/filename-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/filename-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/filename-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/filename-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/filename-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/dataset/filename-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/iontypes/filename-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/dataset/filename-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_edge_distances/filename-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/filename-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/iontypes/filename-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/filename-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontypes/filename-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/filename-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances/filename-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes/filename-field
- /NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/dataset/filename-field
- /NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/iontypes/filename-field
- filenames
- /NXiqproc/ENTRY/reduction/input/filenames-field
- /NXsqom/ENTRY/reduction/input/filenames-field
- filter
- /NXinstrument/FILTER-group
- final_beam_divergence
- /NXbeam/final_beam_divergence-field
- final_energy
- /NXbeam/final_energy-field
- final_polarization
- /NXbeam/final_polarization-field
- final_wavelength
- /NXbeam/final_wavelength-field
- final_wavelength_spread
- /NXbeam/final_wavelength_spread-field
- firmware
- /NXellipsometry/ENTRY/INSTRUMENT/firmware-field
- fit_function
- /NXcalibration/fit_function-field
- fixed_energy
- /NXspe/ENTRY/NXSPE_info/fixed_energy-field
- fixed_revolution
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/fixed_revolution-field
- fixed_slit
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT/fixed_slit-field
- flags
- /NXreflections/flags-field
- flatfield
- /NXdetector/flatfield-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
- flatfield_applied
- /NXdetector/flatfield_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
- flatfield_error
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
- flatfield_errors
- /NXdetector/flatfield_errors-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
- flight_path_length
- /NXapm/ENTRY/atom_probe/flight_path_length-field
- flip_current
- /NXflipper/flip_current-field
- flip_turns
- /NXflipper/flip_turns-field
- flipper
- /NXinstrument/FLIPPER-group
- fluence
- /NXbeam/fluence-field
- fluorescence
- /NXfluo/entry/INSTRUMENT/fluorescence-group
- flux
- /NXbeam/flux-field
- /NXmx/ENTRY/INSTRUMENT/BEAM/flux-field
- /NXsource/flux-field
- flyback_time
- /NXscanbox_em/flyback_time-field
- focal_size
- /NXcapillary/focal_size-field
- focus_parameters
- /NXfresnel_zone_plate/focus_parameters-field
- focus_type
- /NXxraylens/focus_type-field
- focussing_probes
- /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes-field
- frame_average
- /NXxpcs/entry/data/frame_average-field
- frame_start_number
- /NXdetector/frame_start_number-field
- /NXxbase/entry/instrument/detector/frame_start_number-field
- frame_sum
- /NXxpcs/entry/data/frame_sum-field
- frame_time
- /NXdetector/frame_time-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field
- /NXxpcs/entry/instrument/DETECTOR/frame_time-field
- frequency
- /NXcollimator/frequency-field
- /NXsnsevent/ENTRY/instrument/SNS/frequency-field
- /NXsnshisto/ENTRY/instrument/SNS/frequency-field
- /NXsource/frequency-field
- frequency_log
- /NXcollimator/frequency_log-group
- frog_delays
- /NXbeam/frog_delays-field
- frog_frequencies
- /NXbeam/frog_frequencies-field
- frog_trace
- /NXbeam/frog_trace-field
- g2
- /NXxpcs/entry/data/g2-field
- g2_derr
- /NXxpcs/entry/data/g2_derr-field
- g2_err_from_two_time_corr_func
- /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
- g2_err_from_two_time_corr_func_partials
- /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
- g2_from_two_time_corr_func
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
- g2_from_two_time_corr_func_partials
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
- g2_unnormalized
- /NXxpcs/entry/data/G2_unnormalized-field
- gain
- /NXcapillary/gain-group
- /NXtransmission/ENTRY/instrument/DETECTOR/gain-field
- gain_setting
- /NXdetector/gain_setting-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
- gap
- /NXinsertion_device/gap-field
- gas
- /NXsample/gas-field
- /NXxraylens/gas-field
- gas_pressure
- /NXdetector/gas_pressure-field
- /NXmpes/ENTRY/SAMPLE/gas_pressure-field
- /NXsample/gas_pressure-field
- /NXxraylens/gas_pressure-field
- geometry
- /NXaperture/GEOMETRY-group
- /NXbeam_stop/GEOMETRY-group
- /NXbending_magnet/GEOMETRY-group
- /NXcollimator/GEOMETRY-group
- /NXcrystal/GEOMETRY-group
- /NXcsg/geometry-field
- /NXdetector/GEOMETRY-group
- /NXdisk_chopper/GEOMETRY-group
- /NXfermi_chopper/GEOMETRY-group
- /NXfilter/GEOMETRY-group
- /NXguide/GEOMETRY-group
- /NXinsertion_device/GEOMETRY-group
- /NXmirror/GEOMETRY-group
- /NXmoderator/GEOMETRY-group
- /NXmonitor/GEOMETRY-group
- /NXmonochromator/geometry-group
- /NXorientation/GEOMETRY-group
- /NXsample/geometry-group
- /NXsas/ENTRY/instrument/collimator/geometry-group
- /NXsastof/ENTRY/instrument/collimator/geometry-group
- /NXsensor/geometry-group
- /NXsource/geometry-group
- /NXtranslation/geometry-group
- /NXvelocity_selector/geometry-group
- geometry_1
- /NXcxi_ptycho/sample_1/geometry_1-group
- getter_pump
- /NXapm/ENTRY/atom_probe/getter_pump-group
- grating
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING-group
- /NXmonochromator/GRATING-group
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING-group
- grating_wavelength_max
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/grating_wavelength_max-field
- grating_wavelength_min
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/grating_wavelength_min-field
- grid
- /NXcg_isocontour/grid-group
- /NXcg_marching_cubes/grid-group
- /NXdelocalization/grid-field
- grid_type
- /NXimage_set_em_kikuchi/grid_type-field
- gridresolutions
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/gridresolutions-field
- group_index
- /NXdetector_group/group_index-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
- group_name_iontypes
- /NXapm_input_ranging/group_name_iontypes-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/iontypes/group_name_iontypes-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes/group_name_iontypes-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes/group_name_iontypes-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/group_name_iontypes-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/iontypes/group_name_iontypes-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/iontypes/group_name_iontypes-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontypes/group_name_iontypes-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes/group_name_iontypes-field
- group_names
- /NXdetector_group/group_names-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
- group_parent
- /NXdetector_group/group_parent-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
- group_type
- /NXdetector_group/group_type-field
- groupname_object_geometry_data
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/groupname_object_geometry_data-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/groupname_object_geometry_data-field
- groupname_object_property_data
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/groupname_object_property_data-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/groupname_object_property_data-field
- groupname_object_supplementary_data
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/groupname_object_supplementary_data-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/groupname_object_supplementary_data-field
- groupname_proxy_exterior_supplementary_data
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/groupname_proxy_exterior_supplementary_data-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/groupname_proxy_exterior_supplementary_data-field
- groupname_proxy_geometry_data
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/groupname_proxy_geometry_data-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/groupname_proxy_geometry_data-field
- groupname_proxy_interior_supplementary_data
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/groupname_proxy_interior_supplementary_data-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/groupname_proxy_interior_supplementary_data-field
- growth_method
- /NXsample/growth_method-field
- guide
- /NXinstrument/GUIDE-group
- guide_current
- /NXflipper/guide_current-field
- guide_turns
- /NXflipper/guide_turns-field
- h
- /NXreflections/h-field
- half_axes_radii
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
- /NXcg_ellipsoid_set/half_axes_radii-field
- half_axes_radius
- /NXcg_ellipsoid_set/half_axes_radius-field
- half_edge_identifier_offset
- /NXcg_half_edge_data_structure/half_edge_identifier_offset-field
- half_edge_incident_face
- /NXcg_half_edge_data_structure/half_edge_incident_face-field
- half_edge_next
- /NXcg_half_edge_data_structure/half_edge_next-field
- half_edge_prev
- /NXcg_half_edge_data_structure/half_edge_prev-field
- half_edge_twin
- /NXcg_half_edge_data_structure/half_edge_twin-field
- half_edge_vertex_origin
- /NXcg_half_edge_data_structure/half_edge_vertex_origin-field
- harmonic
- /NXinsertion_device/harmonic-field
- has_cell_edge_detection
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_edge_detection-field
- has_cell_geometry
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_geometry-field
- has_cell_neighbors
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_neighbors-field
- has_cell_volume
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_volume-field
- has_closure
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_closure-field
- has_current_to_next_links
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/has_current_to_next_links-field
- has_exterior_facets
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_exterior_facets-field
- has_interior_tetrahedra
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_interior_tetrahedra-field
- has_next_to_current_links
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/has_next_to_current_links-field
- has_object
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object-field
- has_object_auto_proxigram
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_auto_proxigram-field
- has_object_auto_proxigram_edge_contact
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_auto_proxigram_edge_contact-field
- has_object_composition
- /NXapm_paraprobe_config_intersector/ENTRY/has_object_composition-field
- has_object_edge_contact
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_edge_contact-field
- has_object_geometry
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_geometry-field
- has_object_ions
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_ions-field
- has_object_obb
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_obb-field
- has_object_properties
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_properties-field
- has_object_volume
- /NXapm_paraprobe_config_intersector/ENTRY/has_object_volume-field
- has_proxy
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy-field
- has_proxy_edge_contact
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_edge_contact-field
- has_proxy_geometry
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_geometry-field
- has_proxy_ions
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_ions-field
- has_proxy_obb
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_obb-field
- has_proxy_properties
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_properties-field
- has_scalar_fields
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/has_scalar_fields-field
- has_triangle_soup
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_triangle_soup-field
- heater_power
- /NXmanipulator/heater_power-field
- height
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_CYLINDER_SET/height-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/height-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_CYLINDER_SET/height-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_CYLINDER_SET/height-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
- /NXcg_cylinder_set/height-field
- /NXcg_hexahedron_set/height-field
- /NXfermi_chopper/height-field
- /NXvelocity_selector/height-field
- hexahedra
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
- /NXcg_hexahedron_set/hexahedra-group
- hexahedron
- /NXcg_hexahedron_set/hexahedron-group
- hexahedron_half_edge
- /NXcg_hexahedron_set/hexahedron_half_edge-group
- high_trip_value
- /NXsensor/high_trip_value-field
- histogram_min_incr_max
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/statistics/knn/histogram_min_incr_max-field
- hit_multiplicity
- /NXapm/ENTRY/atom_probe/hit_multiplicity-group
- /NXapm/ENTRY/atom_probe/hit_multiplicity/hit_multiplicity-field
- hit_multiplicity_filter
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/hit_multiplicity_filter-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hit_multiplicity_filter-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/hit_multiplicity_filter-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/hit_multiplicity_filter-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/hit_multiplicity_filter-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/hit_multiplicity_filter-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/hit_multiplicity_filter-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/hit_multiplicity_filter-group
- hit_positions
- /NXapm/ENTRY/atom_probe/ion_impact_positions/hit_positions-field
- hit_rate
- /NXimage_set_em_kikuchi/profiling/hit_rate-field
- holder
- /NXsnsevent/ENTRY/sample/holder-field
- /NXsnshisto/ENTRY/sample/holder-field
- hough_transformation
- /NXimage_set_em_kikuchi/hough_transformation-group
- i
- /NXcanSAS/ENTRY/DATA/I-field
- ibeam_column
- /NXem/ENTRY/em_lab/IBEAM_COLUMN-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN-group
- /NXevent_data_em/em_lab/IBEAM_COLUMN-group
- ibeam_deflector
- /NXem/ENTRY/em_lab/ibeam_deflector-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/ibeam_deflector-group
- /NXevent_data_em/em_lab/ibeam_deflector-group
- id
- /NXreflections/id-field
- identifier
- /NXapm/ENTRY/atom_probe/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/getter_pump/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/pulser/laser_gun/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION/identifier-field
- /NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION/identifier-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/current_set/identifier-field
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set/identifier-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
- /NXcg_cylinder_set/identifier-field
- /NXcg_ellipsoid_set/identifier-field
- /NXcg_grid/identifier-field
- /NXcg_hexahedron_set/identifier-field
- /NXcg_parallelogram_set/identifier-field
- /NXcg_point_set/identifier-field
- /NXcg_polygon_set/identifier-field
- /NXcg_polyhedron_set/identifier-field
- /NXcg_polyline_set/identifier-field
- /NXcg_sphere_set/identifier-field
- /NXcg_tetrahedron_set/identifier-field
- /NXcg_triangle_set/identifier-field
- /NXcs_filter_boolean_mask/identifier-field
- /NXem/ENTRY/em_lab/DETECTOR/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_gun/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/ebeam_deflector/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/ibeam_deflector/FABRICATION/identifier-field
- /NXem/ENTRY/em_lab/stage_lab/FABRICATION/identifier-field
- /NXfabrication/identifier-field
- /NXgraph_edge_set/identifier-field
- /NXgraph_node_set/identifier-field
- /NXms_crystal_set/identifier-field
- /NXorientation_set/identifier-field
- /NXsnsevent/ENTRY/sample/identifier-field
- /NXsnshisto/ENTRY/sample/identifier-field
- /NXtransmission/ENTRY/acquisition_program/identifier-field
- identifier_offset
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
- /NXcg_cylinder_set/identifier_offset-field
- /NXcg_ellipsoid_set/identifier_offset-field
- /NXcg_grid/identifier_offset-field
- /NXcg_hexahedron_set/identifier_offset-field
- /NXcg_parallelogram_set/identifier_offset-field
- /NXcg_point_set/identifier_offset-field
- /NXcg_polygon_set/identifier_offset-field
- /NXcg_polyhedron_set/identifier_offset-field
- /NXcg_polyline_set/identifier_offset-field
- /NXcg_sphere_set/identifier_offset-field
- /NXcg_tetrahedron_set/identifier_offset-field
- /NXcg_triangle_set/identifier_offset-field
- /NXclustering/identifier_offset-field
- /NXgraph_edge_set/identifier_offset-field
- /NXgraph_node_set/identifier_offset-field
- /NXms_crystal_set/identifier_offset-field
- /NXms_snapshot_set/identifier_offset-field
- /NXorientation_set/identifier_offset-field
- idev
- /NXcanSAS/ENTRY/DATA/Idev-field
- image_id
- /NXimage_set_em_adf/stack/image_id-field
- /NXimage_set_em_kikuchi/DATA/image_id-field
- /NXimage_set_em_se/DATA/image_id-field
- image_key
- /NXdetector/image_key-field
- /NXtomo/entry/data/image_key-link
- /NXtomo/entry/instrument/detector/image_key-field
- image_set_em_adf
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_ADF-group
- /NXevent_data_em/IMAGE_SET_EM_ADF-group
- image_set_em_bf
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_BF-group
- /NXevent_data_em/IMAGE_SET_EM_BF-group
- image_set_em_bse
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_BSE-group
- /NXevent_data_em/IMAGE_SET_EM_BSE-group
- image_set_em_chamber
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_CHAMBER-group
- /NXevent_data_em/IMAGE_SET_EM_CHAMBER-group
- image_set_em_df
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_DF-group
- /NXevent_data_em/IMAGE_SET_EM_DF-group
- image_set_em_diffrac
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_DIFFRAC-group
- /NXevent_data_em/IMAGE_SET_EM_DIFFRAC-group
- image_set_em_ecci
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_ECCI-group
- /NXevent_data_em/IMAGE_SET_EM_ECCI-group
- image_set_em_kikuchi
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_KIKUCHI-group
- /NXevent_data_em/IMAGE_SET_EM_KIKUCHI-group
- image_set_em_ronchigram
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_RONCHIGRAM-group
- /NXevent_data_em/IMAGE_SET_EM_RONCHIGRAM-group
- image_set_em_se
- /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_SE-group
- /NXevent_data_em/IMAGE_SET_EM_SE-group
- implementation
- /NXcg_marching_cubes/implementation-field
- incident_angle
- /NXguide/incident_angle-field
- /NXmirror/incident_angle-field
- incident_beam
- /NXxpcs/entry/instrument/incident_beam-group
- incident_beam_divergence
- /NXbeam/incident_beam_divergence-field
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence-field
- incident_beam_energy
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy-field
- incident_beam_size
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_beam_size-field
- incident_energy
- /NXbeam/incident_energy-field
- /NXmpes/ENTRY/INSTRUMENT/BEAM/incident_energy-field
- /NXxpcs/entry/instrument/incident_beam/incident_energy-field
- incident_energy_spread
- /NXbeam/incident_energy_spread-field
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread-field
- /NXmpes/ENTRY/INSTRUMENT/BEAM/incident_energy_spread-field
- /NXxpcs/entry/instrument/incident_beam/incident_energy_spread-field
- incident_energy_weights
- /NXbeam/incident_energy_weights-field
- incident_polarisation_stokes
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarisation_stokes-field
- incident_polarization
- /NXbeam/incident_polarization-field
- /NXmpes/ENTRY/INSTRUMENT/BEAM/incident_polarization-field
- incident_polarization_type
- /NXxpcs/entry/instrument/incident_beam/incident_polarization_type-field
- incident_wavelength
- /NXbeam/incident_wavelength-field
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength-field
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength-field
- incident_wavelength_spectrum
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spectrum-group
- incident_wavelength_spread
- /NXbeam/incident_wavelength_spread-field
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength_spread-field
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spread-field
- incident_wavelength_weight
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weight-field
- incident_wavelength_weights
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weights-field
- incoming_beam
- /NXxas/ENTRY/INSTRUMENT/incoming_beam-group
- independent_controllers
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/independent_controllers-field
- indexing
- /NXimage_set_em_kikuchi/oim/indexing-group
- /NXspectrum_set_em_xray/indexing-group
- initial_radius
- /NXapm/ENTRY/atom_probe/specimen_monitoring/initial_radius-field
- initialization
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/initialization-field
- input
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/input-field
- /NXdetector/input-field
- /NXiqproc/ENTRY/reduction/input-group
- /NXsqom/ENTRY/reduction/input-group
- insertion_device
- /NXinstrument/INSERTION_DEVICE-group
- instrument
- /NXarchive/entry/instrument-group
- /NXarpes/ENTRY/INSTRUMENT-group
- /NXcanSAS/ENTRY/INSTRUMENT-group
- /NXdirecttof/entry/INSTRUMENT-group
- /NXellipsometry/ENTRY/INSTRUMENT-group
- /NXentry/INSTRUMENT-group
- /NXfluo/entry/INSTRUMENT-group
- /NXindirecttof/entry/INSTRUMENT-group
- /NXiqproc/ENTRY/instrument-group
- /NXiv_temp/ENTRY/INSTRUMENT-group
- /NXlauetof/entry/instrument-group
- /NXmonopd/entry/INSTRUMENT-group
- /NXmpes/ENTRY/INSTRUMENT-group
- /NXmx/ENTRY/INSTRUMENT-group
- /NXrefscan/entry/instrument-group
- /NXreftof/entry/instrument-group
- /NXsas/ENTRY/instrument-group
- /NXsastof/ENTRY/instrument-group
- /NXscan/ENTRY/INSTRUMENT-group
- /NXsensor_scan/ENTRY/INSTRUMENT-group
- /NXsnsevent/ENTRY/instrument-group
- /NXsnshisto/ENTRY/instrument-group
- /NXspe/ENTRY/INSTRUMENT-group
- /NXsqom/ENTRY/instrument-group
- /NXstxm/ENTRY/INSTRUMENT-group
- /NXsubentry/INSTRUMENT-group
- /NXtas/entry/INSTRUMENT-group
- /NXtofnpd/entry/INSTRUMENT-group
- /NXtofraw/entry/instrument-group
- /NXtofsingle/entry/INSTRUMENT-group
- /NXtomo/entry/instrument-group
- /NXtomophase/entry/instrument-group
- /NXtomoproc/entry/INSTRUMENT-group
- /NXtransmission/ENTRY/instrument-group
- /NXxas/ENTRY/INSTRUMENT-group
- /NXxbase/entry/instrument-group
- /NXxeuler/entry/instrument-group
- /NXxkappa/entry/instrument-group
- /NXxlaue/entry/instrument-group
- /NXxlaueplate/entry/instrument-group
- /NXxnb/entry/instrument-group
- /NXxpcs/entry/instrument-group
- /NXxrot/entry/instrument-group
- instrument_1
- /NXcxi_ptycho/entry_1/instrument_1-group
- instrument_name
- /NXapm/ENTRY/atom_probe/instrument_name-field
- /NXem/ENTRY/em_lab/instrument_name-field
- int_prf
- /NXreflections/int_prf-field
- int_prf_errors
- /NXreflections/int_prf_errors-field
- int_prf_var
- /NXreflections/int_prf_var-field
- int_sum
- /NXreflections/int_sum-field
- int_sum_errors
- /NXreflections/int_sum_errors-field
- int_sum_var
- /NXreflections/int_sum_var-field
- integral
- /NXmonitor/integral-field
- /NXmonopd/entry/MONITOR/integral-field
- /NXreftof/entry/control/integral-field
- /NXsas/ENTRY/control/integral-field
- /NXtomophase/entry/control/integral-field
- /NXxbase/entry/control/integral-field
- integral_counts
- /NXtofraw/entry/MONITOR/integral_counts-field
- integral_log
- /NXmonitor/integral_log-group
- intensity
- /NXimage_set_em_adf/stack/intensity-field
- /NXimage_set_em_kikuchi/DATA/intensity-field
- /NXimage_set_em_se/DATA/intensity-field
- /NXpeak/intensity-field
- intensity_threshold
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/intensity_threshold-field
- interaction_vol_em
- /NXem/ENTRY/measurement/EVENT_DATA_EM/INTERACTION_VOL_EM-group
- /NXevent_data_em/INTERACTION_VOL_EM-group
- interface_meshing
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing-group
- interface_model
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/interface_model-field
- interfacial_excess
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess-group
- interior_angle
- /NXcg_polygon_set/interior_angle-field
- /NXcg_triangle_set/interior_angle-field
- interior_atmosphere
- /NXgrating/interior_atmosphere-field
- /NXguide/interior_atmosphere-field
- /NXmirror/interior_atmosphere-field
- interior_cells
- /NXcg_alpha_shape/interior_cells-group
- intersection_detection_method
- /NXapm_paraprobe_config_intersector/ENTRY/intersection_detection_method-field
- ion
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION-group
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/use_existent_ranging/ION-group
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION-group
- /NXspectrum_set_em_xray/indexing/PEAK/ION-group
- ion_detector
- /NXapm/ENTRY/atom_probe/ion_detector-group
- ion_energy_profile
- /NXibeam_column/ion_gun/ion_energy_profile-field
- ion_filtering
- /NXapm/ENTRY/atom_probe/ion_filtering-group
- ion_gun
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_gun-group
- /NXibeam_column/ion_gun-group
- ion_impact_positions
- /NXapm/ENTRY/atom_probe/ion_impact_positions-group
- ion_position_filename
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/ion_position_filename-field
- ion_query_isotope_vector_source
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/ion_query_isotope_vector_source-field
- ion_query_isotope_vector_target
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/ion_query_isotope_vector_target-field
- ion_query_type_source
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/ion_query_type_source-field
- ion_query_type_target
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/ion_query_type_target-field
- ion_to_edge_distances
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_edge_distances-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances-group
- ion_to_feature_distances
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances-group
- ion_type
- /NXion/ion_type-field
- iontype_filter
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/iontype_filter-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontype_filter-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontype_filter-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/iontype_filter-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/iontype_filter-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontype_filter-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontype_filter-group
- iontypes
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/iontypes-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/iontypes-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/iontypes-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontypes-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes-group
- /NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/iontypes-group
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/use_existent_ranging/iontypes-field
- is_a
- /NXgraph_edge_set/is_a-field
- /NXgraph_node_set/is_a-field
- is_axis_aligned
- /NXcg_hexahedron_set/is_axis_aligned-field
- /NXcg_parallelogram_set/is_axis_aligned-field
- is_box
- /NXcg_hexahedron_set/is_box-field
- is_closed
- /NXcg_ellipsoid_set/is_closed-field
- /NXcg_polyline_set/is_closed-field
- /NXcg_sphere_set/is_closed-field
- is_cylindrical
- /NXcrystal/is_cylindrical-field
- is_specific
- /NXslip_system_set/is_specific-field
- isosurfacing
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing-group
- isotope_names
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/probe/isotope_names-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_gun/probe/isotope_names-field
- isotope_vector
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/isotope_vector-field
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/use_existent_ranging/ION/isotope_vector-field
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/isotope_vector-field
- /NXion/isotope_vector-field
- isotope_vector_matrix
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/isotope_vector_matrix-field
- isotope_whitelist
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isotope_whitelist-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/isotope_whitelist-field
- /NXdelocalization/isotope_whitelist-field
- isovalue
- /NXcg_isocontour/isovalue-field
- iteration
- /NXms_snapshot/iteration-field
- iupac_line_names
- /NXspectrum_set_em_xray/indexing/PEAK/ION/iupac_line_names-field
- k
- /NXinsertion_device/k-field
- /NXreflections/k-field
- k_d_value
- /NXpid/K_d_value-field
- k_i_value
- /NXpid/K_i_value-field
- k_p_value
- /NXpid/K_p_value-field
- kappa
- /NXxkappa/entry/name/kappa-link
- /NXxkappa/entry/sample/kappa-field
- kernel_size
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/kernel_size-field
- kernel_variance
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/kernel_variance-field
- ki_over_kf_scaling
- /NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
- knn
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/statistics/knn-group
- l
- /NXreflections/l-field
- label
- /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PEAK/label-field
- /NXgraph_edge_set/label-field
- /NXgraph_node_set/label-field
- /NXpeak/label-field
- lambda
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
- laser_beam
- /NXapm/ENTRY/atom_probe/pulser/laser_beam-group
- /NXpulser_apm/laser_beam-group
- laser_gun
- /NXapm/ENTRY/atom_probe/pulser/laser_gun-group
- /NXpulser_apm/laser_gun-group
- last_fill
- /NXsource/last_fill-field
- last_process
- /NXcalibration/last_process-field
- /NXdistortion/last_process-field
- /NXregistration/last_process-field
- lateral_surface_area
- /NXcg_cylinder_set/lateral_surface_area-field
- lattice_type
- /NXslip_system_set/lattice_type-field
- laue_group
- /NXimage_set_em_kikuchi/oim/indexing/reflector/laue_group-field
- layer
- /NXsample/layer-field
- layer_structure
- /NXellipsometry/ENTRY/SAMPLE/layer_structure-field
- layer_thickness
- /NXgrating/layer_thickness-field
- /NXmirror/layer_thickness-field
- layout
- /NXdetector/layout-field
- length
- /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field
- /NXcg_hexahedron_set/length-field
- /NXcg_parallelogram_set/length-field
- /NXcg_polyline_set/length-field
- /NXinsertion_device/length-field
- /NXvelocity_selector/length-field
- lens_em
- /NXcollectioncolumn/LENS_EM-group
- /NXcorrector_cs/LENS_EM-group
- /NXebeam_column/LENS_EM-group
- /NXelectronanalyser/LENS_EM-group
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM-group
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/LENS_EM-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/LENS_EM-group
- /NXenergydispersion/LENS_EM-group
- /NXibeam_column/LENS_EM-group
- /NXspindispersion/LENS_EM-group
- lens_geometry
- /NXxraylens/lens_geometry-field
- lens_length
- /NXxraylens/lens_length-field
- lens_material
- /NXxraylens/lens_material-field
- lens_mode
- /NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field
- lens_thickness
- /NXxraylens/lens_thickness-field
- light_source
- /NXellipsometry/ENTRY/INSTRUMENT/light_source-group
- line_time
- /NXscanbox_em/line_time-field
- linear_range_min_incr_max
- /NXsubsampling_filter/linear_range_min_incr_max-field
- load_lock_chamber
- /NXapm/ENTRY/atom_probe/control_software/load_lock_chamber-group
- /NXapm/ENTRY/atom_probe/load_lock_chamber-group
- local_electrode
- /NXapm/ENTRY/atom_probe/local_electrode-group
- local_name
- /NXdetector/local_name-field
- location
- /NXapm/ENTRY/atom_probe/location-field
- /NXem/ENTRY/em_lab/location-field
- log
- /NXsnsevent/ENTRY/DASlogs/LOG-group
- /NXsnshisto/ENTRY/DASlogs/LOG-group
- low_trip_value
- /NXsensor/low_trip_value-field
- lower_cap_radius
- /NXcg_cylinder_set/lower_cap_radius-field
- lp
- /NXreflections/lp-field
- m_value
- /NXfilter/m_value-field
- /NXguide/m_value-field
- /NXmirror/m_value-field
- magnetic_field
- /NXarchive/entry/sample/magnetic_field-field
- /NXbending_magnet/magnetic_field-field
- /NXsample/magnetic_field-field
- /NXsample/magnetic_field-group
- magnetic_field_env
- /NXsample/magnetic_field_env-group
- magnetic_field_log
- /NXsample/magnetic_field_log-group
- magnetic_wavelength
- /NXinsertion_device/magnetic_wavelength-field
- magnification
- /NXcollectioncolumn/magnification-field
- /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/magnification-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/magnification-field
- /NXoptical_system_em/magnification-field
- manipulator
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR-group
- manufacturer
- /NXcapillary/manufacturer-field
- /NXtransmission/ENTRY/instrument/manufacturer-group
- manufacturer_model
- /NXdeflector/manufacturer_model-field
- manufacturer_name
- /NXapm/ENTRY/atom_probe/ion_detector/manufacturer_name-field
- /NXdeflector/manufacturer_name-field
- /NXlens_em/manufacturer_name-field
- mapping_dictionary_keyword
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/mapping_dictionary_keyword-field
- mapping_dictionary_value
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/mapping_dictionary_value-field
- mark
- /NXdelocalization/mark-field
- mask
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
- /NXcs_filter_boolean_mask/mask-field
- mask_material
- /NXfresnel_zone_plate/mask_material-field
- mask_thickness
- /NXfresnel_zone_plate/mask_thickness-field
- masks
- /NXxpcs/entry/instrument/masks-group
- mass
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/mass-field
- /NXsample/mass-field
- /NXsample_component/mass-field
- mass_spectrum
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group
- mass_to_charge
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
- mass_to_charge_conversion
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/mass_to_charge_conversion-group
- mass_to_charge_distribution
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group
- mass_to_charge_interval
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/mass_to_charge_interval-field
- mass_to_charge_range
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/use_existent_ranging/ION/mass_to_charge_range-field
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
- /NXion/mass_to_charge_range-field
- mass_to_charge_state_ratio
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/mass_to_charge_state_ratio-field
- match
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter/match-field
- /NXmatch_filter/match-field
- material
- /NXaperture/material-field
- /NXellipsometry/ENTRY/INSTRUMENT/window/material-field
- max_gap
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT/max_gap-field
- max_physical_capacity
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
- /NXcs_io_obj/max_physical_capacity-field
- max_resident_memory_snapshot
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
- /NXcs_profiling_event/max_resident_memory_snapshot-field
- max_virtual_memory_snapshot
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
- /NXcs_profiling_event/max_virtual_memory_snapshot-field
- maximum_charge
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/maximum_charge-field
- maximum_incident_angle
- /NXcapillary/maximum_incident_angle-field
- maximum_number_of_atoms_per_molecular_ion
- /NXapm/ENTRY/atom_probe/ranging/maximum_number_of_atoms_per_molecular_ion-field
- maximum_number_of_isotopes
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/maximum_number_of_isotopes-field
- maximum_value
- /NXlog/maximum_value-field
- /NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field
- /NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
- mean_angular_deviation
- /NXimage_set_em_kikuchi/oim/indexing/mean_angular_deviation-field
- measured_data
- /NXellipsometry/ENTRY/SAMPLE/measured_data-field
- /NXtransmission/ENTRY/instrument/measured_data-field
- measurement
- /NXem/ENTRY/measurement-group
- /NXsensor/measurement-field
- measurement_sensors
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/measurement_sensors-field
- medium
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/medium-field
- medium_refractive_indices
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/medium_refractive_indices-field
- method
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/method-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/method-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter/method-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/method-field
- /NXem/ENTRY/sample/method-field
- /NXmatch_filter/method-field
- miller_direction
- /NXslip_system_set/miller_direction-field
- miller_indices
- /NXimage_set_em_kikuchi/oim/indexing/reflector/miller_indices-field
- miller_plane
- /NXslip_system_set/miller_plane-field
- min_bands
- /NXimage_set_em_kikuchi/oim/indexing/min_bands-field
- min_intensity
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/min_intensity-field
- minimum_value
- /NXlog/minimum_value-field
- /NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field
- /NXsnshisto/ENTRY/DASlogs/LOG/minimum_value-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/minimum_value-field
- mirror
- /NXinstrument/MIRROR-group
- mode
- /NXcg_alpha_shape/mode-field
- /NXcollectioncolumn/mode-field
- /NXfluo/entry/MONITOR/mode-field
- /NXimage_set_em_kikuchi/binning/mode-field
- /NXimage_set_em_kikuchi/oim/band_detection/mode-field
- /NXimage_set_em_kikuchi/oim/indexing/mode-field
- /NXlauetof/entry/control/mode-field
- /NXmonitor/mode-field
- /NXmonopd/entry/MONITOR/mode-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/mode-field
- /NXrefscan/entry/control/mode-field
- /NXreftof/entry/control/mode-field
- /NXsas/ENTRY/control/mode-field
- /NXsastof/ENTRY/control/mode-field
- /NXsnsevent/ENTRY/MONITOR/mode-field
- /NXsnshisto/ENTRY/MONITOR/mode-field
- /NXsource/mode-field
- /NXtas/entry/MONITOR/mode-field
- /NXtofnpd/entry/MONITOR/mode-field
- /NXtofraw/entry/MONITOR/mode-field
- /NXtofsingle/entry/MONITOR/mode-field
- /NXxas/ENTRY/MONITOR/mode-field
- /NXxbase/entry/control/mode-field
- model
- /NXapm/ENTRY/atom_probe/ion_detector/model-field
- /NXellipsometry/ENTRY/INSTRUMENT/model-field
- /NXfabrication/model-field
- /NXlens_em/model-field
- /NXsensor/model-field
- /NXtransmission/ENTRY/acquisition_program/model-field
- moderator
- /NXinstrument/MODERATOR-group
- /NXsnsevent/ENTRY/instrument/moderator-group
- /NXsnshisto/ENTRY/instrument/moderator-group
- module_offset
- /NXdetector_module/module_offset-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset-field
- molecular_ion_search
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search-group
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search-group
- momentum_calibration
- /NXmpes/ENTRY/PROCESS/momentum_calibration-group
- momentum_resolution
- /NXelectronanalyser/momentum_resolution-field
- /NXinstrument/momentum_resolution-field
- monitor
- /NXapm/ENTRY/MONITOR-group
- /NXcxi_ptycho/entry_1/instrument_1/MONITOR-group
- /NXem/ENTRY/MONITOR-group
- /NXentry/MONITOR-group
- /NXfluo/entry/MONITOR-group
- /NXmonopd/entry/MONITOR-group
- /NXscan/ENTRY/MONITOR-group
- /NXsnsevent/ENTRY/MONITOR-group
- /NXsnshisto/ENTRY/MONITOR-group
- /NXsubentry/MONITOR-group
- /NXtas/entry/MONITOR-group
- /NXtofnpd/entry/MONITOR-group
- /NXtofraw/entry/MONITOR-group
- /NXtofsingle/entry/MONITOR-group
- /NXxas/ENTRY/MONITOR-group
- monochromator
- /NXarpes/ENTRY/INSTRUMENT/monochromator-group
- /NXfluo/entry/INSTRUMENT/monochromator-group
- /NXinstrument/MONOCHROMATOR-group
- /NXrefscan/entry/instrument/monochromator-group
- /NXsas/ENTRY/instrument/monochromator-group
- /NXstxm/ENTRY/INSTRUMENT/monochromator-group
- /NXtas/entry/INSTRUMENT/monochromator-group
- /NXxas/ENTRY/INSTRUMENT/monochromator-group
- /NXxbase/entry/instrument/monochromator-group
- mosaic_horizontal
- /NXcrystal/mosaic_horizontal-field
- mosaic_vertical
- /NXcrystal/mosaic_vertical-field
- ms_snapshot
- /NXms_snapshot_set/MS_SNAPSHOT-group
- naive_point_cloud_density_map
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map-group
- name
- /NXaperture_em/name-field
- /NXapm/ENTRY/USER/name-field
- /NXapm/ENTRY/atom_probe/REFLECTRON/name-field
- /NXapm/ENTRY/atom_probe/analysis_chamber/name-field
- /NXapm/ENTRY/atom_probe/buffer_chamber/name-field
- /NXapm/ENTRY/atom_probe/ion_detector/name-field
- /NXapm/ENTRY/atom_probe/load_lock_chamber/name-field
- /NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/name-field
- /NXapm/ENTRY/atom_probe/local_electrode/name-field
- /NXapm/ENTRY/atom_probe/pulser/laser_gun/name-field
- /NXapm/ENTRY/specimen/name-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/name-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/name-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU/name-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/name-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/name-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/name-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU/name-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU/name-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/name-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/name-field
- /NXarchive/entry/instrument/SOURCE/name-field
- /NXarchive/entry/instrument/name-field
- /NXarchive/entry/sample/name-field
- /NXarchive/entry/user/name-field
- /NXarpes/ENTRY/INSTRUMENT/SOURCE/name-field
- /NXarpes/ENTRY/SAMPLE/name-field
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/name-field
- /NXcanSAS/ENTRY/PROCESS/name-field
- /NXcanSAS/ENTRY/SAMPLE/name-field
- /NXchamber/name-field
- /NXcontainer/name-field
- /NXcorrector_cs/name-field
- /NXcs_computer/name-field
- /NXcs_cpu/name-field
- /NXcs_gpu/name-field
- /NXcs_io_obj/name-field
- /NXcxi_ptycho/entry_1/instrument_1/source_1/name-field
- /NXcxi_ptycho/sample_1/name-field
- /NXdeflector/name-field
- /NXebeam_column/electron_gun/name-field
- /NXelectronanalyser/name-field
- /NXellipsometry/ENTRY/USER/name-field
- /NXem/ENTRY/USER/name-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/name-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/name-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_gun/name-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/name-field
- /NXem/ENTRY/em_lab/stage_lab/name-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/USER/name-field
- /NXem/ENTRY/sample/name-field
- /NXenvironment/name-field
- /NXfluo/entry/INSTRUMENT/SOURCE/name-field
- /NXfluo/entry/SAMPLE/name-field
- /NXibeam_column/ion_gun/name-field
- /NXinstrument/name-field
- /NXion/name-field
- /NXiqproc/ENTRY/SAMPLE/name-field
- /NXiqproc/ENTRY/instrument/SOURCE/name-field
- /NXiqproc/ENTRY/instrument/name-field
- /NXlauetof/entry/name-group
- /NXlauetof/entry/sample/name-field
- /NXlens_em/name-field
- /NXmanipulator/name-field
- /NXmonopd/entry/INSTRUMENT/SOURCE/name-field
- /NXmonopd/entry/SAMPLE/name-field
- /NXmpes/ENTRY/INSTRUMENT/SOURCE/name-field
- /NXmpes/ENTRY/SAMPLE/name-field
- /NXmpes/ENTRY/USER/name-field
- /NXmx/ENTRY/INSTRUMENT/name-field
- /NXmx/ENTRY/SAMPLE/name-field
- /NXmx/ENTRY/SOURCE/name-field
- /NXpositioner/name-field
- /NXpulser_apm/laser_gun/name-field
- /NXreflectron/name-field
- /NXrefscan/entry/instrument/SOURCE/name-field
- /NXrefscan/entry/sample/name-field
- /NXreftof/entry/instrument/name-field
- /NXreftof/entry/sample/name-field
- /NXsample/name-field
- /NXsample_component/name-field
- /NXsas/ENTRY/instrument/name-field
- /NXsas/ENTRY/instrument/source/name-field
- /NXsas/ENTRY/sample/name-field
- /NXsastof/ENTRY/instrument/name-field
- /NXsastof/ENTRY/instrument/source/name-field
- /NXsastof/ENTRY/sample/name-field
- /NXsensor/name-field
- /NXsensor_scan/ENTRY/SAMPLE/name-field
- /NXsensor_scan/ENTRY/USER/name-field
- /NXsnsevent/ENTRY/USER/name-field
- /NXsnsevent/ENTRY/instrument/SNS/name-field
- /NXsnsevent/ENTRY/instrument/name-field
- /NXsnsevent/ENTRY/sample/name-field
- /NXsnshisto/ENTRY/USER/name-field
- /NXsnshisto/ENTRY/instrument/SNS/name-field
- /NXsnshisto/ENTRY/instrument/name-field
- /NXsnshisto/ENTRY/sample/name-field
- /NXsource/name-field
- /NXspe/ENTRY/INSTRUMENT/name-field
- /NXspectrum_set_em_xray/indexing/composition_map/name-field
- /NXsqom/ENTRY/SAMPLE/name-field
- /NXsqom/ENTRY/instrument/SOURCE/name-field
- /NXsqom/ENTRY/instrument/name-field
- /NXstage_lab/name-field
- /NXstxm/ENTRY/INSTRUMENT/SOURCE/name-field
- /NXtas/entry/INSTRUMENT/SOURCE/name-field
- /NXtas/entry/SAMPLE/name-field
- /NXtofnpd/entry/SAMPLE/name-field
- /NXtofnpd/entry/user/name-field
- /NXtofraw/entry/SAMPLE/name-field
- /NXtofraw/entry/user/name-field
- /NXtofsingle/entry/SAMPLE/name-field
- /NXtofsingle/entry/user/name-field
- /NXtomo/entry/instrument/SOURCE/name-field
- /NXtomo/entry/sample/name-field
- /NXtomophase/entry/instrument/SOURCE/name-field
- /NXtomophase/entry/sample/name-field
- /NXtomoproc/entry/INSTRUMENT/SOURCE/name-field
- /NXtomoproc/entry/SAMPLE/name-field
- /NXtransmission/ENTRY/SAMPLE/name-field
- /NXtransmission/ENTRY/operator/name-field
- /NXuser/name-field
- /NXxas/ENTRY/INSTRUMENT/SOURCE/name-field
- /NXxas/ENTRY/SAMPLE/name-field
- /NXxasproc/ENTRY/SAMPLE/name-field
- /NXxbase/entry/instrument/source/name-field
- /NXxbase/entry/sample/name-field
- /NXxeuler/entry/name-group
- /NXxkappa/entry/name-group
- /NXxnb/entry/name-group
- /NXxrot/entry/name-group
- natural_abundance_product
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/natural_abundance_product-field
- nature
- /NXsnsevent/ENTRY/sample/nature-field
- /NXsnshisto/ENTRY/sample/nature-field
- /NXtofraw/entry/SAMPLE/nature-field
- /NXtofsingle/entry/SAMPLE/nature-field
- next_set
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/next_set-group
- node_pair
- /NXgraph_edge_set/node_pair-field
- nodes
- /NXgraph_root/nodes-group
- noise
- /NXclustering/noise-field
- nominal
- /NXmonitor/nominal-field
- normalization
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/normalization-field
- normals
- /NXcg_unit_normal_set/normals-field
- note
- /NXaperture/NOTE-group
- /NXcanSAS/ENTRY/PROCESS/NOTE-group
- /NXenvironment/NOTE-group
- /NXprocess/NOTE-group
- /NXxpcs/entry/NOTE-group
- notes
- /NXentry/notes-group
- /NXsample/notes-group
- /NXsnsevent/ENTRY/notes-field
- /NXsnshisto/ENTRY/notes-field
- /NXsource/notes-group
- /NXsubentry/notes-group
- nth
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/statistics/knn/nth-field
- nuclid_list
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/nuclid_list-field
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/use_existent_ranging/ION/nuclid_list-field
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/nuclid_list-field
- /NXion/nuclid_list-field
- num
- /NXvelocity_selector/num-field
- number
- /NXfermi_chopper/number-field
- number_of_boundaries
- /NXcg_grid/number_of_boundaries-field
- number_of_bunches
- /NXsource/number_of_bunches-field
- number_of_categorical_labels
- /NXclustering/number_of_categorical_labels-field
- number_of_cluster
- /NXclustering/number_of_cluster-field
- number_of_cycles
- /NXdetector/number_of_cycles-field
- number_of_delocalizations
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/number_of_delocalizations-field
- number_of_disjoint_nuclids
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/number_of_disjoint_nuclids-field
- number_of_edges
- /NXcg_face_list_data_structure/number_of_edges-field
- /NXcg_polyhedron_set/number_of_edges-field
- /NXgraph_edge_set/number_of_edges-field
- number_of_faces
- /NXcg_face_list_data_structure/number_of_faces-field
- /NXcg_half_edge_data_structure/number_of_faces-field
- /NXcg_polyhedron_set/number_of_faces-field
- number_of_files
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/number_of_files-field
- number_of_frames_averaged
- /NXimage_set_em_se/number_of_frames_averaged-field
- number_of_gpus
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/number_of_gpus-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/number_of_gpus-field
- /NXcs_profiling/number_of_gpus-field
- /NXcs_profiling_event/number_of_gpus-field
- number_of_half_edges
- /NXcg_half_edge_data_structure/number_of_half_edges-field
- number_of_ion_search_processes
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/number_of_ion_search_processes-field
- number_of_ion_types
- /NXapm/ENTRY/atom_probe/ranging/number_of_ion_types-field
- number_of_iterations
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/number_of_iterations-field
- number_of_lenses
- /NXxraylens/number_of_lenses-field
- number_of_nuclids
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/number_of_nuclids-field
- number_of_numeric_labels
- /NXclustering/number_of_numeric_labels-field
- number_of_objects
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
- /NXcs_filter_boolean_mask/number_of_objects-field
- /NXms_crystal_set/number_of_objects-field
- number_of_processes
- /NXapm_paraprobe_config_clusterer/ENTRY/number_of_processes-field
- /NXapm_paraprobe_config_distancer/ENTRY/number_of_processes-field
- /NXapm_paraprobe_config_intersector/ENTRY/number_of_processes-field
- /NXapm_paraprobe_config_nanochem/ENTRY/number_of_processes-field
- /NXapm_paraprobe_config_ranger/ENTRY/number_of_processes-field
- /NXapm_paraprobe_config_spatstat/ENTRY/number_of_processes-field
- /NXapm_paraprobe_config_surfacer/ENTRY/number_of_processes-field
- /NXapm_paraprobe_config_tessellator/ENTRY/number_of_processes-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/number_of_processes-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/number_of_processes-field
- /NXcs_profiling/number_of_processes-field
- /NXcs_profiling_event/number_of_processes-field
- number_of_ranging_processes
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/number_of_ranging_processes-field
- number_of_reflectors
- /NXimage_set_em_kikuchi/oim/indexing/reflector/number_of_reflectors-field
- number_of_runs
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/number_of_runs-field
- number_of_threads
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/number_of_threads-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/number_of_threads-field
- /NXcs_profiling/number_of_threads-field
- /NXcs_profiling_event/number_of_threads-field
- number_of_total_vertices
- /NXcg_polygon_set/number_of_total_vertices-field
- /NXcg_polyline_set/number_of_total_vertices-field
- number_of_tracking_sets
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/number_of_tracking_sets-field
- number_of_unique_vertices
- /NXcg_triangle_set/number_of_unique_vertices-field
- number_of_vertices
- /NXcg_face_list_data_structure/number_of_vertices-field
- /NXcg_half_edge_data_structure/number_of_vertices-field
- /NXcg_polyline_set/number_of_vertices-field
- number_sections
- /NXguide/number_sections-field
- numeric_label
- /NXclustering/numeric_label-field
- nxspe_info
- /NXspe/ENTRY/NXSPE_info-group
- object_size
- /NXms_crystal_set/object_size-field
- objects
- /NXclustering/objects-field
- /NXdelocalization/objects-field
- /NXorientation_set/objects-field
- observed_frame
- /NXreflections/observed_frame-field
- observed_frame_errors
- /NXreflections/observed_frame_errors-field
- observed_frame_var
- /NXreflections/observed_frame_var-field
- observed_phi
- /NXreflections/observed_phi-field
- observed_phi_errors
- /NXreflections/observed_phi_errors-field
- observed_phi_var
- /NXreflections/observed_phi_var-field
- observed_px_x
- /NXreflections/observed_px_x-field
- observed_px_x_errors
- /NXreflections/observed_px_x_errors-field
- observed_px_x_var
- /NXreflections/observed_px_x_var-field
- observed_px_y
- /NXreflections/observed_px_y-field
- observed_px_y_errors
- /NXreflections/observed_px_y_errors-field
- observed_px_y_var
- /NXreflections/observed_px_y_var-field
- observed_x
- /NXreflections/observed_x-field
- observed_x_errors
- /NXreflections/observed_x_errors-field
- observed_x_var
- /NXreflections/observed_x_var-field
- observed_y
- /NXreflections/observed_y-field
- observed_y_errors
- /NXreflections/observed_y_errors-field
- observed_y_var
- /NXreflections/observed_y_var-field
- odd_layer_density
- /NXmirror/odd_layer_density-field
- odd_layer_material
- /NXmirror/odd_layer_material-field
- off_geometry
- /NXbeam_stop/OFF_GEOMETRY-group
- /NXbending_magnet/OFF_GEOMETRY-group
- /NXcollimator/OFF_GEOMETRY-group
- /NXcrystal/OFF_GEOMETRY-group
- /NXdetector/DETECTOR_MODULE/OFF_GEOMETRY-group
- /NXdisk_chopper/OFF_GEOMETRY-group
- /NXfermi_chopper/OFF_GEOMETRY-group
- /NXfilter/OFF_GEOMETRY-group
- /NXgrating/OFF_GEOMETRY-group
- /NXguide/OFF_GEOMETRY-group
- /NXinsertion_device/OFF_GEOMETRY-group
- /NXmirror/OFF_GEOMETRY-group
- /NXmoderator/OFF_GEOMETRY-group
- /NXmonitor/OFF_GEOMETRY-group
- /NXmonochromator/OFF_GEOMETRY-group
- /NXsample/OFF_GEOMETRY-group
- /NXsensor/OFF_GEOMETRY-group
- /NXsolid_geometry/OFF_GEOMETRY-group
- /NXsource/OFF_GEOMETRY-group
- /NXvelocity_selector/OFF_GEOMETRY-group
- /NXxraylens/OFF_GEOMETRY-group
- offset
- /NXcalibration/offset-field
- /NXcg_alpha_shape/offset-field
- /NXdata/offset-field
- offset_values
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/offset_values-field
- oim
- /NXimage_set_em_kikuchi/oim-group
- operating_system
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/operating_system-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/operating_system-field
- /NXcs_computer/operating_system-field
- operation
- /NXcsg/operation-field
- operation_mode
- /NXapm/ENTRY/operation_mode-field
- operator
- /NXtransmission/ENTRY/operator-group
- optical_excitation
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation-group
- optical_system_em
- /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM-group
- /NXevent_data_em/em_lab/OPTICAL_SYSTEM_EM-group
- /NXimage_set_em_se/OPTICAL_SYSTEM_EM-group
- orcid
- /NXapm/ENTRY/USER/orcid-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/orcid-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/orcid-field
- /NXellipsometry/ENTRY/USER/orcid-field
- /NXem/ENTRY/USER/orcid-field
- /NXmpes/ENTRY/USER/orcid-field
- /NXsensor_scan/ENTRY/USER/orcid-field
- /NXuser/ORCID-field
- orcid_platform
- /NXapm/ENTRY/USER/orcid_platform-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/orcid_platform-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/orcid_platform-field
- /NXem/ENTRY/USER/orcid_platform-field
- order_no
- /NXcrystal/order_no-field
- orientation
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_ELLIPSOID_SET/orientation-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/orientation-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_ELLIPSOID_SET/orientation-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/orientation-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
- /NXcg_ellipsoid_set/orientation-field
- /NXcg_hexahedron_set/orientation-group
- /NXcg_parallelogram_set/orientation-group
- /NXcg_unit_normal_set/orientation-field
- /NXcontainer/orientation-group
- /NXgeometry/ORIENTATION-group
- /NXorientation_set/orientation-field
- /NXsample/orientation-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation-group
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation-group
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation-group
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation-group
- orientation_angle
- /NXellipsometry/ENTRY/INSTRUMENT/window/orientation_angle-field
- orientation_matrix
- /NXcrystal/orientation_matrix-field
- /NXfilter/orientation_matrix-field
- /NXlauetof/entry/sample/orientation_matrix-field
- /NXsample/orientation_matrix-field
- /NXsample_component/orientation_matrix-field
- /NXtas/entry/SAMPLE/orientation_matrix-field
- /NXxbase/entry/sample/orientation_matrix-field
- origin
- /NXcg_grid/origin-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin-group
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin-group
- /NXsnshisto/ENTRY/instrument/APERTURE/origin-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin-group
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin-group
- original_axis
- /NXcalibration/original_axis-field
- original_centre
- /NXdistortion/original_centre-field
- original_points
- /NXdistortion/original_points-field
- other_detector
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/other_detector-field
- other_material
- /NXellipsometry/ENTRY/INSTRUMENT/window/other_material-field
- outer_diameter
- /NXfresnel_zone_plate/outer_diameter-field
- outermost_zone_width
- /NXfresnel_zone_plate/outermost_zone_width-field
- output
- /NXiqproc/ENTRY/reduction/output-group
- /NXsqom/ENTRY/reduction/output-group
- overlaps
- /NXreflections/overlaps-field
- packing_fraction
- /NXcontainer/packing_fraction-field
- pair_separation
- /NXdisk_chopper/pair_separation-field
- parallelogram
- /NXcg_parallelogram_set/parallelogram-group
- parallelograms
- /NXcg_parallelogram_set/parallelograms-group
- parameter
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/parameter-group
- /NXapm/ENTRY/atom_probe/reconstruction/parameter-field
- parameterization
- /NXorientation_set/parameterization-field
- parameters
- /NXentry/PARAMETERS-group
- /NXquadric/parameters-field
- /NXsubentry/PARAMETERS-group
- /NXtomoproc/entry/reconstruction/parameters-group
- /NXxasproc/ENTRY/XAS_data_reduction/parameters-group
- parent
- /NXregion/parent-field
- parent_mask
- /NXregion/parent_mask-field
- partiality
- /NXreflections/partiality-field
- pass_energy
- /NXarpes/ENTRY/INSTRUMENT/analyser/pass_energy-field
- /NXenergydispersion/pass_energy-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field
- path_length
- /NXsample/path_length-field
- path_length_window
- /NXsample/path_length_window-field
- pattern_center
- /NXimage_set_em_kikuchi/oim/pattern_center-field
- pattern_quality
- /NXimage_set_em_kikuchi/oim/pattern_quality-field
- peak
- /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PEAK-group
- /NXspectrum_set_em_xray/indexing/PEAK-group
- peak_identification
- /NXapm/ENTRY/atom_probe/ranging/peak_identification-group
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification-group
- peak_model
- /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PEAK/peak_model-field
- /NXpeak/peak_model-field
- peak_power
- /NXsource/peak_power-field
- peak_search_and_deconvolution
- /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution-group
- peaks
- /NXspectrum_set_em_xray/indexing/composition_map/peaks-field
- performance
- /NXapm_paraprobe_results_ranger/ENTRY/performance-group
- /NXapm_paraprobe_results_transcoder/ENTRY/performance-group
- period
- /NXgrating/period-field
- /NXsource/period-field
- phase
- /NXdisk_chopper/phase-field
- /NXinsertion_device/phase-field
- phase_identifier
- /NXimage_set_em_kikuchi/oim/indexing/phase_identifier-field
- /NXimage_set_em_kikuchi/oim/indexing/reflector/phase_identifier-field
- phase_name
- /NXimage_set_em_kikuchi/oim/indexing/reflector/phase_name-field
- phi
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/phi-field
- /NXxeuler/entry/name/phi-link
- /NXxeuler/entry/sample/phi-field
- /NXxkappa/entry/name/phi-link
- /NXxkappa/entry/sample/phi-field
- photon_energy
- /NXsource/photon_energy-field
- /NXspectrum_set_em_xray/stack/photon_energy-field
- /NXspectrum_set_em_xray/summary/photon_energy-field
- pid
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/PID-group
- pinhole_position
- /NXapm/ENTRY/atom_probe/pulser/laser_beam/pinhole_position-group
- /NXpulser_apm/laser_beam/pinhole_position-group
- pitch
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/pitch-field
- /NXcanSAS/ENTRY/SAMPLE/pitch-field
- pixel_id
- /NXsnsevent/ENTRY/instrument/DETECTOR/pixel_id-field
- /NXsnshisto/ENTRY/DATA/pixel_id-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/pixel_id-field
- pixel_mask
- /NXdetector/pixel_mask-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask-field
- pixel_mask_applied
- /NXdetector/pixel_mask_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask_applied-field
- pixel_time
- /NXem/ENTRY/em_lab/ebeam_deflector/pixel_time-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/ebeam_deflector/pixel_time-field
- /NXscanbox_em/pixel_time-field
- plot
- /NXellipsometry/ENTRY/plot-group
- point_group
- /NXsample/point_group-field
- /NXsample_component/point_group-field
- point_to_triangle
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle-group
- poison_depth
- /NXmoderator/poison_depth-field
- poison_material
- /NXmoderator/poison_material-field
- polar
- /NXspe/ENTRY/data/polar-field
- polar_angle
- /NXcrystal/polar_angle-field
- /NXdetector/polar_angle-field
- /NXindirecttof/entry/INSTRUMENT/analyser/polar_angle-field
- /NXlauetof/entry/instrument/detector/polar_angle-field
- /NXmonopd/entry/DATA/polar_angle-link
- /NXmonopd/entry/INSTRUMENT/DETECTOR/polar_angle-field
- /NXreflections/polar_angle-field
- /NXrefscan/entry/data/polar_angle-link
- /NXrefscan/entry/instrument/DETECTOR/polar_angle-field
- /NXreftof/entry/instrument/detector/polar_angle-field
- /NXsas/ENTRY/instrument/detector/polar_angle-field
- /NXsastof/ENTRY/instrument/detector/polar_angle-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/polar_angle-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/polar_angle-field
- /NXtas/entry/INSTRUMENT/DETECTOR/polar_angle-field
- /NXtas/entry/INSTRUMENT/analyser/polar_angle-field
- /NXtas/entry/SAMPLE/polar_angle-field
- /NXtofnpd/entry/INSTRUMENT/detector/polar_angle-field
- /NXtofraw/entry/instrument/detector/polar_angle-field
- /NXtofsingle/entry/INSTRUMENT/detector/polar_angle-field
- /NXxeuler/entry/instrument/detector/polar_angle-field
- /NXxeuler/entry/name/polar_angle-link
- /NXxkappa/entry/instrument/detector/polar_angle-field
- /NXxkappa/entry/name/polar_angle-link
- /NXxnb/entry/instrument/detector/polar_angle-field
- /NXxnb/entry/name/polar_angle-link
- /NXxrot/entry/instrument/detector/polar_angle-field
- polar_width
- /NXspe/ENTRY/data/polar_width-field
- polarizer
- /NXinstrument/POLARIZER-group
- /NXsnsevent/ENTRY/instrument/POLARIZER-group
- /NXsnshisto/ENTRY/instrument/POLARIZER-group
- /NXtransmission/ENTRY/instrument/polarizer-field
- poles
- /NXinsertion_device/poles-field
- polygons
- /NXcg_polygon_set/polygons-group
- polyhedra
- /NXcg_polyhedron_set/polyhedra-group
- polyhedron
- /NXcg_polyhedron_set/polyhedron-group
- polyhedron_half_edge
- /NXcg_polyhedron_set/polyhedron_half_edge-group
- polylines
- /NXcg_polyline_set/polylines-field
- position
- /NXcg_grid/position-field
- /NXcg_half_edge_data_structure/position-field
- /NXcg_point_set/position-field
- /NXem/ENTRY/em_lab/stage_lab/position-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB/position-field
- /NXenvironment/position-group
- /NXpeak/position-field
- /NXstage_lab/position-field
- position_x
- /NXxpcs/entry/sample/position_x-group
- position_y
- /NXxpcs/entry/sample/position_y-group
- position_z
- /NXxpcs/entry/sample/position_z-group
- positioner
- /NXaperture/POSITIONER-group
- /NXinstrument/POSITIONER-group
- /NXmanipulator/POSITIONER-group
- /NXsample/POSITIONER-group
- /NXsnsevent/ENTRY/DASlogs/POSITIONER-group
- /NXsnshisto/ENTRY/DASlogs/POSITIONER-group
- /NXstage_lab/POSITIONER-group
- power
- /NXapm/ENTRY/atom_probe/pulser/laser_gun/power-field
- /NXinsertion_device/power-field
- /NXpulser_apm/laser_gun/power-field
- /NXsource/power-field
- pre_sample_flightpath
- /NXentry/pre_sample_flightpath-field
- /NXsubentry/pre_sample_flightpath-field
- /NXtofnpd/entry/pre_sample_flightpath-field
- /NXtofraw/entry/pre_sample_flightpath-field
- /NXtofsingle/entry/pre_sample_flightpath-field
- predicted_frame
- /NXreflections/predicted_frame-field
- predicted_phi
- /NXreflections/predicted_phi-field
- predicted_px_x
- /NXreflections/predicted_px_x-field
- predicted_px_y
- /NXreflections/predicted_px_y-field
- predicted_x
- /NXreflections/predicted_x-field
- predicted_y
- /NXreflections/predicted_y-field
- preparation_date
- /NXapm/ENTRY/specimen/preparation_date-field
- /NXarchive/entry/sample/preparation_date-field
- /NXellipsometry/ENTRY/SAMPLE/preparation_date-field
- /NXem/ENTRY/sample/preparation_date-field
- /NXmpes/ENTRY/SAMPLE/preparation_date-field
- /NXsample/preparation_date-field
- preparation_description
- /NXmpes/ENTRY/SAMPLE/preparation_description-group
- preprocessing_kernel_width
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/preprocessing_kernel_width-field
- preprocessing_method
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/preprocessing_method-field
- preset
- /NXfluo/entry/MONITOR/preset-field
- /NXlauetof/entry/control/preset-field
- /NXmonitor/preset-field
- /NXmonopd/entry/MONITOR/preset-field
- /NXrefscan/entry/control/preset-field
- /NXreftof/entry/control/preset-field
- /NXsas/ENTRY/control/preset-field
- /NXsastof/ENTRY/control/preset-field
- /NXtas/entry/MONITOR/preset-field
- /NXtofnpd/entry/MONITOR/preset-field
- /NXtofraw/entry/MONITOR/preset-field
- /NXtofsingle/entry/MONITOR/preset-field
- /NXxas/ENTRY/MONITOR/preset-field
- /NXxbase/entry/control/preset-field
- pressure
- /NXapm/ENTRY/atom_probe/analysis_chamber/pressure-field
- /NXapm/ENTRY/atom_probe/buffer_chamber/pressure-field
- /NXapm/ENTRY/atom_probe/load_lock_chamber/pressure-field
- /NXarchive/entry/sample/pressure-field
- /NXsample/pressure-field
- prf_cc
- /NXreflections/prf_cc-field
- probe
- /NXarchive/entry/instrument/SOURCE/probe-field
- /NXarpes/ENTRY/INSTRUMENT/SOURCE/probe-field
- /NXcxi_ptycho/entry_1/instrument_1/source_1/probe-field
- /NXebeam_column/electron_gun/probe-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/probe-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_gun/probe-group
- /NXfluo/entry/INSTRUMENT/SOURCE/probe-field
- /NXibeam_column/ion_gun/probe-group
- /NXiqproc/ENTRY/instrument/SOURCE/probe-field
- /NXmonopd/entry/INSTRUMENT/SOURCE/probe-field
- /NXmpes/ENTRY/INSTRUMENT/SOURCE/probe-field
- /NXrefscan/entry/instrument/SOURCE/probe-field
- /NXsas/ENTRY/instrument/source/probe-field
- /NXsastof/ENTRY/instrument/source/probe-field
- /NXsnsevent/ENTRY/instrument/SNS/probe-field
- /NXsnshisto/ENTRY/instrument/SNS/probe-field
- /NXsource/probe-field
- /NXsqom/ENTRY/instrument/SOURCE/probe-field
- /NXstxm/ENTRY/INSTRUMENT/SOURCE/probe-field
- /NXtas/entry/INSTRUMENT/SOURCE/probe-field
- /NXtomo/entry/instrument/SOURCE/probe-field
- /NXtomophase/entry/instrument/SOURCE/probe-field
- /NXtomoproc/entry/INSTRUMENT/SOURCE/probe-field
- /NXxas/ENTRY/INSTRUMENT/SOURCE/probe-field
- /NXxbase/entry/instrument/source/probe-field
- process
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS-group
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS-group
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS-group
- /NXapm_paraprobe_config_transcoder/ENTRY/PROCESS-group
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS-group
- /NXcanSAS/ENTRY/PROCESS-group
- /NXentry/PROCESS-group
- /NXevent_data_em/PROCESS-group
- /NXimage_set_em_adf/PROCESS-group
- /NXimage_set_em_bf/PROCESS-group
- /NXimage_set_em_bse/PROCESS-group
- /NXimage_set_em_chamber/PROCESS-group
- /NXimage_set_em_df/PROCESS-group
- /NXimage_set_em_diffrac/PROCESS-group
- /NXimage_set_em_ecci/PROCESS-group
- /NXimage_set_em_ronchigram/PROCESS-group
- /NXinteraction_vol_em/PROCESS-group
- /NXmpes/ENTRY/PROCESS-group
- /NXsensor_scan/ENTRY/PROCESS-group
- /NXspectrum_set_em_auger/PROCESS-group
- /NXspectrum_set_em_cathodolum/PROCESS-group
- /NXspectrum_set_em_eels/PROCESS-group
- /NXspectrum_set_em_xray/PROCESS-group
- /NXsubentry/PROCESS-group
- /NXxpcs/PROCESS-group
- profile
- /NXmx/ENTRY/INSTRUMENT/BEAM/profile-field
- profiling
- /NXimage_set_em_kikuchi/profiling-group
- program
- /NXapm/ENTRY/atom_probe/control_software/program-field
- /NXapm/ENTRY/atom_probe/hit_multiplicity/program-field
- /NXapm/ENTRY/atom_probe/ion_filtering/program-field
- /NXapm/ENTRY/atom_probe/ion_impact_positions/program-field
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/program-field
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/program-field
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/program-field
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/program-field
- /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/program-field
- /NXapm/ENTRY/atom_probe/ranging/program-field
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/program-field
- /NXapm/ENTRY/atom_probe/reconstruction/program-field
- /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/program-field
- /NXapm/ENTRY/program-field
- /NXapm_paraprobe_config_clusterer/ENTRY/program-field
- /NXapm_paraprobe_config_distancer/ENTRY/program-field
- /NXapm_paraprobe_config_intersector/ENTRY/program-field
- /NXapm_paraprobe_config_nanochem/ENTRY/program-field
- /NXapm_paraprobe_config_ranger/ENTRY/program-field
- /NXapm_paraprobe_config_spatstat/ENTRY/program-field
- /NXapm_paraprobe_config_surfacer/ENTRY/program-field
- /NXapm_paraprobe_config_tessellator/ENTRY/program-field
- /NXapm_paraprobe_config_transcoder/ENTRY/program-field
- /NXapm_paraprobe_results_ranger/ENTRY/program-field
- /NXapm_paraprobe_results_transcoder/ENTRY/program-field
- /NXarchive/entry/program-field
- /NXcg_marching_cubes/program-field
- /NXcs_prng/program-field
- /NXellipsometry/ENTRY/acquisition_program/program-field
- /NXem/ENTRY/program-field
- /NXenvironment/program-field
- /NXimage_set_em_adf/PROCESS/program-field
- /NXiqproc/ENTRY/reduction/program-field
- /NXprocess/program-field
- /NXsensor_scan/ENTRY/PROCESS/program-field
- /NXspectrum_set_em_eels/PROCESS/program-field
- /NXspectrum_set_em_xray/PROCESS/program-field
- /NXspectrum_set_em_xray/indexing/composition_map/program-field
- /NXspectrum_set_em_xray/indexing/program-field
- /NXsqom/ENTRY/reduction/program-field
- /NXtomoproc/entry/reconstruction/program-field
- /NXxasproc/ENTRY/XAS_data_reduction/program-field
- program_name
- /NXentry/program_name-field
- /NXspe/ENTRY/program_name-field
- /NXsubentry/program_name-field
- projection
- /NXcollectioncolumn/projection-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field
- protocol_name
- /NXapm/ENTRY/atom_probe/reconstruction/protocol_name-field
- proton_charge
- /NXsnsevent/ENTRY/proton_charge-field
- /NXsnshisto/ENTRY/proton_charge-field
- psi
- /NXspe/ENTRY/NXSPE_info/psi-field
- pulse_duration
- /NXbeam/pulse_duration-field
- pulse_energy
- /NXapm/ENTRY/atom_probe/pulser/laser_gun/pulse_energy-field
- /NXbeam/pulse_energy-field
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/pulse_energy-field
- /NXpulser_apm/laser_gun/pulse_energy-field
- /NXsource/pulse_energy-field
- pulse_fraction
- /NXapm/ENTRY/atom_probe/pulser/pulse_fraction-field
- /NXpulser_apm/pulse_fraction-field
- pulse_frequency
- /NXapm/ENTRY/atom_probe/pulser/pulse_frequency-field
- /NXpulser_apm/pulse_frequency-field
- pulse_height
- /NXevent_data/pulse_height-field
- pulse_id
- /NXapm/ENTRY/atom_probe/hit_multiplicity/pulse_id-field
- pulse_mode
- /NXapm/ENTRY/atom_probe/pulser/pulse_mode-field
- /NXpulser_apm/pulse_mode-field
- pulse_shape
- /NXmoderator/pulse_shape-group
- /NXsource/pulse_shape-group
- pulse_time
- /NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/pulse_time-field
- pulse_width
- /NXsource/pulse_width-field
- pulsed_voltage
- /NXapm/ENTRY/atom_probe/pulser/pulsed_voltage-field
- /NXpulser_apm/pulsed_voltage-field
- pulser
- /NXapm/ENTRY/atom_probe/pulser-group
- pulses_since_last_ion
- /NXapm/ENTRY/atom_probe/hit_multiplicity/pulses_since_last_ion-field
- pump
- /NXem/ENTRY/em_lab/PUMP-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/PUMP-group
- purity
- /NXsample/purity-field
- pv_sensor
- /NXpid/pv_sensor-group
- q
- /NXcanSAS/ENTRY/DATA/Q-field
- qdev
- /NXcanSAS/ENTRY/DATA/Qdev-field
- qh
- /NXtas/entry/DATA/qh-link
- /NXtas/entry/SAMPLE/qh-field
- qk
- /NXtas/entry/DATA/qk-link
- /NXtas/entry/SAMPLE/qk-field
- ql
- /NXtas/entry/DATA/ql-link
- /NXtas/entry/SAMPLE/ql-field
- qmean
- /NXcanSAS/ENTRY/DATA/Qmean-field
- quadric
- /NXsolid_geometry/QUADRIC-group
- qx
- /NXiqproc/ENTRY/DATA/qx-field
- /NXsqom/ENTRY/DATA/qx-field
- qy
- /NXiqproc/ENTRY/DATA/qy-field
- /NXsqom/ENTRY/DATA/qy-field
- qz
- /NXsqom/ENTRY/DATA/qz-field
- r_slit
- /NXfermi_chopper/r_slit-field
- radiation
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/radiation-field
- radii
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/CG_CYLINDER_SET/radii-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/radii-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/CG_CYLINDER_SET/radii-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/CG_CYLINDER_SET/radii-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
- /NXcg_cylinder_set/radii-field
- /NXcg_sphere_set/radii-field
- radius
- /NXcg_sphere_set/radius-field
- /NXdisk_chopper/radius-field
- /NXfermi_chopper/radius-field
- /NXvelocity_selector/radius-field
- random_number_generator
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/random_number_generator-group
- randomize_labels
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/randomize_labels-field
- range
- /NXmonitor/range-field
- range_increment
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/range_increment-field
- range_minmax
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/range_minmax-field
- range_with_existent_iontypes
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes-group
- ranging
- /NXapm/ENTRY/atom_probe/ranging-group
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging-group
- ratio
- /NXdisk_chopper/ratio-field
- raw
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA/raw-field
- raw_file
- /NXtomoproc/entry/reconstruction/parameters/raw_file-field
- /NXxasproc/ENTRY/XAS_data_reduction/parameters/raw_file-field
- raw_frames
- /NXsnsevent/ENTRY/raw_frames-field
- /NXsnshisto/ENTRY/raw_frames-field
- raw_time_of_flight
- /NXdetector/raw_time_of_flight-field
- raw_tof
- /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/raw_tof-field
- raw_value
- /NXlog/raw_value-field
- /NXpositioner/raw_value-field
- rdeform_field
- /NXdistortion/rdeform_field-field
- read_bfield_current
- /NXseparator/read_Bfield_current-group
- /NXspin_rotator/read_Bfield_current-group
- read_bfield_voltage
- /NXseparator/read_Bfield_voltage-group
- /NXspin_rotator/read_Bfield_voltage-group
- read_current
- /NXelectrostatic_kicker/read_current-group
- /NXmagnetic_kicker/read_current-group
- /NXquadrupole_magnet/read_current-group
- /NXsolenoid_magnet/read_current-group
- read_efield_current
- /NXseparator/read_Efield_current-group
- /NXspin_rotator/read_Efield_current-group
- read_efield_voltage
- /NXseparator/read_Efield_voltage-group
- /NXspin_rotator/read_Efield_voltage-group
- read_voltage
- /NXelectrostatic_kicker/read_voltage-group
- /NXmagnetic_kicker/read_voltage-group
- /NXquadrupole_magnet/read_voltage-group
- /NXsolenoid_magnet/read_voltage-group
- real_time
- /NXdetector/real_time-field
- reconstructed_positions
- /NXapm/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
- reconstruction
- /NXapm/ENTRY/atom_probe/reconstruction-group
- /NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/reconstruction-group
- /NXtomoproc/entry/reconstruction-group
- recover_bitmask
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/recover_bitmask-field
- recover_evaporation_id
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/recover_evaporation_id-field
- reduction
- /NXiqproc/ENTRY/reduction-group
- /NXsqom/ENTRY/reduction-group
- ref_attenuator
- /NXtransmission/ENTRY/instrument/ref_attenuator-group
- reference_data
- /NXellipsometry/ENTRY/INSTRUMENT/window/reference_data-group
- reference_measurement
- /NXcontainer/reference_measurement-link
- reference_plane
- /NXbeam/TRANSFORMATIONS/reference_plane-field
- reference_sample
- /NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/reference_sample-field
- reference_wavelength
- /NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/reference_wavelength-field
- reflection
- /NXcrystal/reflection-field
- /NXpolarizer/reflection-field
- reflection_id
- /NXreflections/reflection_id-field
- reflectivity
- /NXcrystal/reflectivity-group
- /NXguide/reflectivity-group
- /NXmirror/reflectivity-group
- reflector
- /NXimage_set_em_kikuchi/oim/indexing/reflector-group
- reflectron
- /NXapm/ENTRY/atom_probe/REFLECTRON-group
- region_origin
- /NXarpes/ENTRY/INSTRUMENT/analyser/region_origin-field
- region_size
- /NXarpes/ENTRY/INSTRUMENT/analyser/region_size-field
- registration
- /NXprocess/REGISTRATION-group
- relation
- /NXgraph_root/relation-group
- relative_molecular_mass
- /NXcontainer/relative_molecular_mass-field
- /NXsample/relative_molecular_mass-field
- /NXsample_component/relative_molecular_mass-field
- release_date
- /NXarchive/entry/release_date-field
- requested_pixel_time
- /NXscanbox_em/requested_pixel_time-field
- resolution
- /NXimage_set_em_kikuchi/hough_transformation/resolution-field
- response_time
- /NXtransmission/ENTRY/instrument/DETECTOR/response_time-field
- revision
- /NXarchive/entry/revision-field
- /NXentry/revision-field
- /NXsubentry/revision-field
- revolution
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/revolution-field
- roi
- /NXimage_set_em_se/roi-field
- roi_cylinder_height
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/roi_cylinder_height-field
- roi_cylinder_radius
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/roi_cylinder_radius-field
- role
- /NXapm/ENTRY/USER/role-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/role-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/role-field
- /NXarchive/entry/user/role-field
- /NXem/ENTRY/USER/role-field
- /NXsnsevent/ENTRY/USER/role-field
- /NXsnshisto/ENTRY/USER/role-field
- /NXuser/role-field
- roll
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/roll-field
- /NXcanSAS/ENTRY/SAMPLE/roll-field
- rotating_element
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/rotating_element-field
- rotation
- /NXem/ENTRY/em_lab/stage_lab/rotation-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB/rotation-field
- /NXscanbox_em/rotation-field
- /NXstage_lab/rotation-field
- rotation_angle
- /NXmonopd/entry/SAMPLE/rotation_angle-field
- /NXrefscan/entry/data/rotation_angle-link
- /NXrefscan/entry/sample/rotation_angle-field
- /NXreftof/entry/sample/rotation_angle-field
- /NXsample/rotation_angle-field
- /NXsas/ENTRY/instrument/detector/rotation_angle-field
- /NXsastof/ENTRY/instrument/detector/rotation_angle-field
- /NXscan/ENTRY/DATA/rotation_angle-link
- /NXscan/ENTRY/SAMPLE/rotation_angle-field
- /NXspe/ENTRY/SAMPLE/rotation_angle-field
- /NXstxm/ENTRY/SAMPLE/rotation_angle-field
- /NXtas/entry/INSTRUMENT/analyser/rotation_angle-field
- /NXtas/entry/INSTRUMENT/monochromator/rotation_angle-field
- /NXtas/entry/SAMPLE/rotation_angle-field
- /NXtomo/entry/data/rotation_angle-link
- /NXtomo/entry/sample/rotation_angle-field
- /NXtomophase/entry/data/rotation_angle-link
- /NXtomophase/entry/sample/rotation_angle-field
- /NXxeuler/entry/name/rotation_angle-link
- /NXxeuler/entry/sample/rotation_angle-field
- /NXxkappa/entry/name/rotation_angle-link
- /NXxkappa/entry/sample/rotation_angle-field
- /NXxnb/entry/name/rotation_angle-link
- /NXxnb/entry/sample/rotation_angle-field
- /NXxrot/entry/name/rotation_angle-link
- /NXxrot/entry/sample/rotation_angle-field
- rotation_angle_step
- /NXxrot/entry/sample/rotation_angle_step-field
- rotation_speed
- /NXdirecttof/entry/INSTRUMENT/disk_chopper/rotation_speed-field
- /NXdirecttof/entry/INSTRUMENT/fermi_chopper/rotation_speed-field
- /NXdisk_chopper/rotation_speed-field
- /NXfermi_chopper/rotation_speed-field
- /NXvelocity_selector/rotation_speed-field
- roughening_pump
- /NXapm/ENTRY/atom_probe/roughening_pump-group
- run
- /NXcanSAS/ENTRY/run-field
- run_control
- /NXsensor/run_control-field
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control-field
- run_cycle
- /NXarchive/entry/run_cycle-field
- /NXentry/run_cycle-field
- /NXsubentry/run_cycle-field
- run_number
- /NXapm/ENTRY/run_number-field
- /NXsnsevent/ENTRY/run_number-field
- /NXsnshisto/ENTRY/run_number-field
- /NXtofraw/entry/run_number-field
- s
- /NXcg_alpha_shape/s-group
- sample
- /NXarchive/entry/sample-group
- /NXarpes/ENTRY/SAMPLE-group
- /NXcanSAS/ENTRY/SAMPLE-group
- /NXellipsometry/ENTRY/SAMPLE-group
- /NXem/ENTRY/sample-group
- /NXentry/SAMPLE-group
- /NXfluo/entry/SAMPLE-group
- /NXiqproc/ENTRY/SAMPLE-group
- /NXlauetof/entry/sample-group
- /NXmonopd/entry/SAMPLE-group
- /NXmpes/ENTRY/SAMPLE-group
- /NXmx/ENTRY/SAMPLE-group
- /NXrefscan/entry/sample-group
- /NXreftof/entry/sample-group
- /NXsas/ENTRY/sample-group
- /NXsastof/ENTRY/sample-group
- /NXscan/ENTRY/SAMPLE-group
- /NXsensor_scan/ENTRY/SAMPLE-group
- /NXsnsevent/ENTRY/sample-group
- /NXsnshisto/ENTRY/sample-group
- /NXspe/ENTRY/SAMPLE-group
- /NXsqom/ENTRY/SAMPLE-group
- /NXstxm/ENTRY/SAMPLE-group
- /NXsubentry/SAMPLE-group
- /NXtas/entry/SAMPLE-group
- /NXtofnpd/entry/SAMPLE-group
- /NXtofraw/entry/SAMPLE-group
- /NXtofsingle/entry/SAMPLE-group
- /NXtomo/entry/sample-group
- /NXtomophase/entry/instrument/sample-group
- /NXtomophase/entry/sample-group
- /NXtomoproc/entry/SAMPLE-group
- /NXtransmission/ENTRY/SAMPLE-group
- /NXxas/ENTRY/SAMPLE-group
- /NXxasproc/ENTRY/SAMPLE-group
- /NXxbase/entry/sample-group
- /NXxeuler/entry/sample-group
- /NXxkappa/entry/sample-group
- /NXxnb/entry/sample-group
- /NXxpcs/entry/sample-group
- /NXxrot/entry/sample-group
- sample_1
- /NXcxi_ptycho/sample_1-group
- sample_attenuator
- /NXtransmission/ENTRY/instrument/sample_attenuator-group
- sample_bias
- /NXmanipulator/sample_bias-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias-field
- sample_component
- /NXsample/SAMPLE_COMPONENT-group
- /NXsample/sample_component-field
- sample_history
- /NXapm/ENTRY/specimen/sample_history-field
- /NXellipsometry/ENTRY/SAMPLE/sample_history-field
- /NXem/ENTRY/sample/sample_history-field
- /NXmpes/ENTRY/SAMPLE/sample_history-group
- /NXsample/sample_history-group
- sample_id
- /NXarchive/entry/sample/sample_id-field
- /NXsample/sample_id-field
- sample_name
- /NXellipsometry/ENTRY/SAMPLE/sample_name-field
- sample_orientation
- /NXsample/sample_orientation-field
- /NXsample_component/sample_orientation-field
- sample_temperature
- /NXmanipulator/sample_temperature-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_temperature-field
- sample_x
- /NXstxm/ENTRY/DATA/sample_x-field
- /NXstxm/ENTRY/INSTRUMENT/sample_x-group
- sample_y
- /NXstxm/ENTRY/DATA/sample_y-field
- /NXstxm/ENTRY/INSTRUMENT/sample_y-group
- sample_z
- /NXstxm/ENTRY/INSTRUMENT/sample_z-group
- sampled_fraction
- /NXmonitor/sampled_fraction-field
- saturation_value
- /NXdetector/saturation_value-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/saturation_value-field
- scale
- /NXregion/scale-field
- scaling
- /NXcalibration/scaling-field
- scaling_factor
- /NXdata/scaling_factor-field
- scan_number
- /NXxpcs/entry/scan_number-field
- scan_rotation
- /NXimage_set_em_se/scan_rotation-group
- scattering_angle
- /NXspindispersion/scattering_angle-field
- scattering_cross_section
- /NXattenuator/scattering_cross_section-field
- scattering_energy
- /NXspindispersion/scattering_energy-field
- scattering_length_density
- /NXsample/scattering_length_density-field
- /NXsample_component/scattering_length_density-field
- scattering_vector
- /NXcrystal/scattering_vector-field
- scheme
- /NXcollectioncolumn/scheme-field
- /NXenergydispersion/scheme-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field
- sdd
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/SDD-field
- seblock
- /NXspe/ENTRY/SAMPLE/seblock-field
- seed
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/random_number_generator/seed-field
- /NXcs_prng/seed-field
- segment_columns
- /NXcrystal/segment_columns-field
- segment_gap
- /NXcrystal/segment_gap-field
- segment_height
- /NXcrystal/segment_height-field
- segment_rows
- /NXcrystal/segment_rows-field
- segment_thickness
- /NXcrystal/segment_thickness-field
- segment_width
- /NXcrystal/segment_width-field
- semi_convergence_angle
- /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/semi_convergence_angle-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/semi_convergence_angle-field
- /NXoptical_system_em/semi_convergence_angle-field
- sensor
- /NXebeam_column/SENSOR-group
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/SENSOR-group
- /NXenvironment/SENSOR-group
- /NXibeam_column/SENSOR-group
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR-group
- sensor_count
- /NXdetector/sensor_count-field
- sensor_material
- /NXdetector/sensor_material-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_material-field
- sensor_pixel_size
- /NXdetector/sensor_pixel_size-field
- sensor_pixels
- /NXdetector/sensor_pixels-field
- sensor_size
- /NXarpes/ENTRY/INSTRUMENT/analyser/sensor_size-field
- /NXdetector/sensor_size-field
- sensor_thickness
- /NXdetector/sensor_thickness-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_thickness-field
- sensor_type
- /NXfilter/sensor_type-group
- sequence_index
- /NXnote/sequence_index-field
- /NXprocess/sequence_index-field
- sequence_number
- /NXdetector/sequence_number-field
- /NXtomophase/entry/instrument/bright_field/sequence_number-field
- /NXtomophase/entry/instrument/dark_field/sequence_number-field
- /NXtomophase/entry/instrument/sample/sequence_number-field
- serial_number
- /NXapm/ENTRY/atom_probe/ion_detector/serial_number-field
- /NXdetector/serial_number-field
- set_bfield_current
- /NXseparator/set_Bfield_current-field
- /NXspin_rotator/set_Bfield_current-field
- set_current
- /NXelectrostatic_kicker/set_current-field
- /NXmagnetic_kicker/set_current-field
- /NXquadrupole_magnet/set_current-field
- /NXsolenoid_magnet/set_current-field
- set_efield_voltage
- /NXseparator/set_Efield_voltage-field
- /NXspin_rotator/set_Efield_voltage-field
- set_voltage
- /NXelectrostatic_kicker/set_voltage-field
- /NXmagnetic_kicker/set_voltage-field
- setpoint
- /NXpid/setpoint-field
- sgl
- /NXtas/entry/SAMPLE/sgl-field
- sgu
- /NXtas/entry/SAMPLE/sgu-field
- shadowfactor
- /NXcanSAS/ENTRY/DATA/ShadowFactor-field
- shank_angle
- /NXapm/ENTRY/atom_probe/specimen_monitoring/shank_angle-field
- shape
- /NXaperture/shape-field
- /NXattenuator/shape-group
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/shape-field
- /NXcg_hexahedron_set/shape-field
- /NXcg_parallelogram_set/shape-field
- /NXcg_polygon_set/shape-field
- /NXcontainer/shape-group
- /NXcrystal/shape-group
- /NXgeometry/SHAPE-group
- /NXgrating/shape-group
- /NXmirror/shape-group
- /NXsas/ENTRY/instrument/collimator/geometry/shape-group
- /NXsas/ENTRY/instrument/collimator/geometry/shape/shape-field
- /NXsastof/ENTRY/instrument/collimator/geometry/shape-group
- /NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field
- /NXshape/shape-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape-group
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/shape-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape-group
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/shape-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape-group
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/shape-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape-group
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/shape-field
- shermann_function
- /NXspindispersion/shermann_function-field
- short_name
- /NXenvironment/short_name-field
- /NXsensor/short_name-field
- short_title
- /NXapm/ENTRY/specimen/short_title-field
- /NXem/ENTRY/sample/short_title-field
- /NXsample/short_title-field
- sigma_x
- /NXsource/sigma_x-field
- sigma_y
- /NXsource/sigma_y-field
- signal_amplitude
- /NXapm/ENTRY/atom_probe/ion_detector/signal_amplitude-field
- situation
- /NXarchive/entry/sample/situation-field
- /NXmpes/ENTRY/SAMPLE/situation-field
- /NXsample/situation-field
- size
- /NXaperture/size-field
- /NXbeam_stop/size-field
- /NXclustering/size-field
- /NXsas/ENTRY/instrument/collimator/geometry/shape/size-field
- /NXsastof/ENTRY/instrument/collimator/geometry/shape/size-field
- /NXshape/size-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/size-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/size-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/size-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/size-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/size-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/size-field
- slit
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT-group
- /NXfermi_chopper/slit-field
- /NXtransmission/ENTRY/instrument/DETECTOR/slit-group
- slit_angle
- /NXdisk_chopper/slit_angle-field
- slit_edges
- /NXdisk_chopper/slit_edges-field
- slit_height
- /NXdisk_chopper/slit_height-field
- slit_length
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/slit_length-field
- slits
- /NXdisk_chopper/slits-field
- slot
- /NXdetector/slot-field
- slow_axes
- /NXelectronanalyser/slow_axes-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field
- slow_pixel_direction
- /NXdetector_module/slow_pixel_direction-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction-field
- sns
- /NXsnsevent/ENTRY/instrument/SNS-group
- /NXsnshisto/ENTRY/instrument/SNS-group
- snsbanking_file_name
- /NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field
- /NXsnshisto/ENTRY/SNSHistoTool/SNSbanking_file_name-field
- snsdetector_calibration_id
- /NXsnsevent/ENTRY/instrument/SNSdetector_calibration_id-field
- /NXsnshisto/ENTRY/instrument/SNSdetector_calibration_id-field
- snsgeometry_file_name
- /NXsnsevent/ENTRY/instrument/SNSgeometry_file_name-field
- /NXsnshisto/ENTRY/instrument/SNSgeometry_file_name-field
- snshistotool
- /NXsnsevent/ENTRY/SNSHistoTool-group
- /NXsnshisto/ENTRY/SNSHistoTool-group
- snsmapping_file_name
- /NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field
- /NXsnshisto/ENTRY/SNSHistoTool/SNSmapping_file_name-field
- snstranslation_service
- /NXsnsevent/ENTRY/instrument/SNStranslation_service-field
- /NXsnshisto/ENTRY/instrument/SNStranslation_service-field
- social_media_name
- /NXapm/ENTRY/USER/social_media_name-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/social_media_name-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/social_media_name-field
- /NXem/ENTRY/USER/social_media_name-field
- social_media_platform
- /NXapm/ENTRY/USER/social_media_platform-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/social_media_platform-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/social_media_platform-field
- /NXem/ENTRY/USER/social_media_platform-field
- soft_limit_max
- /NXpositioner/soft_limit_max-field
- soft_limit_min
- /NXpositioner/soft_limit_min-field
- solid_angle
- /NXdetector/solid_angle-field
- soller_angle
- /NXcollimator/soller_angle-field
- source
- /NXarchive/entry/instrument/SOURCE-group
- /NXarpes/ENTRY/INSTRUMENT/SOURCE-group
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE-group
- /NXfluo/entry/INSTRUMENT/SOURCE-group
- /NXimage_set_em_adf/PROCESS/source-field
- /NXinstrument/SOURCE-group
- /NXiqproc/ENTRY/instrument/SOURCE-group
- /NXmonopd/entry/INSTRUMENT/SOURCE-group
- /NXmpes/ENTRY/INSTRUMENT/SOURCE-group
- /NXmx/ENTRY/SOURCE-group
- /NXrefscan/entry/instrument/SOURCE-group
- /NXsas/ENTRY/instrument/source-group
- /NXsastof/ENTRY/instrument/source-group
- /NXspectrum_set_em_eels/PROCESS/source-field
- /NXspectrum_set_em_xray/PROCESS/source-field
- /NXsqom/ENTRY/instrument/SOURCE-group
- /NXstxm/ENTRY/INSTRUMENT/SOURCE-group
- /NXtas/entry/INSTRUMENT/SOURCE-group
- /NXtomo/entry/instrument/SOURCE-group
- /NXtomophase/entry/instrument/SOURCE-group
- /NXtomoproc/entry/INSTRUMENT/SOURCE-group
- /NXtransmission/ENTRY/instrument/SOURCE-group
- /NXxas/ENTRY/INSTRUMENT/SOURCE-group
- /NXxbase/entry/instrument/source-group
- /NXxlaue/entry/instrument/source-group
- source_1
- /NXcxi_ptycho/entry_1/instrument_1/source_1-group
- source_distance_x
- /NXbending_magnet/source_distance_x-field
- source_distance_y
- /NXbending_magnet/source_distance_y-field
- space_group
- /NXcrystal/space_group-field
- /NXimage_set_em_kikuchi/oim/indexing/reflector/space_group-field
- /NXsample/space_group-field
- /NXsample_component/space_group-field
- spatial_calibration
- /NXmpes/ENTRY/PROCESS/spatial_calibration-group
- spatial_filter
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter-group
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter-group
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter-group
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter-group
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter-group
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter-group
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter-group
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter-group
- spatial_resolution
- /NXelectronanalyser/spatial_resolution-field
- /NXinstrument/spatial_resolution-field
- spatial_statistics
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics-group
- specimen
- /NXapm/ENTRY/specimen-group
- specimen_monitoring
- /NXapm/ENTRY/atom_probe/specimen_monitoring-group
- spectral_resolution
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/spectral_resolution-field
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING/spectral_resolution-field
- /NXtransmission/ENTRY/instrument/spectrometer/spectral_resolution-field
- spectrometer
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer-group
- /NXtransmission/ENTRY/instrument/spectrometer-group
- spectrum
- /NXbending_magnet/spectrum-group
- /NXinsertion_device/spectrum-group
- /NXtransmission/ENTRY/instrument/SOURCE/spectrum-field
- spectrum_set_em_auger
- /NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_AUGER-group
- /NXevent_data_em/SPECTRUM_SET_EM_AUGER-group
- spectrum_set_em_cathodolum
- /NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_CATHODOLUM-group
- /NXevent_data_em/SPECTRUM_SET_EM_CATHODOLUM-group
- spectrum_set_em_eels
- /NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_EELS-group
- /NXevent_data_em/SPECTRUM_SET_EM_EELS-group
- spectrum_set_em_xray
- /NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_XRAY-group
- /NXevent_data_em/SPECTRUM_SET_EM_XRAY-group
- spindispersion
- /NXelectronanalyser/SPINDISPERSION-group
- spot_position
- /NXapm/ENTRY/atom_probe/pulser/laser_beam/spot_position-group
- /NXpulser_apm/laser_beam/spot_position-group
- spwidth
- /NXvelocity_selector/spwidth-field
- stack
- /NXimage_set_em_adf/stack-group
- /NXspectrum_set_em_eels/stack-group
- /NXspectrum_set_em_xray/stack-group
- stage
- /NXellipsometry/ENTRY/INSTRUMENT/stage-group
- stage_lab
- /NXapm/ENTRY/atom_probe/stage_lab-group
- /NXebeam_column/STAGE_LAB-group
- /NXem/ENTRY/em_lab/stage_lab-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB-group
- stage_type
- /NXellipsometry/ENTRY/INSTRUMENT/stage/stage_type-field
- standing_voltage
- /NXapm/ENTRY/atom_probe/pulser/standing_voltage-field
- /NXpulser_apm/standing_voltage-field
- start
- /NXregion/start-field
- start_time
- /NXapm/ENTRY/start_time-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
- /NXapm_paraprobe_results_ranger/ENTRY/performance/start_time-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/start_time-field
- /NXarchive/entry/start_time-field
- /NXarpes/ENTRY/start_time-field
- /NXcs_profiling/start_time-field
- /NXcs_profiling_event/start_time-field
- /NXcxi_ptycho/entry_1/start_time-field
- /NXdetector/start_time-field
- /NXdirecttof/entry/start_time-field
- /NXellipsometry/ENTRY/start_time-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/start_time-field
- /NXem/ENTRY/start_time-field
- /NXentry/start_time-field
- /NXevent_data_em/start_time-field
- /NXfluo/entry/start_time-field
- /NXindirecttof/entry/start_time-field
- /NXmonitor/start_time-field
- /NXmonopd/entry/start_time-field
- /NXmpes/ENTRY/start_time-field
- /NXmx/ENTRY/start_time-field
- /NXrefscan/entry/start_time-field
- /NXreftof/entry/start_time-field
- /NXsas/ENTRY/start_time-field
- /NXsastof/ENTRY/start_time-field
- /NXscan/ENTRY/start_time-field
- /NXsensor_scan/ENTRY/start_time-field
- /NXsnsevent/ENTRY/start_time-field
- /NXsnshisto/ENTRY/start_time-field
- /NXstxm/ENTRY/start_time-field
- /NXsubentry/start_time-field
- /NXtas/entry/start_time-field
- /NXtofnpd/entry/start_time-field
- /NXtofraw/entry/start_time-field
- /NXtofsingle/entry/start_time-field
- /NXtomo/entry/start_time-field
- /NXtomophase/entry/start_time-field
- /NXtransmission/ENTRY/start_time-field
- /NXxas/ENTRY/start_time-field
- /NXxbase/entry/start_time-field
- /NXxpcs/entry/start_time-field
- state
- /NXsample/state-field
- static_q_list
- /NXxpcs/entry/instrument/masks/static_q_list-field
- static_roi_map
- /NXxpcs/entry/instrument/masks/static_roi_map-field
- statistics
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/statistics-group
- /NXregion/statistics-group
- status
- /NXattenuator/status-field
- /NXbeam_stop/status-field
- /NXfilter/status-field
- /NXimage_set_em_kikuchi/oim/indexing/status-field
- step_size
- /NXimage_set_em_kikuchi/step_size-field
- stop_time
- /NXdetector/stop_time-field
- store_atomic_mass_sum
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/store_atomic_mass_sum-field
- store_charge_state
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/store_charge_state-field
- store_disjoint_isotopes
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/store_disjoint_isotopes-field
- store_natural_abundance_product
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/store_natural_abundance_product-field
- stress_field
- /NXarchive/entry/sample/stress_field-field
- /NXsample/stress_field-field
- stride
- /NXregion/stride-field
- stxm_scan_type
- /NXstxm/ENTRY/DATA/stxm_scan_type-field
- subentry
- /NXentry/SUBENTRY-group
- substrate_density
- /NXgrating/substrate_density-field
- /NXmirror/substrate_density-field
- substrate_material
- /NXfilter/substrate_material-field
- /NXgrating/substrate_material-field
- /NXguide/substrate_material-field
- /NXmirror/substrate_material-field
- /NXsample/substrate_material-field
- substrate_roughness
- /NXfilter/substrate_roughness-field
- /NXgrating/substrate_roughness-field
- /NXguide/substrate_roughness-field
- /NXmirror/substrate_roughness-field
- substrate_state
- /NXsample/substrate_state-field
- substrate_thickness
- /NXfilter/substrate_thickness-field
- /NXgrating/substrate_thickness-field
- /NXguide/substrate_thickness-field
- /NXmirror/substrate_thickness-field
- summary
- /NXspectrum_set_em_eels/summary-group
- /NXspectrum_set_em_xray/summary-group
- support_membrane_material
- /NXfresnel_zone_plate/support_membrane_material-field
- support_membrane_thickness
- /NXfresnel_zone_plate/support_membrane_thickness-field
- surface
- /NXguide/reflectivity/surface-field
- surface_area
- /NXcg_cylinder_set/surface_area-field
- /NXcg_ellipsoid_set/surface_area-field
- /NXcg_hexahedron_set/surface_area-field
- /NXcg_parallelogram_set/surface_area-field
- /NXcg_polyhedron_set/surface_area-field
- /NXcg_sphere_set/surface_area-field
- /NXcg_tetrahedron_set/surface_area-field
- surface_dopant
- /NXsample/surface_dopant-field
- surface_dopant_coverage
- /NXsample/surface_dopant_coverage-field
- surface_meshing
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing-group
- surface_type
- /NXquadric/surface_type-field
- symmetric
- /NXxraylens/symmetric-field
- symmetry
- /NXcg_grid/symmetry-field
- /NXdistortion/symmetry-field
- t
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T-field
- /NXcg_alpha_shape/t-group
- table
- /NXvelocity_selector/table-field
- taper
- /NXinsertion_device/taper-field
- target
- /NXspindispersion/target-field
- target_dcom_radius
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_dcom_radius-field
- target_edge_length
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_edge_length-field
- target_material
- /NXsource/target_material-field
- target_preparation
- /NXspindispersion/target_preparation-field
- target_preparation_date
- /NXspindispersion/target_preparation_date-field
- target_smoothing_step
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_smoothing_step-field
- target_value
- /NXpositioner/target_value-field
- tdev
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/Tdev-field
- technology
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
- /NXcs_io_obj/technology-field
- telephone_number
- /NXapm/ENTRY/USER/telephone_number-field
- /NXapm_paraprobe_results_ranger/ENTRY/USER/telephone_number-field
- /NXapm_paraprobe_results_transcoder/ENTRY/USER/telephone_number-field
- /NXellipsometry/ENTRY/USER/telephone_number-field
- /NXem/ENTRY/USER/telephone_number-field
- /NXsensor_scan/ENTRY/USER/telephone_number-field
- /NXtransmission/ENTRY/operator/telephone_number-field
- /NXuser/telephone_number-field
- temperature
- /NXarchive/entry/sample/temperature-field
- /NXarpes/ENTRY/SAMPLE/temperature-field
- /NXcanSAS/ENTRY/SAMPLE/temperature-field
- /NXcrystal/temperature-field
- /NXfilter/temperature-field
- /NXiv_temp/ENTRY/DATA/temperature-field
- /NXmoderator/temperature-field
- /NXmpes/ENTRY/SAMPLE/temperature-field
- /NXmx/ENTRY/SAMPLE/temperature-field
- /NXsample/temperature-field
- /NXsample/temperature-group
- /NXsnsevent/ENTRY/instrument/moderator/temperature-field
- /NXsnshisto/ENTRY/instrument/moderator/temperature-field
- /NXspe/ENTRY/SAMPLE/temperature-field
- /NXxbase/entry/sample/temperature-field
- /NXxpcs/entry/sample/temperature-field
- temperature_coefficient
- /NXcrystal/temperature_coefficient-field
- temperature_controller
- /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/temperature_controller-group
- temperature_env
- /NXsample/temperature_env-group
- temperature_log
- /NXcrystal/temperature_log-group
- /NXfilter/temperature_log-group
- /NXmoderator/temperature_log-group
- /NXsample/temperature_log-group
- temperature_set
- /NXxpcs/entry/sample/temperature_set-field
- temporal_resolution
- /NXinstrument/temporal_resolution-field
- term
- /NXcanSAS/ENTRY/PROCESS/term-field
- /NXparameters/term-field
- tessellating
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating-group
- tetrahedra
- /NXcg_tetrahedron_set/tetrahedra-group
- tetrahedron
- /NXcg_tetrahedron_set/tetrahedron-group
- tetrahedron_half_edge
- /NXcg_tetrahedron_set/tetrahedron_half_edge-group
- thickness
- /NXattenuator/thickness-field
- /NXcanSAS/ENTRY/SAMPLE/thickness-field
- /NXcrystal/thickness-field
- /NXellipsometry/ENTRY/INSTRUMENT/window/thickness-field
- /NXem/ENTRY/sample/thickness-field
- /NXfilter/thickness-field
- /NXflipper/thickness-field
- /NXsample/thickness-field
- threshold_distance
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/threshold_distance-field
- threshold_energy
- /NXdetector/threshold_energy-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/threshold_energy-field
- threshold_proximity
- /NXapm_paraprobe_config_intersector/ENTRY/PROCESS/PROCESS/threshold_proximity-field
- thumbnail
- /NXapm/ENTRY/thumbnail-group
- /NXem/ENTRY/thumbnail-group
- /NXentry/thumbnail-group
- /NXsubentry/thumbnail-group
- tilt
- /NXxnb/entry/name/tilt-link
- tilt_1
- /NXem/ENTRY/em_lab/stage_lab/tilt_1-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB/tilt_1-field
- /NXstage_lab/tilt_1-field
- tilt_2
- /NXem/ENTRY/em_lab/stage_lab/tilt_2-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB/tilt_2-field
- /NXstage_lab/tilt_2-field
- tilt_angle
- /NXxnb/entry/instrument/detector/tilt_angle-field
- tilt_correction
- /NXimage_set_em_se/tilt_correction-group
- time
- /NXcg_point_set/time-field
- /NXlog/time-field
- /NXms_snapshot/time-field
- /NXsnsevent/ENTRY/DASlogs/LOG/time-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field
- /NXsnshisto/ENTRY/DASlogs/LOG/time-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/time-field
- time_of_flight
- /NXdetector/time_of_flight-field
- /NXlauetof/entry/control/time_of_flight-field
- /NXlauetof/entry/instrument/detector/time_of_flight-field
- /NXlauetof/entry/name/time_of_flight-link
- /NXmonitor/time_of_flight-field
- /NXreftof/entry/control/time_of_flight-field
- /NXreftof/entry/data/time_of_flight-link
- /NXreftof/entry/instrument/detector/time_of_flight-field
- /NXsastof/ENTRY/control/time_of_flight-field
- /NXsastof/ENTRY/data/time_of_flight-link
- /NXsastof/ENTRY/instrument/detector/time_of_flight-field
- /NXsnsevent/ENTRY/MONITOR/time_of_flight-field
- /NXsnshisto/ENTRY/DATA/time_of_flight-link
- /NXsnshisto/ENTRY/MONITOR/time_of_flight-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/time_of_flight-field
- /NXtofnpd/entry/INSTRUMENT/detector/time_of_flight-field
- /NXtofnpd/entry/MONITOR/time_of_flight-field
- /NXtofnpd/entry/data/time_of_flight-link
- /NXtofraw/entry/MONITOR/time_of_flight-field
- /NXtofraw/entry/data/time_of_flight-link
- /NXtofraw/entry/instrument/detector/time_of_flight-field
- /NXtofsingle/entry/INSTRUMENT/detector/time_of_flight-field
- /NXtofsingle/entry/MONITOR/time_of_flight-field
- /NXtofsingle/entry/data/time_of_flight-link
- time_per_channel
- /NXarpes/ENTRY/INSTRUMENT/analyser/time_per_channel-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/time_per_channel-field
- time_points
- /NXellipsometry/ENTRY/SAMPLE/time_points-field
- /NXtransmission/ENTRY/instrument/time_points-field
- time_stamp
- /NXapm_paraprobe_config_clusterer/ENTRY/time_stamp-field
- /NXapm_paraprobe_config_distancer/ENTRY/time_stamp-field
- /NXapm_paraprobe_config_intersector/ENTRY/time_stamp-field
- /NXapm_paraprobe_config_nanochem/ENTRY/time_stamp-field
- /NXapm_paraprobe_config_ranger/ENTRY/time_stamp-field
- /NXapm_paraprobe_config_spatstat/ENTRY/time_stamp-field
- /NXapm_paraprobe_config_surfacer/ENTRY/time_stamp-field
- /NXapm_paraprobe_config_tessellator/ENTRY/time_stamp-field
- /NXapm_paraprobe_config_transcoder/ENTRY/time_stamp-field
- /NXapm_paraprobe_results_ranger/ENTRY/time_stamp-field
- /NXapm_paraprobe_results_transcoder/ENTRY/time_stamp-field
- time_zone
- /NXmx/ENTRY/INSTRUMENT/time_zone-field
- timing
- /NXelectrostatic_kicker/timing-field
- /NXmagnetic_kicker/timing-field
- title
- /NXarchive/entry/title-field
- /NXarpes/ENTRY/title-field
- /NXcanSAS/ENTRY/title-field
- /NXcxi_ptycho/entry_1/title-field
- /NXdata/title-field
- /NXdirecttof/entry/title-field
- /NXentry/title-field
- /NXfluo/entry/title-field
- /NXindirecttof/entry/title-field
- /NXiqproc/ENTRY/title-field
- /NXmonopd/entry/title-field
- /NXmpes/ENTRY/title-field
- /NXmx/ENTRY/title-field
- /NXrefscan/entry/title-field
- /NXreftof/entry/title-field
- /NXsas/ENTRY/title-field
- /NXsastof/ENTRY/title-field
- /NXscan/ENTRY/title-field
- /NXsnsevent/ENTRY/title-field
- /NXsnshisto/ENTRY/title-field
- /NXsource/bunch_pattern/title-field
- /NXsqom/ENTRY/title-field
- /NXstxm/ENTRY/title-field
- /NXsubentry/title-field
- /NXtas/entry/title-field
- /NXtofnpd/entry/title-field
- /NXtofraw/entry/title-field
- /NXtofsingle/entry/title-field
- /NXtomo/entry/title-field
- /NXtomophase/entry/title-field
- /NXtomoproc/entry/title-field
- /NXxas/ENTRY/title-field
- /NXxasproc/ENTRY/title-field
- /NXxbase/entry/title-field
- tof_calibration
- /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/tof_calibration-group
- tof_distance
- /NXenergydispersion/tof_distance-field
- tolerance
- /NXpositioner/tolerance-field
- top_dead_center
- /NXdisk_chopper/top_dead_center-field
- top_up
- /NXsource/top_up-field
- total_counts
- /NXsnsevent/ENTRY/instrument/DETECTOR/total_counts-field
- /NXsnsevent/ENTRY/total_counts-field
- /NXsnshisto/ENTRY/DATA/total_counts-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/total_counts-field
- /NXsnshisto/ENTRY/total_counts-field
- total_elapsed_time
- /NXapm_paraprobe_results_ranger/ENTRY/performance/total_elapsed_time-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/total_elapsed_time-field
- /NXcs_profiling/total_elapsed_time-field
- total_flux
- /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux-field
- total_physical_memory
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_MM_SYS/total_physical_memory-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_MM_SYS/total_physical_memory-field
- /NXcs_mm_sys/total_physical_memory-field
- total_uncounted_counts
- /NXsnsevent/ENTRY/total_uncounted_counts-field
- /NXsnshisto/ENTRY/total_uncounted_counts-field
- transformations
- /NXaperture/TRANSFORMATIONS-group
- /NXaperture_em/TRANSFORMATIONS-group
- /NXapm/ENTRY/COORDINATE_SYSTEM_SET/TRANSFORMATIONS-group
- /NXapm_paraprobe_results_ranger/ENTRY/COORDINATE_SYSTEM_SET/TRANSFORMATIONS-group
- /NXapm_paraprobe_results_transcoder/ENTRY/COORDINATE_SYSTEM_SET/TRANSFORMATIONS-group
- /NXattenuator/TRANSFORMATIONS-group
- /NXbeam/TRANSFORMATIONS-group
- /NXbeam_stop/TRANSFORMATIONS-group
- /NXbending_magnet/TRANSFORMATIONS-group
- /NXcapillary/TRANSFORMATIONS-group
- /NXcg_cylinder_set/TRANSFORMATIONS-group
- /NXcg_ellipsoid_set/TRANSFORMATIONS-group
- /NXcg_geodesic_mesh/TRANSFORMATIONS-group
- /NXcg_grid/TRANSFORMATIONS-group
- /NXcg_hexahedron_set/TRANSFORMATIONS-group
- /NXcg_parallelogram_set/TRANSFORMATIONS-group
- /NXcg_point_set/TRANSFORMATIONS-group
- /NXcg_polyhedron_set/TRANSFORMATIONS-group
- /NXcg_polyline_set/TRANSFORMATIONS-group
- /NXcg_sphere_set/TRANSFORMATIONS-group
- /NXcg_tetrahedron_set/TRANSFORMATIONS-group
- /NXcg_triangle_set/TRANSFORMATIONS-group
- /NXcollectioncolumn/TRANSFORMATIONS-group
- /NXcollimator/TRANSFORMATIONS-group
- /NXcoordinate_system_set/TRANSFORMATIONS-group
- /NXcorrector_cs/TRANSFORMATIONS-group
- /NXcrystal/TRANSFORMATIONS-group
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations-group
- /NXcxi_ptycho/sample_1/transformations-group
- /NXdeflector/TRANSFORMATIONS-group
- /NXdetector/TRANSFORMATIONS-group
- /NXdisk_chopper/TRANSFORMATIONS-group
- /NXebeam_column/electron_gun/TRANSFORMATIONS-group
- /NXelectronanalyser/TRANSFORMATIONS-group
- /NXellipsometry/ENTRY/INSTRUMENT/stage/TRANSFORMATIONS-group
- /NXem/ENTRY/COORDINATE_SYSTEM_SET/TRANSFORMATIONS-group
- /NXenvironment/TRANSFORMATIONS-group
- /NXfermi_chopper/TRANSFORMATIONS-group
- /NXfilter/TRANSFORMATIONS-group
- /NXflipper/TRANSFORMATIONS-group
- /NXfresnel_zone_plate/TRANSFORMATIONS-group
- /NXgrating/TRANSFORMATIONS-group
- /NXguide/TRANSFORMATIONS-group
- /NXibeam_column/ion_gun/TRANSFORMATIONS-group
- /NXinsertion_device/TRANSFORMATIONS-group
- /NXlens_em/TRANSFORMATIONS-group
- /NXmanipulator/TRANSFORMATIONS-group
- /NXmirror/TRANSFORMATIONS-group
- /NXmoderator/TRANSFORMATIONS-group
- /NXmonitor/TRANSFORMATIONS-group
- /NXmonochromator/TRANSFORMATIONS-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/TRANSFORMATIONS-group
- /NXmx/ENTRY/SAMPLE/TRANSFORMATIONS-group
- /NXorientation_set/TRANSFORMATIONS-group
- /NXpinhole/TRANSFORMATIONS-group
- /NXpolarizer/TRANSFORMATIONS-group
- /NXpositioner/TRANSFORMATIONS-group
- /NXpulser_apm/laser_gun/TRANSFORMATIONS-group
- /NXreflectron/TRANSFORMATIONS-group
- /NXregistration/TRANSFORMATIONS-group
- /NXsample/TRANSFORMATIONS-group
- /NXsensor/TRANSFORMATIONS-group
- /NXslit/TRANSFORMATIONS-group
- /NXsource/TRANSFORMATIONS-group
- /NXspindispersion/TRANSFORMATIONS-group
- /NXstage_lab/TRANSFORMATIONS-group
- /NXvelocity_selector/TRANSFORMATIONS-group
- /NXxraylens/TRANSFORMATIONS-group
- translation
- /NXcxi_ptycho/data_1/translation-link
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation-field
- /NXcxi_ptycho/sample_1/geometry_1/translation-link
- /NXgeometry/TRANSLATION-group
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation-group
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation-group
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation-group
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation-group
- transmission
- /NXcanSAS/ENTRY/SAMPLE/transmission-field
- /NXcapillary/transmission-group
- /NXcrystal/transmission-group
- /NXfilter/transmission-group
- /NXsample/transmission-group
- /NXsample_component/transmission-group
- transmission_spectrum
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM-group
- transmitting_material
- /NXcollimator/transmitting_material-field
- /NXfermi_chopper/transmitting_material-field
- triangle_soup
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup-group
- triangles
- /NXcg_triangle_set/triangles-group
- triangulation
- /NXcg_alpha_shape/triangulation-group
- trigger_dead_time
- /NXdetector/trigger_dead_time-field
- trigger_delay_time
- /NXdetector/trigger_delay_time-field
- trigger_delay_time_set
- /NXdetector/trigger_delay_time_set-field
- trigger_internal_delay_time
- /NXdetector/trigger_internal_delay_time-field
- turbomolecular_pump
- /NXapm/ENTRY/atom_probe/turbomolecular_pump-group
- twist
- /NXvelocity_selector/twist-field
- two_time_corr_func
- /NXxpcs/entry/twotime/two_time_corr_func-field
- twotime
- /NXxpcs/entry/twotime-group
- type
- /NXapm/ENTRY/atom_probe/ion_detector/type-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/random_number_generator/type-field
- /NXarchive/entry/instrument/SOURCE/type-field
- /NXarchive/entry/sample/type-field
- /NXarpes/ENTRY/INSTRUMENT/SOURCE/type-field
- /NXattenuator/type-field
- /NXcapillary/type-field
- /NXcollimator/type-field
- /NXcrystal/type-field
- /NXcs_prng/type-field
- /NXcxi_ptycho/entry_1/instrument_1/source_1/type-field
- /NXdeflector/type-field
- /NXdetector/type-field
- /NXdisk_chopper/type-field
- /NXem/ENTRY/em_lab/DETECTOR/type-field
- /NXenvironment/type-field
- /NXfermi_chopper/type-field
- /NXflipper/type-field
- /NXfluo/entry/INSTRUMENT/SOURCE/type-field
- /NXinsertion_device/type-field
- /NXiqproc/ENTRY/instrument/SOURCE/type-field
- /NXlens_em/type-field
- /NXmanipulator/type-field
- /NXmirror/type-field
- /NXmoderator/type-field
- /NXmonitor/type-field
- /NXmonopd/entry/INSTRUMENT/SOURCE/type-field
- /NXmpes/ENTRY/INSTRUMENT/SOURCE/type-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/type-field
- /NXnote/type-field
- /NXpolarizer/type-field
- /NXrefscan/entry/instrument/SOURCE/type-field
- /NXsample/type-field
- /NXsas/ENTRY/instrument/source/type-field
- /NXsastof/ENTRY/instrument/source/type-field
- /NXsensor/type-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/type-field
- /NXsnsevent/ENTRY/instrument/SNS/type-field
- /NXsnsevent/ENTRY/instrument/moderator/type-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/type-field
- /NXsnshisto/ENTRY/instrument/SNS/type-field
- /NXsnshisto/ENTRY/instrument/moderator/type-field
- /NXsource/type-field
- /NXspindispersion/type-field
- /NXsqom/ENTRY/instrument/SOURCE/type-field
- /NXstxm/ENTRY/INSTRUMENT/SOURCE/type-field
- /NXtomo/entry/instrument/SOURCE/type-field
- /NXtomophase/entry/instrument/SOURCE/type-field
- /NXtomoproc/entry/INSTRUMENT/SOURCE/type-field
- /NXtransmission/ENTRY/instrument/DETECTOR/slit/type-field
- /NXtransmission/ENTRY/instrument/DETECTOR/type-field
- /NXtransmission/ENTRY/instrument/SOURCE/type-field
- /NXvelocity_selector/type-field
- /NXxas/ENTRY/INSTRUMENT/SOURCE/type-field
- /NXxbase/entry/instrument/source/type-field
- ub_matrix
- /NXsample/ub_matrix-field
- unassigned
- /NXclustering/unassigned-field
- underload_value
- /NXdetector/underload_value-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/underload_value-field
- unit_cell
- /NXcrystal/unit_cell-field
- /NXlauetof/entry/sample/unit_cell-field
- /NXsample/unit_cell-field
- /NXtas/entry/SAMPLE/unit_cell-field
- /NXxbase/entry/sample/unit_cell-field
- unit_cell_a
- /NXcrystal/unit_cell_a-field
- /NXfilter/unit_cell_a-field
- unit_cell_abc
- /NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_abc-field
- /NXsample/unit_cell_abc-field
- /NXsample_component/unit_cell_abc-field
- unit_cell_alpha
- /NXcrystal/unit_cell_alpha-field
- /NXfilter/unit_cell_alpha-field
- unit_cell_alphabetagamma
- /NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_alphabetagamma-field
- /NXsample/unit_cell_alphabetagamma-field
- /NXsample_component/unit_cell_alphabetagamma-field
- unit_cell_b
- /NXcrystal/unit_cell_b-field
- /NXfilter/unit_cell_b-field
- unit_cell_beta
- /NXcrystal/unit_cell_beta-field
- /NXfilter/unit_cell_beta-field
- unit_cell_c
- /NXcrystal/unit_cell_c-field
- /NXfilter/unit_cell_c-field
- unit_cell_class
- /NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_class-field
- /NXsample/unit_cell_class-field
- /NXsample_component/unit_cell_class-field
- unit_cell_gamma
- /NXcrystal/unit_cell_gamma-field
- /NXfilter/unit_cell_gamma-field
- unit_cell_volume
- /NXcrystal/unit_cell_volume-field
- /NXfilter/unit_cell_volume-field
- /NXsample/unit_cell_volume-field
- /NXsample_component/unit_cell_volume-field
- upper_cap_radius
- /NXcg_cylinder_set/upper_cap_radius-field
- url
- /NXcite/url-field
- /NXtransmission/ENTRY/operator/url-field
- usage
- /NXcrystal/usage-field
- use_existent_ranging
- /NXapm_paraprobe_results_ranger/ENTRY/PROCESS/use_existent_ranging-group
- user
- /NXapm/ENTRY/USER-group
- /NXapm_paraprobe_results_ranger/ENTRY/USER-group
- /NXapm_paraprobe_results_transcoder/ENTRY/USER-group
- /NXarchive/entry/user-group
- /NXellipsometry/ENTRY/USER-group
- /NXem/ENTRY/USER-group
- /NXem/ENTRY/measurement/EVENT_DATA_EM/USER-group
- /NXentry/USER-group
- /NXevent_data_em/em_lab/USER-group
- /NXmpes/ENTRY/USER-group
- /NXsensor_scan/ENTRY/USER-group
- /NXsnsevent/ENTRY/USER-group
- /NXsnshisto/ENTRY/USER-group
- /NXsubentry/USER-group
- /NXtofnpd/entry/user-group
- /NXtofraw/entry/user-group
- /NXtofsingle/entry/user-group
- uuid
- /NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/uuid-field
- /NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/uuid-field
- /NXcs_computer/uuid-field
- value
- /NXaperture_em/value-field
- /NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/value-field
- /NXelectrostatic_kicker/read_current/value-field
- /NXelectrostatic_kicker/read_voltage/value-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/value-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/value-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM/value-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/value-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/APERTURE_EM/value-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/LENS_EM/value-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/APERTURE_EM/value-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/LENS_EM/value-field
- /NXlens_em/value-field
- /NXlog/value-field
- /NXmagnetic_kicker/read_current/value-field
- /NXmagnetic_kicker/read_voltage/value-field
- /NXorientation/value-field
- /NXpid/pv_sensor/value_log/value-field
- /NXpositioner/value-field
- /NXquadrupole_magnet/read_current/value-field
- /NXquadrupole_magnet/read_voltage/value-field
- /NXsensor/value-field
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value-field
- /NXseparator/read_Bfield_current/value-field
- /NXseparator/read_Bfield_voltage/value-field
- /NXseparator/read_Efield_current/value-field
- /NXseparator/read_Efield_voltage/value-field
- /NXsnsevent/ENTRY/DASlogs/LOG/value-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation/value-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation/value-field
- /NXsnshisto/ENTRY/DASlogs/LOG/value-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/value-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation/value-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation/value-field
- /NXsolenoid_magnet/read_current/value-field
- /NXsolenoid_magnet/read_voltage/value-field
- /NXspin_rotator/read_Bfield_current/value-field
- /NXspin_rotator/read_Bfield_voltage/value-field
- /NXspin_rotator/read_Efield_current/value-field
- /NXspin_rotator/read_Efield_voltage/value-field
- value_deriv1
- /NXsensor/value_deriv1-field
- value_deriv1_log
- /NXsensor/value_deriv1_log-group
- value_deriv2
- /NXsensor/value_deriv2-field
- value_deriv2_log
- /NXsensor/value_deriv2_log-group
- value_log
- /NXpid/pv_sensor/value_log-group
- /NXsensor/value_log-group
- value_timestamp
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value_timestamp-field
- variable
- /NXdata/VARIABLE-field
- /NXiqproc/ENTRY/DATA/variable-field
- variable_errors
- /NXdata/VARIABLE_errors-field
- variable_revolution
- /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/variable_revolution-field
- varied_parameters
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/varied_parameters-field
- vector
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations/vector-field
- velocity
- /NXpositioner/velocity-field
- velocity_selector
- /NXinstrument/VELOCITY_SELECTOR-group
- /NXmonochromator/VELOCITY_SELECTOR-group
- vendor
- /NXfabrication/vendor-field
- /NXsample/vendor-field
- version
- /NXcg_alpha_shape/version-field
- /NXellipsometry/ENTRY/acquisition_program/version-field
- /NXiqproc/ENTRY/reduction/version-field
- /NXprocess/version-field
- /NXsnsevent/ENTRY/SNSHistoTool/version-field
- /NXsnshisto/ENTRY/SNSHistoTool/version-field
- /NXsqom/ENTRY/reduction/version-field
- /NXtomoproc/entry/reconstruction/version-field
- /NXxasproc/ENTRY/XAS_data_reduction/version-field
- vertex_identifier
- /NXcg_face_list_data_structure/vertex_identifier-field
- vertex_identifier_offset
- /NXcg_face_list_data_structure/vertex_identifier_offset-field
- /NXcg_half_edge_data_structure/vertex_identifier_offset-field
- vertex_incident_half_edge
- /NXcg_half_edge_data_structure/vertex_incident_half_edge-field
- vertex_normal
- /NXcg_hexahedron_set/vertex_normal-group
- /NXcg_parallelogram_set/vertex_normal-group
- /NXcg_polygon_set/vertex_normal-group
- /NXcg_polyhedron_set/vertex_normal-group
- /NXcg_polyline_set/vertex_normal-group
- /NXcg_tetrahedron_set/vertex_normal-group
- /NXcg_triangle_set/vertex_normal-group
- vertices
- /NXcg_face_list_data_structure/vertices-field
- /NXcg_polyline_set/vertices-field
- /NXcylindrical_geometry/vertices-field
- /NXoff_geometry/vertices-field
- vertices_are_unique
- /NXcg_face_list_data_structure/vertices_are_unique-field
- /NXcg_polyline_set/vertices_are_unique-field
- visualization
- /NXapm_paraprobe_results_transcoder/ENTRY/visualization-group
- voltage
- /NXdeflector/voltage-field
- /NXebeam_column/electron_gun/voltage-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/voltage-field
- /NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_gun/voltage-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/voltage-field
- /NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_gun/voltage-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/LENS_EM/voltage-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/electron_gun/voltage-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/LENS_EM/voltage-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_gun/voltage-field
- /NXibeam_column/ion_gun/voltage-field
- /NXiv_temp/ENTRY/DATA/voltage-field
- /NXlens_em/voltage-field
- /NXsource/voltage-field
- voltage_and_bowl_correction
- /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction-group
- voltage_controller
- /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/voltage_controller-group
- volume
- /NXcg_cylinder_set/volume-field
- /NXcg_ellipsoid_set/volume-field
- /NXcg_hexahedron_set/volume-field
- /NXcg_polyhedron_set/volume-field
- /NXcg_sphere_set/volume-field
- /NXcg_tetrahedron_set/volume-field
- volume_fraction
- /NXsample/volume_fraction-field
- /NXsample_component/volume_fraction-field
- warmup
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/ion_to_feature_distances/random_number_generator/warmup-field
- /NXcs_prng/warmup-field
- wavelength
- /NXapm/ENTRY/atom_probe/pulser/laser_gun/wavelength-field
- /NXcrystal/wavelength-field
- /NXdetector/efficiency/wavelength-field
- /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/wavelength-field
- /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/wavelength-field
- /NXfermi_chopper/wavelength-field
- /NXfluo/entry/INSTRUMENT/monochromator/wavelength-field
- /NXguide/reflectivity/wavelength-field
- /NXmonochromator/wavelength-field
- /NXmonopd/entry/INSTRUMENT/CRYSTAL/wavelength-field
- /NXpulser_apm/laser_gun/wavelength-field
- /NXrefscan/entry/instrument/monochromator/wavelength-field
- /NXsas/ENTRY/instrument/monochromator/wavelength-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/wavelength-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/wavelength-field
- /NXtransmission/ENTRY/instrument/spectrometer/wavelength-field
- /NXvelocity_selector/wavelength-field
- /NXxbase/entry/instrument/monochromator/wavelength-field
- /NXxlaue/entry/instrument/source/distribution/wavelength-field
- wavelength_error
- /NXmonochromator/wavelength_error-field
- wavelength_errors
- /NXmonochromator/wavelength_errors-field
- wavelength_max
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_max-field
- wavelength_min
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_min-field
- wavelength_range
- /NXdisk_chopper/wavelength_range-field
- /NXtransmission/ENTRY/instrument/DETECTOR/wavelength_range-field
- /NXtransmission/ENTRY/instrument/SOURCE/wavelength_range-field
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING/wavelength_range-field
- wavelength_spread
- /NXsas/ENTRY/instrument/monochromator/wavelength_spread-field
- /NXvelocity_selector/wavelength_spread-field
- weight
- /NXdelocalization/weight-field
- weighting_model
- /NXdelocalization/weighting_model-field
- weinberg_vector
- /NXcg_half_edge_data_structure/weinberg_vector-field
- width
- /NXcg_hexahedron_set/width-field
- /NXcg_parallelogram_set/width-field
- /NXfermi_chopper/width-field
- /NXvelocity_selector/width-field
- winding_order
- /NXcg_face_list_data_structure/winding_order-field
- /NXoff_geometry/winding_order-field
- window
- /NXellipsometry/ENTRY/INSTRUMENT/window-group
- windowing_method
- /NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/spatial_filter/windowing_method-field
- /NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/windowing_method-field
- /NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/windowing_method-field
- /NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/windowing_method-field
- /NXapm_paraprobe_config_ranger/ENTRY/PROCESS/range_with_existent_iontypes/spatial_filter/windowing_method-field
- /NXapm_paraprobe_config_spatstat/ENTRY/spatial_statistics/spatial_filter/windowing_method-field
- /NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/windowing_method-field
- /NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/windowing_method-field
- /NXspatial_filter/windowing_method-field
- working_distance
- /NXcapillary/working_distance-field
- /NXcollectioncolumn/working_distance-field
- /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/working_distance-field
- /NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/working_distance-field
- /NXoptical_system_em/working_distance-field
- x
- /NXbeam_stop/x-field
- /NXcxi_ptycho/DATA/x-link
- /NXdata/x-field
- /NXtomoproc/entry/data/x-field
- x_gap
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/x_gap-field
- /NXslit/x_gap-field
- x_indices
- /NXcxi_ptycho/DATA/x_indices-field
- x_pixel_offset
- /NXdetector/x_pixel_offset-field
- /NXsnsevent/ENTRY/DATA/x_pixel_offset-link
- /NXsnsevent/ENTRY/instrument/APERTURE/x_pixel_offset-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/x_pixel_offset-field
- /NXsnshisto/ENTRY/DATA/x_pixel_offset-link
- /NXsnshisto/ENTRY/instrument/APERTURE/x_pixel_offset-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/x_pixel_offset-field
- x_pixel_size
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size-field
- /NXdetector/x_pixel_size-field
- /NXlauetof/entry/instrument/detector/x_pixel_size-field
- /NXreftof/entry/instrument/detector/x_pixel_size-field
- /NXsas/ENTRY/instrument/detector/x_pixel_size-field
- /NXsastof/ENTRY/instrument/detector/x_pixel_size-field
- /NXtomo/entry/instrument/detector/x_pixel_size-field
- /NXtomophase/entry/instrument/sample/x_pixel_size-field
- /NXxbase/entry/instrument/detector/x_pixel_size-field
- /NXxpcs/entry/instrument/DETECTOR/x_pixel_size-field
- x_position
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_position-field
- /NXcanSAS/ENTRY/SAMPLE/x_position-field
- x_rotation_axis_pixel_position
- /NXtomo/entry/instrument/detector/x_rotation_axis_pixel_position-field
- x_translation
- /NXsample/x_translation-field
- /NXtomo/entry/sample/x_translation-field
- /NXtomophase/entry/sample/x_translation-field
- /NXxbase/entry/sample/x_translation-field
- xas_data_reduction
- /NXxasproc/ENTRY/XAS_data_reduction-group
- xdmf_topology
- /NXapm_paraprobe_results_transcoder/ENTRY/visualization/xdmf_topology-field
- xpos
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/xpos-field
- /NXimage_set_em_adf/stack/xpos-field
- /NXimage_set_em_kikuchi/DATA/xpos-field
- /NXimage_set_em_se/DATA/xpos-field
- /NXspectrum_set_em_eels/stack/xpos-field
- /NXspectrum_set_em_xray/indexing/composition_map/DATA/xpos-field
- /NXspectrum_set_em_xray/stack/xpos-field
- xraylens
- /NXinstrument/XRAYLENS-group
- y
- /NXbeam_stop/y-field
- /NXcxi_ptycho/DATA/y-link
- /NXdata/y-field
- /NXtomoproc/entry/data/y-field
- y_gap
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/y_gap-field
- /NXslit/y_gap-field
- /NXtransmission/ENTRY/instrument/common_beam_mask/y_gap-field
- y_indices
- /NXcxi_ptycho/DATA/y_indices-field
- y_pixel_offset
- /NXdetector/y_pixel_offset-field
- /NXsnsevent/ENTRY/DATA/y_pixel_offset-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/y_pixel_offset-field
- /NXsnshisto/ENTRY/DATA/y_pixel_offset-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/y_pixel_offset-field
- y_pixel_size
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size-field
- /NXdetector/y_pixel_size-field
- /NXlauetof/entry/instrument/detector/y_pixel_size-field
- /NXreftof/entry/instrument/detector/y_pixel_size-field
- /NXsas/ENTRY/instrument/detector/y_pixel_size-field
- /NXsastof/ENTRY/instrument/detector/y_pixel_size-field
- /NXtomo/entry/instrument/detector/y_pixel_size-field
- /NXtomophase/entry/instrument/sample/y_pixel_size-field
- /NXxbase/entry/instrument/detector/y_pixel_size-field
- /NXxpcs/entry/instrument/DETECTOR/y_pixel_size-field
- y_position
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_position-field
- /NXcanSAS/ENTRY/SAMPLE/y_position-field
- y_rotation_axis_pixel_position
- /NXtomo/entry/instrument/detector/y_rotation_axis_pixel_position-field
- y_translation
- /NXtomo/entry/sample/y_translation-field
- /NXtomophase/entry/sample/y_translation-field
- /NXxbase/entry/sample/y_translation-field
- yaw
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/yaw-field
- /NXcanSAS/ENTRY/SAMPLE/yaw-field
- ypos
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/ypos-field
- /NXimage_set_em_adf/stack/ypos-field
- /NXimage_set_em_kikuchi/DATA/ypos-field
- /NXimage_set_em_se/DATA/ypos-field
- /NXspectrum_set_em_eels/stack/ypos-field
- /NXspectrum_set_em_xray/indexing/composition_map/DATA/ypos-field
- /NXspectrum_set_em_xray/stack/ypos-field
- z
- /NXdata/z-field
- /NXtomoproc/entry/data/z-field
- z_pixel_offset
- /NXdetector/z_pixel_offset-field
- z_translation
- /NXtomo/entry/sample/z_translation-field
- /NXtomophase/entry/sample/z_translation-field
- zone_height
- /NXfresnel_zone_plate/zone_height-field
- zone_material
- /NXfresnel_zone_plate/zone_material-field
- zone_support_material
- /NXfresnel_zone_plate/zone_support_material-field
- zpos
- /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/zpos-field
written: 2022-09-16T10:34:37.015623