.. auto-generated by script ../../../../utils/nxdl2rst.py from the NXDL source NXmpes_ARPES.nxdl.xml .. index:: ! NXmpes_ARPES (application definition) ! mpes_ARPES (application definition) see: mpes_ARPES (application definition); NXmpes_ARPES .. _NXmpes_ARPES: ============ NXmpes_ARPES ============ **Status**: application definition, extends :ref:`NXobject` **Description**: This is the most general application definition for multidimensional ARPES. **Symbols**: The symbols used in the schema to specify e.g. dimensions of arrays **nfa** **nsa** **nx** **ne** **Groups cited**: :ref:`NXaperture`, :ref:`NXbeam`, :ref:`NXcalibration`, :ref:`NXcollectioncolumn`, :ref:`NXdata`, :ref:`NXdetector`, :ref:`NXdistortion`, :ref:`NXelectronanalyser`, :ref:`NXenergydispersion`, :ref:`NXentry`, :ref:`NXinstrument`, :ref:`NXnote`, :ref:`NXprocess`, :ref:`NXsample`, :ref:`NXsource` .. index:: NXentry (base class); used in application definition, NXinstrument (base class); used in application definition, NXsource (base class); used in application definition, NXbeam (base class); used in application definition, NXelectronanalyser (base class); used in application definition, NXcollectioncolumn (base class); used in application definition, NXenergydispersion (base class); used in application definition, NXaperture (base class); used in application definition, NXdetector (base class); used in application definition, NXdata (base class); used in application definition, NXprocess (base class); used in application definition, NXdistortion (base class); used in application definition, NXcalibration (base class); used in application definition, NXsample (base class); used in application definition, NXnote (base class); used in application definition **Structure**: .. _/NXmpes_ARPES/ENTRY-group: **ENTRY**: (required) :ref:`NXentry` .. _/NXmpes_ARPES/ENTRY@entry-attribute: .. index:: entry (group attribute) **@entry**: (required) :ref:`NX_CHAR ` NeXus convention is to use "entry1", "entry2", for analysis software to locate each entry. .. _/NXmpes_ARPES/ENTRY@default-attribute: .. index:: default (group attribute) **@default**: (optional) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/title-field: .. index:: title (field) **title**: (required) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/start_time-field: .. index:: start_time (field) **start_time**: (required) :ref:`NX_DATE_TIME ` ISO8601 formatted date time of the start of the measurement. .. _/NXmpes_ARPES/ENTRY/definition-field: .. index:: definition (field) **definition**: (required) :ref:`NX_CHAR ` Any of these values: ``NXmpes`` | ``NXmpes_ARPES`` .. _/NXmpes_ARPES/ENTRY/definition@version-attribute: .. index:: version (field attribute) **@version**: (required) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT-group: **INSTRUMENT**: (required) :ref:`NXinstrument` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/SOURCE-group: **SOURCE**: (required) :ref:`NXsource` The source used to generate the primary photons. Properties refer strictly to parameters of the source, not of the output beam. For example, the energy of the source is not the optical power of the beam, but the energy of the electron beam in a synchrotron and so on. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/SOURCE/type-field: .. index:: type (field) **type**: (required) :ref:`NX_CHAR ` Any of these values: * ``Synchrotron X-ray Source`` * ``Rotating Anode X-ray`` * ``Fixed Tube X-ray`` * ``UV Laser`` * ``Free-Electron Laser`` * ``Optical Laser`` * ``UV Plasma Source`` * ``Metal Jet X-ray`` * ``HHG laser`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/SOURCE/name-field: .. index:: name (field) **name**: (required) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/SOURCE/probe-field: .. index:: probe (field) **probe**: (required) :ref:`NX_CHAR ` Type of probe. In photoemission it's always photons, so the full NIAC list is restricted. Any of these values: ``x-ray`` | ``ultraviolet`` | ``visible light`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM-group: **BEAM**: (required) :ref:`NXbeam` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/distance-field: .. index:: distance (field) **distance**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_LENGTH `} Distance of the point of evaluation of the beam from the sample surface. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_energy-field: .. index:: incident_energy (field) **incident_energy**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ENERGY `} In the case of a monchromatic beam this is the scalar energy. Several other use cases are permitted, depending on the presence of other incident_energy_X fields. In the case of a polychromatic beam this is an array of length m of energies, with the relative weights in incident_energy_weights. In the case of a monochromatic beam that varies shot-to-shot, this is an array of energies, one for each recorded shot. Here, incident_energy_weights and incident_energy_spread are not set. In the case of a polychromatic beam that varies shot-to-shot, this is an array of length m with the relative weights in incident_energy_weights as a 2D array. In the case of a polychromatic beam that varies shot-to-shot and where the channels also vary, this is a 2D array of dimensions nP by m (slow to fast) with the relative weights in incident_energy_weights as a 2D array. Note, variants are a good way to represent several of these use cases in a single dataset, e.g. if a calibrated, single-value energy value is available along with the original spectrum from which it was calibrated. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_energy_spread-field: .. index:: incident_energy_spread (field) **incident_energy_spread**: (recommended) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ENERGY `} The energy spread FWHM for the corresponding energy(ies) in incident_energy. In the case of shot-to-shot variation in the energy spread, this is a 2D array of dimension nP by m (slow to fast) of the spreads of the corresponding energy in incident_energy. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_energy_weights-field: .. index:: incident_energy_weights (field) **incident_energy_weights**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ENERGY `} In the case of a polychromatic beam this is an array of length m of the relative weights of the corresponding energies in incident_energy. In the case of a polychromatic beam that varies shot-to-shot, this is a 2D array of dimensions np by m (slow to fast) of the relative weights of the corresponding energies in incident_energy. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_polarization-field: .. index:: incident_polarization (field) **incident_polarization[4]**: (recommended) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ANY `} Incident polarization specified as a Stokes vector. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_polarization@units-attribute: .. index:: units (field attribute) **@units**: (required) :ref:`NX_CHAR ` The units for this observable are not included in the NIAC list. Responsibility on correct formatting and parsing is handed to the user by using 'NX_ANY'. Correct parsing can still be implemented by using this attribute. Fill with: The unit unidata symbol if the unit has one (Example: 'T' for the unit of magnetic flux density tesla). The unit unidata name if the unit has a name (Example: 'farad' for capacitance). A string describing the units according to unidata unit operation notation, if the unit is a complex combination of named units and does not have a name. Example: for lightsource brilliance (SI) '1/(s.mm2.mrad2)'. Here: SI units are 'V2/m2'. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER-group: **ELECTRONANALYSER**: (required) :ref:`NXelectronanalyser` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field: .. index:: description (field) **description**: (required) :ref:`NX_CHAR ` Free text description of the type of detector. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-field: .. index:: energy_resolution (field) **energy_resolution**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ENERGY `} Energy resolution of the analyser with the current setting. May be linked from a NXcalibration. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/angular_resolution-field: .. index:: angular_resolution (field) **angular_resolution**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ANGLE `} Angular resolution of the analyser with the current setting. May be linked from a NXcalibration. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field: .. index:: fast_axes (field) **fast_axes[nfa]**: (optional) :ref:`NX_CHAR ` List of the axes that are acquired symultaneously by the detector. These refer only to the experimental variables recorded by the electron analyser. Other variables such as temperature, manipulator angles etc. are labeled as fast or slow in the data. Examples: Hemispherical in ARPES mode: fast_axes: [energy,kx] Hemispherical with channeltron, sweeping energy mode: slow_axes: [energy] Tof: fast_axes: [energy, kx, ky] Momentum microscope, spin-resolved: fast_axes: [energy, kx, ky] slow_axes: [spin up-down, spin left-right] axes can be less abstract than this, i.e. [detector_x, detector_y] If energy_scan_mode=sweep, fast_axes: [energy, kx]; slow_axes: [energy] is allowed. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field: .. index:: slow_axes (field) **slow_axes[nsa]**: (optional) :ref:`NX_CHAR ` List of the axes that are acquired by scanning a physical parameter, listed in order of decreasing speed. See fast_axes for examples. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group: **COLLECTIONCOLUMN**: (required) :ref:`NXcollectioncolumn` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field: .. index:: scheme (field) **scheme**: (required) :ref:`NX_CHAR ` Scheme of the electron collection column. Any of these values: * ``Standard`` * ``Deflector`` * ``PEEM`` * ``Momentum Microscope`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/mode-field: .. index:: mode (field) **mode**: (recommended) :ref:`NX_CHAR ` Labelling of the lens setting in use. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field: .. index:: projection (field) **projection**: (recommended) :ref:`NX_CHAR ` The space projected in the angularly dispersive directions, i.e. real or reciprocal. Any of these values: ``real`` | ``reciprocal`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group: **ENERGYDISPERSION**: (required) :ref:`NXenergydispersion` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field: .. index:: scheme (field) **scheme**: (required) :ref:`NX_CHAR ` Energy dispersion scheme employed. Any of these values: * ``tof`` * ``hemispherical`` * ``double hemispherical`` * ``cylindrical mirror`` * ``display mirror`` * ``retarding grid`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field: .. index:: pass_energy (field) **pass_energy**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ENERGY `} energy of the electrons on the mean path of the analyser. Pass energy for hemispherics, drift energy for tofs. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field: .. index:: energy_scan_mode (field) **energy_scan_mode**: (required) :ref:`NX_CHAR ` Way of scanning the energy axis (fixed or sweep). Any of these values: ``fixed`` | ``sweep`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/APERTURE-group: **APERTURE**: (recommended) :ref:`NXaperture` Aperture generating the momentum and/or energy filtering. .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/APERTURE/description-field: .. index:: description (field) **description**: (required) :ref:`NX_CHAR ` Type of aperture inserted in the beam. Any of these values: ``slit`` | ``pinhole`` | ``iris`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/APERTURE/shape-field: .. index:: shape (field) **shape**: (required) :ref:`NX_CHAR ` Description of the shape of the active part of the aperture, curved or straight for horizontal slits, square or round for pinhole etc. Any of these values: * ``curved`` * ``straight`` * ``circle`` * ``square`` * ``hexagon`` * ``octagon`` * ``bladed`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/APERTURE/size-field: .. index:: size (field) **size**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_LENGTH `} The relevant dimension for the aperture (slit width, pinhole diameter etc). .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group: **DETECTOR**: (required) :ref:`NXdetector` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field: .. index:: amplifier_type (field) **amplifier_type**: (recommended) :ref:`NX_CHAR ` Type of electron amplifier in the first amplification step. Any of these values: ``MCP`` | ``channeltron`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field: .. index:: detector_type (field) **detector_type**: (required) :ref:`NX_CHAR ` Description of the detector type. Any of these values: * ``DLD`` * ``Phosphor+CCD`` * ``Phosphor+CMOS`` * ``ECMOS`` * ``Anode`` * ``Multi-anode`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA-group: **DATA**: (recommended) :ref:`NXdata` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA@signal-attribute: .. index:: signal (group attribute) **@signal**: (required) :ref:`NX_CHAR ` Obligatory value: ``raw`` .. _/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA/raw-field: .. index:: raw (field) **raw**: (required) :ref:`NX_NUMBER ` Raw data before calibration. .. _/NXmpes_ARPES/ENTRY/PROCESS-group: **PROCESS**: (required) :ref:`NXprocess` .. _/NXmpes_ARPES/ENTRY/PROCESS/calculated_kx-field: .. index:: calculated_kx (field) **calculated_kx[nx]**: (recommended) :ref:`NX_FLOAT ` {units=\ :ref:`NX_WAVENUMBER `} Calibrated kx momentum axis. .. _/NXmpes_ARPES/ENTRY/PROCESS/calculated_energy-field: .. index:: calculated_energy (field) **calculated_energy[ne]**: (recommended) :ref:`NX_FLOAT ` {units=\ :ref:`NX_ENERGY `} Calibrated energy axis. .. _/NXmpes_ARPES/ENTRY/PROCESS/distortion_correction-group: **distortion_correction**: (required) :ref:`NXdistortion` .. _/NXmpes_ARPES/ENTRY/PROCESS/distortion_correction/applied-field: .. index:: applied (field) **applied**: (required) :ref:`NX_BOOLEAN ` Has a distortion correction been applied? .. _/NXmpes_ARPES/ENTRY/PROCESS/energy_calibration-group: **energy_calibration**: (required) :ref:`NXcalibration` .. _/NXmpes_ARPES/ENTRY/PROCESS/energy_calibration/applied-field: .. index:: applied (field) **applied**: (required) :ref:`NX_BOOLEAN ` Has an energy calibration been applied? .. _/NXmpes_ARPES/ENTRY/PROCESS/momentum_calibration-group: **momentum_calibration**: (optional) :ref:`NXcalibration` .. _/NXmpes_ARPES/ENTRY/PROCESS/momentum_calibration/applied-field: .. index:: applied (field) **applied**: (required) :ref:`NX_BOOLEAN ` Has a momentum calibration been applied? .. _/NXmpes_ARPES/ENTRY/SAMPLE-group: **SAMPLE**: (required) :ref:`NXsample` .. _/NXmpes_ARPES/ENTRY/SAMPLE/name-field: .. index:: name (field) **name**: (required) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/SAMPLE/chemical_formula-field: .. index:: chemical_formula (field) **chemical_formula**: (required) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/SAMPLE/preparation_date-field: .. index:: preparation_date (field) **preparation_date**: (recommended) :ref:`NX_DATE_TIME ` ISO 8601 date of preparation of the sample for the XPS experiment (i.e. cleaving, last annealing). .. _/NXmpes_ARPES/ENTRY/SAMPLE/temperature-field: .. index:: temperature (field) **temperature**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_TEMPERATURE `} In the case of a fixed temperature measurement this is the scalar temperature of the sample. In the case of an experiment in which the temperature is changed and recoded, this is an array of length m of temperatures. .. _/NXmpes_ARPES/ENTRY/SAMPLE/situation-field: .. index:: situation (field) **situation**: (required) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/SAMPLE/pressure-field: .. index:: pressure (field) **pressure**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_PRESSURE `} In the case of a fixed pressure measurement this is the scalar pressure. In the case of an experiment in which pressure changes, or anyway it is recorded, this is an array of length m of pressures. .. _/NXmpes_ARPES/ENTRY/SAMPLE/sample_history-group: **sample_history**: (recommended) :ref:`NXnote` A descriptor to keep track of the treatment of the sample before entering the photoemission experiment. Ideally, a full report of the previous operations, in any format (NXnote allows to add pictures, audio, movies). Alternatively, a reference to the location or a unique identifier or other metadata file. In the case these are not available, free-text description. .. _/NXmpes_ARPES/ENTRY/SAMPLE/preparation_description-group: **preparation_description**: (required) :ref:`NXnote` Description of the surface preparation technique for the XPS experiment, i.e. UHV cleaving, in-situ growth, sputtering/annealing etc. Ideally, a full report of the previous operations, in any format(NXnote allows to add pictures, audio, movies). Alternatively, a reference to the location or a unique identifier or other metadata file. In the case these are not available, free-text description. .. _/NXmpes_ARPES/ENTRY/DATA-group: **DATA**: (required) :ref:`NXdata` .. _/NXmpes_ARPES/ENTRY/DATA@signal-attribute: .. index:: signal (group attribute) **@signal**: (required) :ref:`NX_CHAR ` Obligatory value: ``data`` .. _/NXmpes_ARPES/ENTRY/DATA@axes-attribute: .. index:: axes (group attribute) **@axes**: (required) :ref:`NX_CHAR ` Obligatory value: ``['energy', 'kpar']`` .. _/NXmpes_ARPES/ENTRY/DATA@energy_indices-attribute: .. index:: energy_indices (group attribute) **@energy_indices**: (required) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/DATA@kpar_indices-attribute: .. index:: kpar_indices (group attribute) **@kpar_indices**: (required) :ref:`NX_CHAR ` .. _/NXmpes_ARPES/ENTRY/DATA/data-field: .. index:: data (field) **data**: (required) :ref:`NX_NUMBER ` Processed plottable data. .. _/NXmpes_ARPES/ENTRY/DATA/energy-field: .. index:: energy (field) **energy**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ENERGY `} Data containing the energy axis .. _/NXmpes_ARPES/ENTRY/DATA/kpar-field: .. index:: kpar (field) **kpar**: (required) :ref:`NX_NUMBER ` {units=\ :ref:`NX_WAVENUMBER `} Data containing the k parallel axis Hypertext Anchors ----------------- Table of hypertext anchors for all groups, fields, attributes, and links defined in this class. ================================================================================================================================================================================================ ================================================================================================================================================================================================ documentation (reST source) anchor web page (HTML) anchor ================================================================================================================================================================================================ ================================================================================================================================================================================================ :ref:`/NXmpes_ARPES/ENTRY-group ` :ref:`#nxmpes-arpes-entry-group ` :ref:`/NXmpes_ARPES/ENTRY/DATA-group ` :ref:`#nxmpes-arpes-entry-data-group ` :ref:`/NXmpes_ARPES/ENTRY/DATA/data-field ` :ref:`#nxmpes-arpes-entry-data-data-field ` :ref:`/NXmpes_ARPES/ENTRY/DATA/energy-field ` :ref:`#nxmpes-arpes-entry-data-energy-field ` :ref:`/NXmpes_ARPES/ENTRY/DATA/kpar-field ` :ref:`#nxmpes-arpes-entry-data-kpar-field ` :ref:`/NXmpes_ARPES/ENTRY/DATA@axes-attribute ` :ref:`#nxmpes-arpes-entry-data-axes-attribute ` :ref:`/NXmpes_ARPES/ENTRY/DATA@energy_indices-attribute ` :ref:`#nxmpes-arpes-entry-data-energy-indices-attribute ` :ref:`/NXmpes_ARPES/ENTRY/DATA@kpar_indices-attribute ` :ref:`#nxmpes-arpes-entry-data-kpar-indices-attribute ` :ref:`/NXmpes_ARPES/ENTRY/DATA@signal-attribute ` :ref:`#nxmpes-arpes-entry-data-signal-attribute ` :ref:`/NXmpes_ARPES/ENTRY/definition-field ` :ref:`#nxmpes-arpes-entry-definition-field ` :ref:`/NXmpes_ARPES/ENTRY/definition@version-attribute ` :ref:`#nxmpes-arpes-entry-definition-version-attribute ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT-group ` :ref:`#nxmpes-arpes-entry-instrument-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM-group ` :ref:`#nxmpes-arpes-entry-instrument-beam-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/distance-field ` :ref:`#nxmpes-arpes-entry-instrument-beam-distance-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_energy-field ` :ref:`#nxmpes-arpes-entry-instrument-beam-incident-energy-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_energy_spread-field ` :ref:`#nxmpes-arpes-entry-instrument-beam-incident-energy-spread-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_energy_weights-field ` :ref:`#nxmpes-arpes-entry-instrument-beam-incident-energy-weights-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_polarization-field ` :ref:`#nxmpes-arpes-entry-instrument-beam-incident-polarization-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/BEAM/incident_polarization@units-attribute ` :ref:`#nxmpes-arpes-entry-instrument-beam-incident-polarization-units-attribute ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER-group ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/angular_resolution-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-angular-resolution-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-collectioncolumn-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/mode-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-collectioncolumn-mode-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-collectioncolumn-projection-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-collectioncolumn-scheme-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-description-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-detector-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-detector-amplifier-type-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA-group ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-detector-data-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA/raw-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-detector-data-raw-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA@signal-attribute ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-detector-data-signal-attribute ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-detector-detector-type-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energy-resolution-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energydispersion-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/APERTURE-group ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energydispersion-aperture-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/APERTURE/description-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energydispersion-aperture-description-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/APERTURE/shape-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energydispersion-aperture-shape-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/APERTURE/size-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energydispersion-aperture-size-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energydispersion-energy-scan-mode-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energydispersion-pass-energy-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-energydispersion-scheme-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-fast-axes-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field ` :ref:`#nxmpes-arpes-entry-instrument-electronanalyser-slow-axes-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/SOURCE-group ` :ref:`#nxmpes-arpes-entry-instrument-source-group ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/SOURCE/name-field ` :ref:`#nxmpes-arpes-entry-instrument-source-name-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/SOURCE/probe-field ` :ref:`#nxmpes-arpes-entry-instrument-source-probe-field ` :ref:`/NXmpes_ARPES/ENTRY/INSTRUMENT/SOURCE/type-field ` :ref:`#nxmpes-arpes-entry-instrument-source-type-field ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS-group ` :ref:`#nxmpes-arpes-entry-process-group ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS/calculated_energy-field ` :ref:`#nxmpes-arpes-entry-process-calculated-energy-field ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS/calculated_kx-field ` :ref:`#nxmpes-arpes-entry-process-calculated-kx-field ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS/distortion_correction-group ` :ref:`#nxmpes-arpes-entry-process-distortion-correction-group ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS/distortion_correction/applied-field ` :ref:`#nxmpes-arpes-entry-process-distortion-correction-applied-field ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS/energy_calibration-group ` :ref:`#nxmpes-arpes-entry-process-energy-calibration-group ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS/energy_calibration/applied-field ` :ref:`#nxmpes-arpes-entry-process-energy-calibration-applied-field ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS/momentum_calibration-group ` :ref:`#nxmpes-arpes-entry-process-momentum-calibration-group ` :ref:`/NXmpes_ARPES/ENTRY/PROCESS/momentum_calibration/applied-field ` :ref:`#nxmpes-arpes-entry-process-momentum-calibration-applied-field ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE-group ` :ref:`#nxmpes-arpes-entry-sample-group ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE/chemical_formula-field ` :ref:`#nxmpes-arpes-entry-sample-chemical-formula-field ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE/name-field ` :ref:`#nxmpes-arpes-entry-sample-name-field ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE/preparation_date-field ` :ref:`#nxmpes-arpes-entry-sample-preparation-date-field ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE/preparation_description-group ` :ref:`#nxmpes-arpes-entry-sample-preparation-description-group ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE/pressure-field ` :ref:`#nxmpes-arpes-entry-sample-pressure-field ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE/sample_history-group ` :ref:`#nxmpes-arpes-entry-sample-sample-history-group ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE/situation-field ` :ref:`#nxmpes-arpes-entry-sample-situation-field ` :ref:`/NXmpes_ARPES/ENTRY/SAMPLE/temperature-field ` :ref:`#nxmpes-arpes-entry-sample-temperature-field ` :ref:`/NXmpes_ARPES/ENTRY/start_time-field ` :ref:`#nxmpes-arpes-entry-start-time-field ` :ref:`/NXmpes_ARPES/ENTRY/title-field ` :ref:`#nxmpes-arpes-entry-title-field ` :ref:`/NXmpes_ARPES/ENTRY@default-attribute ` :ref:`#nxmpes-arpes-entry-default-attribute ` :ref:`/NXmpes_ARPES/ENTRY@entry-attribute ` :ref:`#nxmpes-arpes-entry-entry-attribute ` ================================================================================================================================================================================================ ================================================================================================================================================================================================ **NXDL Source**: https://github.com/FAIRmat-Experimental/nexus_definitions/tree/fairmat/applications/NXmpes_ARPES.nxdl.xml