NXmpes¶
Status:
application definition, extends NXobject
Description:
This is the most general application definition for multidimensional photoelectron spectroscopy.
Symbols:
The symbols used in the schema to specify e.g. dimensions of arrays
nfa
nsa
nx
ne
- Groups cited:
NXbeam, NXcalibration, NXcollectioncolumn, NXdata, NXdetector, NXelectronanalyser, NXenergydispersion, NXentry, NXinstrument, NXprocess, NXsample, NXsource
Structure:
ENTRY: (required) NXentry
title: (required) NX_CHAR
Title describing the entry.
start_time: (required) NX_DATE_TIME
ISO8601 formatted date time of the start of the measurement.
definition: (required) NX_CHAR
Official NeXus NXDL schema to which this file conforms.
Obligatory value:
NXmpes@version: (required) NX_CHAR
Version specifier enabling to document modification of the schema.
INSTRUMENT: (required) NXinstrument
SOURCE: (required) NXsource
type: (required) NX_CHAR
Type of source. Any of these values: - Synchrotron X-ray Source - Rotating Anode X-ray - Fixed Tube X-ray - UV Laser - Free-Electron Laser - Optical Laser - UV Plasma Source - Metal Jet X-ray
Any of these values:
Synchrotron X-ray Source
Rotating Anode X-ray
Fixed Tube X-ray
UV Laser
Free-Electron Laser
Optical Laser
UV Plasma Source
Metal Jet X-rayname: (required) NX_CHAR
Free text name of the source.
probe: (required) NX_CHAR
Type of probe. In photoemission it’s always photons, any of these values: - x-ray - ultraviolet - visible light
Any of these values:
x-ray|ultraviolet|visible lightBEAM: (required) NXbeam
Properties of the beam at the sample.
distance: (required) NX_NUMBER {units=NX_LENGTH}
Distance of the point of evaluation of the beam from the sample.
incident_energy: (required) NX_NUMBER {units=NX_ENERGY}
Incident photon energy.
incident_energy_spread: (recommended) NX_NUMBER {units=NX_ENERGY}
FWHM energy linewidth of the incident photons.
incident_polarization[4]: (recommended) NX_NUMBER {units=NX_ANY}
Incident polarization specified as a Stokes vector.
ELECTRONANALYSER: (required) NXelectronanalyser
description: (required) NX_CHAR
Free text description of the type of detector.
energy_resolution: (required) NX_NUMBER {units=NX_ENERGY}
Energy resolution of the analyser with the current setting.
fast_axes[nfa]: (optional) NX_CHAR
List of the axes that are acquired symultaneously by the detector.
slow_axes[nsa]: (optional) NX_CHAR
List of the axes that are acquired by scanning a physical parameter, listed in order of decreasing speed.
COLLECTIONCOLUMN: (required) NXcollectioncolumn
scheme: (required) NX_CHAR
Scheme of the electron collection column.
Any of these values:
Standard
Deflector
PEEM
Momentum Microscopemode: (recommended) NX_CHAR
Labelling of the lens setting in use.
projection: (recommended) NX_CHAR
The space projected in the angularly dispersive directions, i.e. real or reciprocal.
Any of these values:
real|reciprocalENERGYDISPERSION: (required) NXenergydispersion
scheme: (required) NX_CHAR
Energy dispersion scheme employed.
Any of these values:
tof
hemispherical
cylindrical mirror
display mirror
retarding gridpass_energy: (required) NX_NUMBER {units=NX_ENERGY}
energy of the electrons on the mean path of the analyser.
energy_scan_mode: (required) NX_CHAR
Way of scanning the energy axis (fixed or sweep).
Any of these values:
fixed|sweepDETECTOR: (required) NXdetector
PROCESS: (required) NXprocess
calculated_energy[ne]: (recommended) NX_FLOAT {units=NX_ENERGY}
Calibrated energy axis
energy_calibration: (required) NXcalibration
applied: (required) NX_BOOLEAN
Has an energy calibration been applied?
SAMPLE: (required) NXsample
name: (required) NX_CHAR
Simple and descriptive name of the sample.
chemical_formula: (required) NX_CHAR
Chemical formula of the sample.
sample_history: (optional) NX_CHAR
Ideally, a reference to the location or a unique identifier or other metadata file. In the case that is not available, free-text description.
preparation_date: (recommended) NX_DATE_TIME
ISO 8601 date of preparation of the sample for the ARPES experiment (i.e. cleaving, last annealing).
description: (required) NX_CHAR
Free-text surface preparation technique for the ARPES experiment, i.e. UHV cleaving, in-situ growth, sputtering/annealing etc.
temperature: (required) NX_NUMBER {units=NX_TEMPERATURE}
Temperature of the sample.
situation: (required) NX_CHAR
pressure: (required) NX_NUMBER {units=NX_PRESSURE}
Residual gas pressure at the sample.
DATA: (required) NXdata
data: (required) NX_NUMBER
Processed plottable data.
Hypertext Anchors¶
Table of hypertext anchors for all groups, fields, attributes, and links defined in this class.
