Contributed DefinitionsΒΆ
A description of each NeXus contributed definition is given. NXDL files in the NeXus contributed definitions include propositions from the community for NeXus base classes or application definitions, as well as other NXDL files for long-term archival by NeXus. Consider the contributed definitions as either in incubation or a special case not for general use. The NIAC: The NeXus International Advisory Committee is charged to review any new contributed definitions and provide feedback to the authors before ratification and acceptance as either a base class or application definition.
- NXapm
Atom probe tomography and field-ion microscopy experiments.
- NXcalibration
Draft subclass of NXprocess to describe post-processing calibrations.
- NXchamber
Component of an instrument to store or place objects and specimens.
- NXcollectioncolumn
Draft subclass of NXelectronanalyser to describe the electron collection column of a photoelectron analyser.
- NXcontainer
State of a container holding the sample under investigation.
- NXcorrector_cs
Device for correcting spherical aberrations in an electron microscope.
- NXcsg
constructive solid geometry NeXus class, using NXquadric
- NXcxi_ptycho
Application definition for a ptychography experiment, compatible with CXI from version 1.6.
- NXdeflector
Electro-static deflectors as they are used e.g. in an electron analyser.
- NXdistortion
Draft subclass of NXprocess to describe post-processing distortion correction.
- NXelectronanalyser
Draft subclass of NXinstrument to describe a photoelectron analyser.
- NXelectrostatic_kicker
definition for a electrostatic kicker.
- NXellipsometry
Ellipsometry, complex systems, up to variable angle spectroscopy.
- NXem_nion
(Scanning) transmission electron microscopy with a Nion instrument.
- NXenergydispersion
Draft subclass of NXelectronanalyser to describe the energy dispersion section of a photoelectron analyser.
- NXfib
Set of devices adding focused-ion beam capabilities to an instrument.
- NXion
Set of atoms of a molecular ion or fragment in ToF mass spectrometry.
- NXlens
Draft class definition for electro-static lenses as they are used e.g. in an electron analyser.
- NXlens_em
An electro-magnetic lens.
- NXmagnetic_kicker
definition for a magnetic kicker.
- NXmanipulator
Draft extension of NXpositioner to include fields to describe the use of manipulators in photoemission experiments.
- NXmpes
Most general application definition for multidimensional photoelectron spectroscopy.
- NXmpes_ARPES
This is the most general application definition for multidimensional ARPES.
- NXpeak
Description of peaks, their functional form or measured support.
- NXpulser_apm
Laser-, voltage-, or combined- pulsing to trigger field evaporation.
- NXpump
Device to create reduce an atmosphere to a controlled remaining pressure level.
- NXquadric
definition of a quadric surface.
- NXquadrupole_magnet
definition for a quadrupole magnet.
- NXreflectron
Device for reducing flight time differences of ions in ToF experiments.
- NXregistration
Draft extension of NXobject to include fields to describe image registration procedures.
- NXscanbox_em
Scan unit in an electron microscope which controls the electron beam.
- NXseparator
definition for an electrostatic separator.
- NXsnsevent
This is a definition for event data from Spallation Neutron Source (SNS) at ORNL.
- NXsnshisto
This is a definition for histogram data from Spallation Neutron Source (SNS) at ORNL.
- NXsolenoid_magnet
definition for a solenoid magnet.
- NXsolid_geometry
the head node for constructively defined geometry
- NXspecdata
DEPRECATED: This definition will be removed by 2022. Not for new use.
- NXspin_rotator
definition for a spin rotator.
- NXspindispersion
Draft subclass of NXelectronanalyser to describe the spin filters in photoemission experiments.
- NXstage_lab
Device which holds, aligns, orients, stimulates a specimen.
