NXmpes¶
Status:
application definition, extends NXobject
Description:
This is the most general application definition for multidimensional photoelectron spectroscopy.
Symbols:
No symbol table
- Groups cited:
NXaperture, NXbeam, NXcalibration, NXcollectioncolumn, NXdata, NXdetector, NXelectronanalyser, NXenergydispersion, NXentry, NXinstrument, NXmanipulator, NXnote, NXprocess, NXsample, NXsource, NXuser
Structure:
ENTRY: (required) NXentry
title: (required) NX_CHAR
start_time: (required) NX_DATE_TIME
Datetime of the start of the measurement.
definition: (required) NX_CHAR
Obligatory value:
NXmpes
@version: (required) NX_CHAR
USER: (required) NXuser
Contact information of at least the user of the instrument or the investigator who performed this experiment. Adding multiple users if relevant is recommended.
name: (required) NX_CHAR
Name of the user.
affiliation: (recommended) NX_CHAR
Name of the affiliation of the user at the point in time when the experiment was performed.
address: (recommended) NX_CHAR
Full address (street, street number, ZIP, city, country) of the user’s affiliation.
email: (required) NX_CHAR
Email address of the user.
orcid: (recommended) NX_CHAR
Author ID defined by https://orcid.org/.
INSTRUMENT: (required) NXinstrument
energy_resolution: (required) NX_FLOAT {units=NX_ENERGY}
SOURCE: (required) NXsource
The source used to generate the primary photons. Properties refer strictly to parameters of the source, not of the output beam. For example, the energy of the source is not the optical power of the beam, but the energy of the electron beam in a synchrotron and so on.
type: (required) NX_CHAR
Any of these values:
Synchrotron X-ray Source
Rotating Anode X-ray
Fixed Tube X-ray
UV Laser
Free-Electron Laser
Optical Laser
UV Plasma Source
Metal Jet X-ray
HHG laser
name: (required) NX_CHAR
probe: (required) NX_CHAR
Type of probe. In photoemission it’s always photons, so the full NIAC list is restricted.
Any of these values:
x-ray
|ultraviolet
|visible light
BEAM: (required) NXbeam
distance: (required) NX_NUMBER {units=NX_LENGTH}
Distance of the point of evaluation of the beam from the sample surface.
incident_energy: (required) NX_FLOAT {units=NX_ENERGY}
incident_energy_spread: (recommended) NX_NUMBER {units=NX_ENERGY}
incident_polarization: (recommended) NX_NUMBER {units=NX_ANY}
ELECTRONANALYSER: (required) NXelectronanalyser
description: (required) NX_CHAR
energy_resolution: (recommended) NX_FLOAT {units=NX_ENERGY}
Energy resolution of the analyser with the current setting. May be linked from a NXcalibration.
fast_axes: (recommended) NX_CHAR
slow_axes: (recommended) NX_CHAR
COLLECTIONCOLUMN: (required) NXcollectioncolumn
scheme: (required) NX_CHAR
Scheme of the electron collection column.
Any of these values:
Standard
Angular dispersive
Selective area
Deflector
PEEM
Momentum Microscope
mode: (recommended) NX_CHAR
projection: (recommended) NX_CHAR
field_aperture: (optional) NXaperture
The size and position of the field aperture inserted in the column. To add additional or other apertures use the APERTURE group of NXcollectioncolumn.
contrast_aperture: (optional) NXaperture
The size and position of the contrast aperture inserted in the column. To add additional or other apertures use the APERTURE group of NXcollectioncolumn.
ENERGYDISPERSION: (required) NXenergydispersion
scheme: (required) NX_CHAR
Any of these values:
tof
hemispherical
double hemispherical
cylindrical mirror
display mirror
retarding grid
pass_energy: (required) NX_FLOAT {units=NX_ENERGY}
energy_scan_mode: (required) NX_CHAR
entrance_slit: (optional) NXaperture
Size, position and shape of the entrance slit in dispersive analyzers. To add additional or other slits use the APERTURE group of NXenergydispersion.
exit_slit: (optional) NXaperture
Size, position and shape of the exit slit in dispersive analyzers. To add additional or other slits use the APERTURE group of NXenergydispersion.
DETECTOR: (required) NXdetector
amplifier_type: (recommended) NX_CHAR
Type of electron amplifier in the first amplification step.
Any of these values:
MCP
|channeltron
detector_type: (recommended) NX_CHAR
Description of the detector type.
Any of these values:
DLD
Phosphor+CCD
Phosphor+CMOS
ECMOS
Anode
Multi-anode
DATA: (recommended) NXdata
MANIPULATOR: (optional) NXmanipulator
Manipulator for positioning of the sample.
sample_temperature: (recommended) NX_FLOAT {units=NX_TEMPERATURE}
drain_current: (recommended) NX_FLOAT {units=NX_CURRENT}
sample_bias: (recommended) NX_FLOAT {units=NX_CURRENT}
PROCESS: (required) NXprocess
Document an event of data processing, reconstruction, or analysis for this data. Describe the appropriate axis calibrations for your experiment using one or more of the following NXcalibrations
energy_calibration: (optional) NXcalibration
applied: (required) NX_BOOLEAN
Has an energy calibration been applied?
calibrated_axis: (recommended) NX_FLOAT
This is the calibrated energy axis to be used for data plotting.
angular_calibration: (optional) NXcalibration
applied: (required) NX_BOOLEAN
Has an angular calibration been applied?
calibrated_axis: (recommended) NX_FLOAT
This is the calibrated angular axis to be used for data plotting.
spatial_calibration: (optional) NXcalibration
applied: (required) NX_BOOLEAN
Has an spatial calibration been applied?
calibrated_axis: (recommended) NX_FLOAT
This is the calibrated spatial axis to be used for data plotting.
momentum_calibration: (optional) NXcalibration
applied: (required) NX_BOOLEAN
Has an momentum calibration been applied?
calibrated_axis: (recommended) NX_FLOAT
This is the momentum axis to be used for data plotting.
SAMPLE: (required) NXsample
name: (required) NX_CHAR
chemical_formula: (recommended) NX_CHAR
The chemical formula of the sample. For mixtures use the NXsample_component group in NXsample instead.
preparation_date: (recommended) NX_DATE_TIME
Date of preparation of the sample for the XPS experiment (i.e. cleaving, last annealing).
temperature: (required) NX_FLOAT {units=NX_TEMPERATURE}
In the case of a fixed temperature measurement this is the scalar temperature of the sample. In the case of an experiment in which the temperature is changed and recoded, this is an array of length m of temperatures. This should be a link to /entry/instrument/manipulator/sample_temperature.
situation: (required) NX_CHAR
Any of these values:
vacuum
inert atmosphere
oxidising atmosphere
reducing atmosphere
gas_pressure: (required) NX_FLOAT {units=NX_PRESSURE}
sample_history: (recommended) NXnote
A descriptor to keep track of the treatment of the sample before entering the photoemission experiment. Ideally, a full report of the previous operations, in any format (NXnote allows to add pictures, audio, movies). Alternatively, a reference to the location or a unique identifier or other metadata file. In the case these are not available, free-text description.
preparation_description: (required) NXnote
Description of the surface preparation technique for the XPS experiment, i.e. UHV cleaving, in-situ growth, sputtering/annealing etc. Ideally, a full report of the previous operations, in any format(NXnote allows to add pictures, audio, movies). Alternatively, a reference to the location or a unique identifier or other metadata file. In the case these are not available, free-text description.
DATA: (required) NXdata
@signal: (required) NX_CHAR
Obligatory value:
data
data: (required) NX_NUMBER {units=NX_ANY}
Represents a measure of one- or more-dimensional photoemission counts, where the varied axis may be for example energy, momentum, spatial coordinate, pump-probe delay, spin index, temperature, etc. The axes traces should be linked to the actual encoder position in NXinstrument or calibrated axes in NXprocess.
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/contrast_aperture-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/mode-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA/raw-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA@signal-attribute
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_temperature-field
/NXmpes/ENTRY/PROCESS/angular_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/energy_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/momentum_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/spatial_calibration/calibrated_axis-field